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公开(公告)号：WO1987000629A1
公开(公告)日：1987-01-29
申请号：PCT/GB1986000399
申请日：1986-07-11
Applicant: SIRA LIMITED , CLARIDGE, John, Frederick , WEST, Robert, Noel , ATKINSON, Richard, Mark
Inventor： SIRA LIMITED
IPC: G01N21/88
CPC classification number: G01N21/9515 , G01N2021/8427 , G01N2021/8924 , G01N2021/9516 , G01N2201/117
Abstract: A surface inspection apparatus for inspecting a complex shaped surface, such as the paint surface of a motor car, comprising laser means (31) providing a beam (26) of radiation, scanning means (39) for scanning the beam across the surface, retroreflective material being provided to reflect radiation reflected from the surface back along the incident beam path, the apparatus including the retroreflective material being mounted as a unit to be moved over the surface of the motor car by means of a robot (13). Analysis of the light signal will indicate defects such as scratches, paint inclusions, orange peel, dry spray, dents and gloss defects and can distinguish the defects from features which should be present on the surface such as door cracks.
Abstract translation: 用于检查诸如电动车的涂料表面的复杂形状表面的表面检查装置包括提供辐射束（26）的激光装置（31），用于扫过横过该表面的光束的扫描装置（39），回射反射 材料被设置成沿着入射光束路径反射从表面反射的辐射，该装置包括作为单元安装的回射材料，以通过机器人（13）移动到电动汽车的表面上。 光信号的分析将指示诸如划痕，油漆夹杂物，橙皮，干燥喷雾，凹痕和光泽缺陷的缺陷，并且可以将缺陷与应该存在于表面上的特征（例如门裂纹）区分开。
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公开(公告)号：WO2015049494A1
公开(公告)日：2015-04-09
申请号：PCT/GB2014/052937
申请日：2014-09-30
Applicant: RENISHAW PLC
Inventor： MASON, Thomas Anthony
CPC classification number: G01N21/65 , G01J3/0208 , G01J3/0237 , G01J3/0248 , G01J3/2803 , G01J3/2823 , G01J3/44 , G01J2003/2826 , G01N2201/025 , G01N2201/06113 , G01N2201/103 , G01N2201/11 , G01N2201/117 , G01N2201/122
Abstract: This invention concerns spectroscopy apparatus comprising a light source (101) arranged to generate a light profile (110) on a sample, a photodetector (103) having at least one photodetector element (104) for detecting characteristic light generated from interaction of the sample with light from the light source (101), a support (109) for supporting the sample, the support (109) movable relative to the light profile (110), and a processing unit (121). The processing unit (121) is arranged to associate a spectral value recorded by the photodetector element (104) at a particular time with a point on the sample predicted to have generated the characteristic light recorded by the photodetector element (104) at the particular time based on relative motion anticipated to have occurred between the support (109) and the light profile (110).
Abstract translation: 本发明涉及光谱设备，其包括被布置成在样品上产生光谱（110）的光源（101），具有至少一个光电检测器元件（104）的光电检测器（103），用于检测由样品与 来自光源（101）的光，用于支撑样品的支撑件（109），可相对于光轮廓（110）移动的支撑件（109）和处理单元（121）。 处理单元（121）被布置为将由特定时间的光电检测器元件（104）记录的光谱值与预测在特定时间产生由光电检测器元件（104）记录的特征光的样品上的点相关联 基于预期在支撑件（109）和光轮廓（110）之间发生的相对运动。
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公开(公告)号：EP2952889A1
公开(公告)日：2015-12-09
申请号：EP15170778.3
申请日：2015-06-05
Applicant: Hamilton Sundstrand Corporation
Inventor： Fordyce, Russell , Chase, Ryan
IPC: G01N27/70 , G01N29/04 , G01N21/88 , G01N21/95 , G01N21/956 , G01N35/00 , G01N21/84 , G01N21/892
CPC classification number: G01N21/88 , G01M5/0033 , G01N21/8806 , G01N21/8851 , G01N29/041 , G01N29/2418 , G01N2021/8427 , G01N2021/8924 , G01N2021/9516 , G01N2201/117 , G01N2201/126
Abstract: A scratch verification method and apparatus (1) for detecting and analyzing defects in a surface is disclosed. The apparatus (1) include a detection device (6) with a plurality of emission sources (7) and a plurality of sensors (8). A processor (9) is connected to the detection device (6) and is configured to apply one or more sets of criteria to one or more corresponding target areas (5) of a surface (2). The processor (9) is further configured to differentiate between data from the one or more target areas (5).
Abstract translation: 公开了一种用于检测和分析表面缺陷的划痕验证方法和装置（1）。 装置（1）包括具有多个发射源（7）和多个传感器（8）的检测装置（6）。 处理器（9）连接到检测装置（6），并被配置为向表面（2）的一个或多个对应的目标区域（5）施加一组或多组标准。 处理器（9）还被配置为区分来自一个或多个目标区域（5）的数据。
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公开(公告)号：EP0228441A1
公开(公告)日：1987-07-15
申请号：EP86904284.0
申请日：1986-07-11
Applicant: SIRA LIMITED
IPC: G01N21
CPC classification number: G01N21/9515 , G01N2021/8427 , G01N2021/8924 , G01N2021/9516 , G01N2201/117
Abstract: Un appareil de contrôle de surface permet d'inspecter une surface de forme complexe telle que la surface de peinture d'une voiture, et comprend un laser (31) fournissant un faisceau (26) de rayonnement, un organe d'exploration (39) permettant de balayer le faisceau sur la surface, un matériau rétroréfléchissant étant prévu pour réfléchir le long de la trajectoire du faisceau incident le rayonnement réfléchi depuis la surface, l'appareil comportant le matériau rétroréfléchissant étant monté comme une unité à déplacer au-dessus de la surface de la voiture à l'aide d'un robot. L'analyse du signal lumineux révèlera des défauts tels que rayures, inclusion de peinture, peau d'orange, pulvérisation sèche, bosses et défauts de brillants, et permettra de distinguer les défauts des caractéristiques qui doivent être présentes sur la surface telles que des craquelures de portières.
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公开(公告)号：EP3052924A1
公开(公告)日：2016-08-10
申请号：EP14777135.6
申请日：2014-09-30
Applicant: Renishaw PLC
Inventor： MASON, Thomas Anthony
CPC classification number: G01N21/65 , G01J3/0208 , G01J3/0237 , G01J3/0248 , G01J3/2803 , G01J3/2823 , G01J3/44 , G01J2003/2826 , G01N2201/025 , G01N2201/06113 , G01N2201/103 , G01N2201/11 , G01N2201/117 , G01N2201/122
Abstract: This invention concerns spectroscopy apparatus comprising a light source (101) arranged to generate a light profile (110) on a sample, a photodetector (103) having at least one photodetector element (104) for detecting characteristic light generated from interaction of the sample with light from the light source (101), a support (109) for supporting the sample, the support (109) movable relative to the light profile (110), and a processing unit (121). The processing unit (121) is arranged to associate a spectral value recorded by the photodetector element (104) at a particular time with a point on the sample predicted to have generated the characteristic light recorded by the photodetector element (104) at the particular time based on relative motion anticipated to have occurred between the support (109) and the light profile (110).
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Patent Agency Ranking16.发明公开Method and Apparatus for Detection and Analysis of Biological Materials through Laser Induced Fluorescence 审中-公开检测和生物材料的分析荧光方法和装置所造成的激光
公开(公告)号：EP1980841A1
公开(公告)日：2008-10-15
申请号：EP07105950.5
申请日：2007-04-11
Applicant: Estonian Biocentre
Inventor： Berik, Jevgeni , Kurg, Ants , Metspalu, Andres
IPC: G01N21/64
CPC classification number: G01N21/6452 , G01N21/6402 , G01N2201/117 , G02B21/0076
Abstract: The present invention provides a method and an apparatus to analyze fast and accurately biological samples. The method includes prior mapping of the DNA chip with a CCD camera (4), addressed excitation of samples, and recording of fluorescence spectra via ultra-fast spectrometer (6,5).
Abstract translation: 本发明提供了一种方法和设备，以分析快速和精确地设定的生物样品。 该方法包括：用CCD照相机（4）的DNA芯片的现有映射，经由超快光谱仪（6.5）寻址样品的激发和荧光光谱的记录。
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公开(公告)号：JP2004333500A
公开(公告)日：2004-11-25
申请号：JP2004138624
申请日：2004-05-07
Applicant: Mitsutoyo Corp , 株式会社ミツトヨ
Inventor： GLADNICK PAUL G , WASSERMAN RICHARD M , SAYLOR BARRY E , DELANEY MARK L
CPC classification number: G01N21/8806 , G01N2021/8835 , G01N2021/8838 , G01N2021/8887 , G01N2201/0694 , G01N2201/103 , G01N2201/117 , G06T1/0007 , G06T7/0004 , G06T2207/30164 , G06T2207/30241
Abstract: PROBLEM TO BE SOLVED: To provide an image measuring system and its programming method increasing its throughput in image measuring. SOLUTION: In the image measuring system, both 1 set of target positions of a work measuring image including aspect of the work to be measured for an image group and 1 set of image acquisition parameters for each image of the image group for each image are determined, and then an image acquisition routine is determined. A machine control instruction of this image acquisition routine is provided with an operational control instruction and an image acquisition instruction based on at least some of the obtained set of target positions and each set of the determined image acquisition parameters. Additionally, the machine control instruction can be operated so as to execute the machine control instruction for acquiring and storing at least two or more images of the image group, while acquiring and storing at least two or more images of the image group without performing any image measuring operation. COPYRIGHT: (C)2005,JPO&NCIPI
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公开(公告)号：JP2016538531A
公开(公告)日：2016-12-08
申请号：JP2016519914
申请日：2014-09-30
Applicant: レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company , レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company
Inventor： アンソニー メイソン トーマス , アンソニー メイソン トーマス
CPC classification number: G01N21/65 , G01J3/0208 , G01J3/0237 , G01J3/0248 , G01J3/2803 , G01J3/2823 , G01J3/44 , G01J2003/2826 , G01N2201/025 , G01N2201/06113 , G01N2201/103 , G01N2201/11 , G01N2201/117 , G01N2201/122
Abstract: 本発明は、サンプル上に光プロファイル(110)を生成するように構成された光源(101)と、サンプルと光源(101)からの光の相互作用から生成される特性光を検出するための、少なくとも1つの受光素子(104)を有する受光器(103)と、サンプルを支持するための支持体(109)であって、光プロファイル(110)に対して移動可能である支持体(109)と、処理ユニット(121)とを備える分光装置に関する。処理ユニット(121)は、支持体(109)と光プロファイル(110)の間に発生したと予期される相対運動に基づいて、特定の時間において受光素子(104)によって記録されたスペクトル値と、特定の時間において受光素子(104)によって記録された特性光を生成したと予測されるサンプル上の点を関連づけるように構成されている。
Abstract translation: 本发明包括被配置为产生在样品上，样品和光源，用于检测从所述光从（101）的相互作用产生的特征的光的光分布（110）的光源（101）， 具有至少一个光接收元件（104）和（103），用于支撑样品（109）的支撑光检测器，所述载体是相对于光学轮廓（110）和（109）可动 涉及光谱设备和处理单元（121）。 所述处理单元（121），基于预期的所述支撑件（109）和所述光学轮廓（110）之间已经发生的相对运动，在特定的时间由所述光接收元件（104）所记录的频谱值， 它被配置为一个点上，预计由在特定时间的光接收元件（104）以产生所记录的特征的光的样品相关联。
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公开(公告)号：JP4246599B2
公开(公告)日：2009-04-02
申请号：JP2003364804
申请日：2003-10-24
Applicant: 日本分光株式会社
CPC classification number: G01N21/3563 , G01N21/55 , G01N21/59 , G01N2201/1053 , G01N2201/117
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公开(公告)号：JP2005127908A
公开(公告)日：2005-05-19
申请号：JP2003364804
申请日：2003-10-24
Applicant: Jasco Corp , 日本分光株式会社
Inventor： SOGA YOSHIAKI , KOSHOBU JUN , TSUKADA HIROSHI
CPC classification number: G01N21/3563 , G01N21/55 , G01N21/59 , G01N2201/1053 , G01N2201/117
Abstract: PROBLEM TO BE SOLVED: To provide a mapping measurement apparatus for implementing mapping measurement using a simple apparatus constitution. SOLUTION: The mapping measurement apparatus 10 is provided with a light irradiating means 12 for irradiating a sample with a light and a light detecting means 14 for detecting a light reflected from or transmitted through the sample via an aperture 16, limits the light detected by the light detecting means 14 to the light from a predetermined measured region by leading the light reflected from or transmitted through the sample to the aperture 16, and implements the mapping measurement within a predetermined range of the sample by changing and measuring the measured region. A detecting scan mirror 18 is provided on an optical path from the sample 28 to the aperture 16, and has a reflecting face with a movable orientation. Since the reflecting face of the scan mirror 18 is variable in an incident direction of the reflected light or the transmitted light, the measured region detected by the light detecting means 14 can be changed. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract translation: 要解决的问题：提供一种使用简单的装置结构实现映射测量的映射测量装置。 解决方案：映射测量装置10设置有用于用光照射样品的光照射装置12和用于检测通过孔16反射或透过样品的光的光检测装置14，限制光 由光检测装置14检测到来自预定测量区域的光，将通过样品反射或透射的光引导到孔16，并通过改变和测量测量区域在样品的预定范围内实现映射测量 。 检测扫描镜18设置在从样品28到孔16的光路上，并且具有可移动取向的反射面。 由于扫描镜18的反射面在反射光或透射光的入射方向上是可变的，所以可以改变由光检测装置14检测到的测量区域。 版权所有（C）2005，JPO＆NCIPI
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