一种MEMS红外探测器响应时间测量装置及方法

    公开(公告)号:WO2021128852A1

    公开(公告)日:2021-07-01

    申请号:PCT/CN2020/106106

    申请日:2020-07-31

    Abstract: 本申请提供一种MEMS红外探测器响应时间测量的装置及方法,该装置包括:辐射光源生成模块,用于产生辐射光源;脉冲激光生成模块,用于根据辐射光源产生功率可调的脉冲激光,并输入到MEMS红外探测器;测量模块,用于测得MEMS红外探测器在脉冲激光不同功率下的第一电压值和第二电压值;响应时间分析处理模块,用于根据第一电压值及第二电压值测量MEMS红外探测器的响应时间。通过实施本申请,克服了传统MEMS红外探测器响应时间测试中斩波器叶片遮挡-镂空比例不易调节、叶片转动的频率难与探测器匹配、叶片转动耗时长以及采样点时间间隔较大的问题,且激光脉冲信号的测试误差在ns级,实现了对MEMS红外探测器响应时间的准确测试。

    SYSTEM AND METHOD FOR MONITORING CONDITION OF SWITCHGEAR

    公开(公告)号:WO2022237988A1

    公开(公告)日:2022-11-17

    申请号:PCT/EP2021/062848

    申请日:2021-05-14

    Abstract: A system and method for monitoring a condition of a switchgear. The switchgear (200) comprises a housing (210) on which an inspection window (250) is fitted. The system (100) comprises an optical sensing unit (110) arranged to be proximate to the inspection window and outside the housing, the optical sensing unit comprising at least one optical sensor configured to detect optical signals from an object (240) inside the housing through the inspection window and output at least one characteristic parameter of the object based on the detected optical signals; and a controlling unit (120) communicatively connected with the optical sensing unit to receive the characteristic parameter, the controlling unit being configured to determine a condition of the switchgear based on the at least one characteristic parameter. The at least one optical sensor is configured to detect the optical signals in a working wavelength range which corresponds to the transmission wavelength range of the optical material forming the inspection window.

    对象检测方法和摄像设备
    16.
    发明申请

    公开(公告)号:WO2021254233A1

    公开(公告)日:2021-12-23

    申请号:PCT/CN2021/099211

    申请日:2021-06-09

    Inventor: 林克荣

    Abstract: 一种对象检测方法和摄像设备,该方法包括:依据用于探测待检测对象的雷达探测信号确定待检测对象的空间位置信息,空间位置信息至少包括:待检测对象相对摄像设备的距离信息和待检测对象的速度信息(101);响应于速度信息满足预设速度要求,则依据距离信息确定待检测对象对应的标定尺寸范围,并依据已采集的包含待检测对象的图像确定待检测对象的实际尺寸;其中,标定尺寸范围用于表示在待检测对象为指定对象时指定对象在图像中的尺寸范围(102),基于实际尺寸和标定尺寸范围,确定待检测对象是否为指定对象(103)。

    METHOD FOR DETECTING ANOMALIES ON OR IN THE SURFACE OF A STRUCTURE

    公开(公告)号:WO2020086523A2

    公开(公告)日:2020-04-30

    申请号:PCT/US2019/057343

    申请日:2019-10-22

    Inventor: COBB, Joseph C.

    Abstract: Described herein is a method of detecting anomalies on a surface of a structure. The method may comprise taking a thermal image of the surface of the structure. The method may further comprise taking a visual image of the surface of the structure. The method may then comprise conducting a thermal image numerical analysis on the thermal image. The thermal image numerical analysis may comprise obtaining a thermal image numerical value table. The thermal image numerical analysis may then comprise obtaining a surface nominal thermal value of the surface material. The thermal image numerical analysis may then comprise eliminating a first subset of pixels having a thermal value within a nominal thermal variation from the plurality of pixels. The thermal image numerical analysis may then comprise comparing the thermal value of each pixel of the plurality of pixels not in the first subset of pixels to the surface nominal thermal value to identify at least one anomaly. The thermal image numerical analysis method may then comprise removing a first number (n1) of first anomalies from the thermal image numerical analysis. Finally, the method may comprise comparing the first anomalies from the thermal image numerical analysis to the visual image.

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