Absorbance detector
    212.
    发明公开
    Absorbance detector 失效
    Absorptionsdetektor。

    公开(公告)号:EP0475211A2

    公开(公告)日:1992-03-18

    申请号:EP91114572.0

    申请日:1991-08-29

    CPC classification number: G01J3/427 G01N21/314

    Abstract: An absorbance detector comprising a light source 2, a spectroscope 4 to split the light from the light source 2 and lead it to a cell 6, a sensor 8 to detect the light coming through said cell 6 and to measure it absorption constant, a spectroscope controller 10 to make said spectroscope 4 scan with two wavelengths alternately, a pair of absorption constant calculation units 12, 14 synchronizing said spectroscope 4, collecting several past data of absorption constant to calculate a predicted value of absorption constant for a present or future point of time and a chromatograph ratio calculation unit 16 to calculate a ratio of simultaneous absorptional constants of two wavelengths obtained from said pair of absorption constant calculation units 12, 14.

    Abstract translation: 一种吸光度检测器,包括光源2,用于将来自光源2的光分离并将其引导到单元6的分光镜4,用于检测通过所述单元6的光并测量其吸收常数的传感器8,分光镜 控制器10使所述分光镜4交替地扫描两个波长,一对吸收常数计算单元12,14同步所述分光镜4,收集几个过去的吸收常数数据,以计算当前或未来点的吸收常数的预测值 时间和色谱比率计算单元16计算从所述吸收常数计算单元12,14获得的两个波长的同时吸收常数的比率。

    In-situ infra-red and ultra-violet photometer

    公开(公告)号:US12104957B2

    公开(公告)日:2024-10-01

    申请号:US17620408

    申请日:2020-06-25

    Applicant: Protea Ltd

    Abstract: The invention relates to a photometer (30) for analysing the composition of a sample gas. The photometer comprises an infra-red (IR) source (20) configured to direct a first plurality of pulses (40) of IR radiation through the sample gas to an IR detector (26), at least two of the first plurality of pulses being of different wavelength. The photometer further comprises an ultraviolet (UV) source (32) configured to generate a second plurality of pulses (38) of UV radiation for conveyance to a UV detector (36), at least two of the second plurality of pulses being of different wavelength. A path selection arrangement (22, 42-50) is configured to selectively convey different ones of the second plurality of pulses (38) to one of the sample gas and the UV detector (36). The photometer further comprises processing circuitry coupled to the IR source (20), the UV source (32), the IR detector (26), the UV detector (36) and the path selection arrangement (22, 42-50). The processing circuitry is configured to (i) select the wavelength to be used for a given UV pulse of the second plurality of pulses (38), (ii) receive a plurality of detection signals from each of the IR detector (26) and the UV detector (36) and (iii) based on the detection signals, determine a concentration of at least one component of the sample gas. A method for analysing the composition of a sample gas is also disclosed.

    LIGHT MEASURING DEVICE AND METHOD OF MANUFACTURING LIGHT MEASURING DEVICE

    公开(公告)号:US20240068866A1

    公开(公告)日:2024-02-29

    申请号:US18237594

    申请日:2023-08-24

    Abstract: The spectrometer includes: a light source unit emitting a laser beam; a mirror unit including a first plane mirror having a first mirror surface and a second plane mirror having a second mirror surface, wherein a measurement target is introduced between the first mirror surface and the second mirror surface; and a light detector detecting the laser beam returned by multiple reflection between the first mirror surface and the second mirror surface. The first mirror surface and the second mirror surface are arranged non-parallel to each other when viewed from the Z-axis direction so as to form an optical path of the laser beam reciprocating in the Y-axis direction while performing multiple reflection between the first mirror surface and the second mirror surface. The optical path of the laser beam between the first mirror surface and the second mirror surface is inclined with respect to the Z-axis direction.

    Temperature measurement system and temperature measurement method

    公开(公告)号:US11668608B2

    公开(公告)日:2023-06-06

    申请号:US17063816

    申请日:2020-10-06

    Inventor: Tong Wu Kenji Nagai

    Abstract: A temperature measurement system configured to measure a temperature of a target object having a first main surface and a second main surface includes a light source unit configured to emit output light penetrating the target object and including a first wavelength range and a second wavelength range; a measurement unit configured to measure a spectrum of reflected light; an optical path length ratio calculator configured to calculate an optical path length ratio between the output light of the first wavelength range and the output light of the second wavelength range; and a temperature calculator configured to calculate the temperature of the target object based on the optical path length ratio and a previously investigated relationship between the temperature of the target object and a refractive index ratio between the output light of the first wavelength range and the output light of the second wavelength range.

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