Abstract:
A spatial filter is made by forming a structure comprising a focusing element and an opaque surface, the opaque surface being disposed remotely from the focusing element in substantially the same plane as a focal plane of the focusing element; and by forming a pinhole in the opaque surface at or adjacent to a focal point of the focusing element by transmitting a substantially collimated laser beam through the focusing element so that a point optimally corresponding to the focal point is identified on the opaque surface and imperfection of the focusing element, if any, is reflected on the shape and position of the pinhole so formed.
Abstract:
A multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample is disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
Abstract:
A device for producing a reproducible identification pattern of a polished gemstone includes light directing means for directing a focused beam of light onto a gemstone orientated in a particular known manner to produce an output of the internal refraction and reflection characteristics of the gemstone including reflected light beams having particular locations, sizes and intensities. The device also includes automated means for changing a position of the gemstone relative to the focused beam of light; and also a means for recording the output in a manner to record the relative size and location of the reflected light beams.
Abstract:
The present invention relates to a system for conducting the identification and quantification of micro-organisms, e.g., bacteria in biological samples. More particularly, the invention relates to a system comprising a disposable cartridge and an optical cup or cuvette having a tapered surface; an optics system including an optical reader and a thermal controller; an optical analyzer; a cooling system; and an improved spectrometer. The system may utilize the disposable cartridge in the sample processor and the optical cup or cuvette in the optical analyzer.
Abstract:
A method for validating a security feature of an object. The method includes measuring spectral data of the object under a first illumination condition and a second illumination condition. The second illumination condition is different than the first illumination condition. The method also includes determining a presence of the security feature based on the spectral data measured under each illumination condition, and comparing the security feature to a standard.
Abstract:
The invention relates to a method and system of irradiating a liquid-carrying container for inspection, comprising rotating said container, its contents or both around a rotation axis and irradiating said container with an electromagnetic radiation beam, whereby the irradiated cross-section of said container, irradiated by said electromagnetic radiation beam, is less than the cross-section of said container. The present invention further relates to a method and system for inspecting a liquid carrying container for one or more test parameters of said container, the contents of said container, or both, comprising the steps of rotating said container, said contents or both around a rotation axis, irradiating said container with an electromagnetic radiation beam from a first direction along an irradiation centre plane substantially parallel to said rotation axis, capturing a representation of a section of said container from a second direction along a detection centre plane substantially parallel to said rotation axis, and processing said representation, characterized in that the irradiated cross-section of said container, irradiated by said electromagnetic radiation beam, is less than the cross-section of said container.
Abstract:
An apparatus for optical inspection of containers (12) includes a light source (14) having at least one light emitting diode (16) with a light emitting die surface (18). Lenses and/or mirrors (20, 43) focus the light emitting die surface onto a selected portion of a container, and a light sensor (24) receives an image of the selected portion of the container illuminated by the light source. An information processor (28) is coupled to the light sensor for detecting commercial variations in the illuminated portion of the container as a function of the image received at the sensor. The image can be developed by transmission of the light energy through the selected portion of the container, and/or by reflection and/or refraction of the light energy at the selected portion of the container. The light source may include a single light emitting diode, or a plurality of light emitting diodes having light emitting die surfaces focused onto the container in such a way that the images of the light emitting die surfaces overlap and/or are adjacent to each other at the container.
Abstract:
The invention features a multi-spectral microscopy system for illuminating a sample with light of a selectable spectral content and generating an image of the sample in response to the illumination. The multi-spectral microscopy system includes a multi-spectral illuminator that provides output radiation having the selectable spectral content. A preferred set of optical arrangements for the multi-spectral illuminator generates the output radiation so that the spectral content of the output radiation is substantially uniform across its transversal profile. Furthermore, the multi-spectral illuminator can include monitoring optics and a corresponding detector array that independently monitors the output in each spectral band of the radiation produced by the multi-spectral illuminator. The monitoring provides calibration, feedback, and/or source aging information to insure robust and reliable performance for the multi-spectral illuminator. The multi-spectral microscopy system also includes a microscope which illuminates the sample with light derived from the output of the multi-spectral illuminator, and beam modifications optics, which modify the output from the lamp prior to the microscope and fully exploit field of view and resolution of the microscope.
Abstract:
The present invention relates to an automatic display pixel inspection system and method and, particularly, to an automatic inspection system and method for inspecting defects occurring in the process of assembling semiconductor light emitting devices in a fluid.