Abstract:
Das Kontaktelement besitzt eine galvanisch aufgebrachte Dreischicht-Kontaktauflage, deren unterste Schicht aus einer Palladium-Nickel-Legierung mit einem Nickelanteil zwischen 10 % und 40 % und einer Dicke zwischen 2 µm und 10 µm besteht, deren mittlere Schicht aus Gold oder Silber einer Dicke unter 1 µm besteht und deren äußere Schicht aus Rhodium besteht und eine Dicke zwischen 0,4 µm und 1 µm aufweist.
Abstract:
La présente invention concerne un interrupteur muni de deux contacts électriques (46, 47) et d'une lame mobile (6) reliée à un troisième contact, chaque interrupteur étant disposé à l'intérieur d'un boîtier (1), ladite lame (6) pouvant basculer du premier au deuxième contact (46, 47) ou vice-versa sous l'action d'un champ magnétique extérieur. Selon l'invention, le premier et le deuxième contacts (46, 47) comportent une partie intermédiaire (44, 45) en matériau électriquement conducteur et amagnétique. Application : Relais électromagnétiques.
Abstract:
PROBLEM TO BE SOLVED: To provide a wire rod for a lead switch having a high Curie temperature, low resistance and excellent workability, a lead piece for a lead switch, and a lead switch.SOLUTION: A lead switch 10 comprises a tubular glass tube 30 and a plurality of lead pieces 20 fixed to the glass tube 30 in a state where one end side having a contact part 22 is inserted into the glass tube 30. The lead piece 20 is produced so as to be molded by plastic working of the contact part 22 to one edge side of a wire rod for a lead switch. The wire rod for a lead switch is composed of an iron group alloy comprising, by mass%, 1% or higher and 10% or lower of Fe, 10% or higher and 35% or lower of Ni, and the balance Co with impurities and having a cubic crystal structure, and has a Curie temperature of 900°C or higher and a wire diameter of 1 mm or lower. Since being composed of a ternary alloy having a specified composition, it has a high Curie temperature, low resistance and specified composition and thereby having excellent in workability as well.
Abstract:
An encapsulated contact material comprising a substrate and a contact-coating layer formed on said substrate, characterized in that said contact-coating layer comprises at least one metal selected from a group consisting of Mo, Zr, Nb, Hf, Ta and W or an alloy made of two or more of these metals and containing from 0.5 to 10 atomic % of at least one element selected from a group consisting of Li, K, Ce, Cs, Ba, Sr, Ca, Na, Y, La, Sc, Th and Rb and has a thickness of 0.1 µm or more ; or comprises at least one metal selected from a group consisting of Mo, Zr, Nb, Hf, Ta and W or an alloy made of two or more of these metals and containing from 0.1 to 5 % by weight of at least one oxide comprising at least one metal selected from a group consisting of Li, K, Ce, Cs, Ba, Sr, Ca, Na, Y, La, Sc, Th and Rb and has a thickness of 0.1 µm or more. This encapsulated contact material has a low contact resistance and an excellent arc resistance.
Abstract:
A monitoring device and a driving control system for a fan filter unit in a semiconductor clean room for monitoring the operating state of the fan filter unit. The monitoring device includes a switching section in each fan filter unit which alternately applies electrical power to one of a plurality of terminals. The switching section is responsive to a force from an air stream introduced therein via rotation of a fan in the fan filter unit. A display section in each fan filter unit is connected to the plurality of terminals which provide different signals, indicative of an on or off state of the fan, according to which of the plurality of terminals is electrically connected to the electrical power.
Abstract:
In a rhodium electrical contact of a switch, particularly a reed switch, from 0.1 to 10 atomic % of Ag is included in the electrical contact. The electrical contact of the invention has a long life under a various loading conditions from a non-working condition, where an electric current is neither conducted nor broken by the switch, to a working condition, where erosion of the electrical contact is caused by short arcs between members of the electrical contact.