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公开(公告)号：US3829218A
公开(公告)日：1974-08-13
申请号：US25963672
申请日：1972-06-05
Applicant: BENDIX CORP
Inventor： ALYANAK E
CPC classification number: G01J3/2823
Abstract: A method of simultaneously locating and identifying a plurality of materials within a field of view by comparing the spectral characteristics obtained from systematically scanning the field of view with known spectral signatures of the same materials stored in a memory bank. The number of times a known material is identified as being in the field of view is recorded and referenced to a base. The spectral signatures in the memory bank are continually updated in response to spectral conditions obtained from scanning the field of view.
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公开(公告)号：US4348110A
公开(公告)日：1982-09-07
申请号：US118908
申请日：1980-02-06
Applicant: Tetsuo Ito
Inventor： Tetsuo Ito
CPC classification number: G01J1/46 , H01L31/02019
Abstract: There is provided a photodetector wherein charging current to a photodiode is integrated to determine an amount of discharge due to conduction of photoelectric current through the photodiode and thereby to measure intensity of photon flux incident to the photodiode, so that linearity of light input intensity versus output voltage characteristics can be improved and dynamic range of the measurement can be extended.
Abstract translation: 提供了一种光电检测器，其中集成了对光电二极管的充电电流以确定由于通过光电二极管的光电流的传导引起的放电量，从而测量入射到光电二极管的光子通量的强度，使得光输入强度对输出的线性 可以提高电压特性，并可以延长测量的动态范围。
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公开(公告)号：US4340303A
公开(公告)日：1982-07-20
申请号：US42713
申请日：1979-05-25
Applicant: Ulrich Grisar , Wilhelm Berstermann
Inventor： Ulrich Grisar , Wilhelm Berstermann
Abstract: An arrangement of the Rowland character includes a support and a concave grating on the support for producing the spectrum characteristic of a sample being investigated. The support has a series of slits thereon which are positioned on the Rowland circle and are adjusted to the spectral lines of samples to be investigated. An element on the support is provided with a primary slit for directing the radiation derived from a sample being investigated onto the concave grating. The primary slit is positioned on the Rowland circle and the element provided with the primary slit is mounted on the support for movement along the arc of the Rowland circle. The element is mounted in such a manner as to be arrestable in a plurality of positions. The element is favorably in the form of a plate. A preferred embodiment contemplates the provision of a pair of grooves in the support, which latter may be in the form of a housing, with the grooves following the curvature of the Rowland circle and the element being guided in the grooves. The edges of the element located in the grooves may be provided with openings in which there are accommodated spherical members as well as biasing elements for urging the spherical members into contact with the grooves.
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公开(公告)号：US4186838A
公开(公告)日：1980-02-05
申请号：US825390
申请日：1977-08-17
Applicant: Charlie M. Levitt , Samuel Chatterley
Inventor： Charlie M. Levitt , Samuel Chatterley
IPC: G01J3/50 , G01N21/27 , G01N21/47 , G01N21/85 , G01N21/87 , G02B27/00 , B07C5/342 , G01J3/38 , G01N21/26
CPC classification number: G01N21/87 , G01N21/4738 , Y10S209/914
Abstract: The colors or surface conditions of small articles are determined by passing the articles through an integrating sphere and separately illuminating the articles before they enter the sphere, during their passage through the sphere and after they leave the sphere. The light transmitted through or reflected by each article is collected by the sphere and passed to analyzing apparatus. The articles are sorted according to the measurements.
Abstract translation: 小物品的颜色或表面条件是通过使物品通过积分球，并在制品进入球体之前，在通过球体期间以及离开球体之后分别照射物品来确定的。 每个物品透过或反射的光被球体收集并传递给分析仪器。 这些物品根据测量进行分类。
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公开(公告)号：DD216737A1
公开(公告)日：1984-12-19
申请号：DD25320983
申请日：1983-07-20
Applicant: MIKROELEKTRONIK ZT FORSCH TECH
Inventor： SCHADE KLAUS , EISENREICH STEFFEN , PAUL WOLFRAM , FABIAN LUTZ
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Patent Agency Ranking
公开(公告)号：SU1116327A1
公开(公告)日：1984-09-30
申请号：SU3597295
申请日：1983-04-07
Applicant: DUBROVIN ALEKSANDR N , SNIGIREV YURIJ A
Inventor： DUBROVIN ALEKSANDR N , SNIGIREV YURIJ A
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公开(公告)号：AU8189682A
公开(公告)日：1982-10-07
申请号：AU8189682
申请日：1982-03-25
Applicant: MUESZERIPARI MUEVEK LAB
Inventor： JONAS TAMAS , KURTZ JANOS , LENGYEL ZOLTAN , OROSZ TIBOR , PILATH KAROLY , PUNGOR ANDRAS
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公开(公告)号：DD156394A1
公开(公告)日：1982-08-18
申请号：DD22767481
申请日：1981-02-17
Applicant: GATZKE JOHANNES , KRUEGER HOLM
Inventor： GATZKE JOHANNES , KRUEGER HOLM
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公开(公告)号：FR2305718B1
公开(公告)日：1979-03-30
申请号：FR7608471
申请日：1976-03-24
Applicant: KLOECKNER WERKE AG
Abstract: An alloy to be tested is formed of a basis metal and a plurality of alloying elements. A diffraction spectrum having lines corresponding to the basis metal and to each of the alloying elements is generated from the alloy by sparking and electrical signals each having an intensity proportional to the intensity of a respective one of the lines of the spectrum are formed. Each of these signals is integrated and the integrated signals corresponding to lines of the alloy elements are each compared with the integrated signal corresponding to the line of the basis metal and difference signals are generated. These difference signals are evaluated by being passed through a threshold circuit which sounds an alarm when they lie outside a predetermined range. The device can be calibrated by comparing each of the signals corresponding to one of the alloying elements with only a portion of the signal corresponding to the basis metal so that the arrangement can be set up to generate an output only when the alloy being sampled has a composition different from a predetermined calibrated composition.
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