Abstract:
An optical transmission spectrometer for transmission measurements of absorbing and scattering samples includes light sources mounted parallel to each other in a holder. The beams of light eminating from the light sources are directed through a beam-combiner. The beam-combiner includes a first refractive surface at an angle of incidence of 45°. The first refractive surface refracts light toward a common axis. The beam-combiner includes a second refractive surface parallel to the first refractive surface for refracting the beam of light along a common axis parallel to the original direction of the beam of light. The beam-combiner can include additional refractive surfaces for other beams of light to combine the beams of light into a primary beam. The includes a collimating tube extending along the common axis for baffling stray light and directing the primary beam through a sample. A second collimating tube is provided on the side of the sample opposite the first collimating tube for baffling stray light passing through the sample. The second collimating tube directs the primary beam to a detector package mounted in a holder, where the detector viewing area of the sample is limited to that of the primary beam.
Abstract:
Reflectance apparatus is disclosed for obtaining the measurement of reflected light in which a light trap is positioned in the light path between the specimen and the detector to minimize stray light reflected from the specimen being analyzed as light from the light source is reflected from the specimen to the detector.
Abstract:
To provide sufficient sensitivity, spectral resolution and speed of measurement for field environmental measurements in a portable spectroradiometer, a silicon photodiode receives light: (1) having a bandwidth in the range of between 2 and 15 nm (nanometers) from a pivotable concave holographic diffraction grating within the wavelength range of between 250 and 1150 nm at a scanning rate in the range of 20 to 100 nm per second; (2) having stray light of high intensity and undesired frequencies and the shorter wavelength harmonics of the selected frequency range blocked by filters; and (3) having flux of a least 10 microwatts per square meter of diffuser plate for each nanometer of bandwidth. Automatic electrical zeroing is obtained by blocking all light once at the beginning of each scan, obtaining an electrical drift-related signal and using the drift signal to ad- just the measured signal during the scan. Several different sensing interfaces can be used, including a quartz, light fiber probe having at least a 50% packing density and a cone angle of at least 24 degrees. The data and the programming storage is at least 30K bytes but the instrument uses no more than two watts of power when the instrument is not scanning.
Abstract:
An optical unit includes a reflective optical element and an antireflection structure having an average height and an average pitch larger than a maximum wavelength of light contained in an effective light flux. The antireflection structure is disposed outside an optical path of the effective light flux, and the antireflection structure has a plurality of convex portions extending in a predetermined direction. An angle formed between the predetermined direction and the optical path of the effective light flux is from 45 degrees to 60 degrees.
Abstract:
The present invention concerns an apparatus for spectral and intensity profile characterization comprising: a diffractive element; a beam block (3) attached to the diffractive element, the beam block (3) being positioned so as to block the passage of the direct incoming beam (1) which is not incident on the diffractive element; a device for translation of the beam block (3) and the diffractive element; reflective element (4); fixed detector (5) positioned on the axis of the incoming beam (1). The invention also concerns use and a method thereof. Such a compact system provides application in the field of spectrometry and diagnostics of the beam intensity profile, especially in the area of XUV and soft X-rays.
Abstract:
Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block 45a may be disposed in the optical path between the interferometer and the light source 41 for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block 45b may be disposed in the optical path on the opposite side of the interferometer than the light source.
Abstract:
A sensor apparatus has a substrate and a spectrally selective detection system, and a cover. The spectrally sensitive detection system is sandwiched between the substrate and the cover. The spectrally selective detection system includes a generally laminar array of wavelength selectors optically coupled to a corresponding array of optical detectors located within the substrate. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
Abstract:
An apparatus comprising at least: a first waveguide; a second waveguide; and a diffractive element. The first waveguide guides a first band of onto the diffractive element such that the first band is diffracted at an mth non-zero order over a first range of angles. The second waveguide guides a second band onto the diffractive element such that the second band is diffracted at the mth non-zero over the first range of angles. The second waveguide guides a third band onto the diffractive element such that the third band is diffracted at the nth non-zero order over the first range of angles. Wavelengths of the first band, the second band, and the third band do not overlap with each other. The mth order and the nth order are different from each other.
Abstract:
A spectrometer includes a light detection element provided with a light passing part and a light detection part, a support fixed to the light detection element such that a space is formed between the light passing part and the light detection part, a first reflection part provided in the support and configured to reflect light passing through the light passing part in the space, a second reflection part provided in the light detection element and configured to reflect the light reflected by the first reflection part in the space, and a dispersive part provided in the support and configured to disperse and reflect the light reflected by the second reflection part to the light detection part in the space.
Abstract:
The imaging assembly includes: a multi-band sensor (5), comprising a plurality of light sensors (7) each for measuring a light intensity returned by a target (8) in a predetermined frequency band; a sunlight detector (9), comprising a plurality of control sensors (11) each for measuring an ambient light intensity in one of the predetermined bands of frequencies of the multi-band sensor (5) each associated with a band-pass filtre; an electronic module (13) configured so as to calculate at least one characteristic variable value of the light intensity returned by the target (8) in each predetermined frequency band; the sunlight detector (9) comprising a box casing (21), the control sensors (11) being attached to the box casing (21), the band-pass filtres (17) being attached to the box casing (21) each one so as to be facing the photosensitive surface of the associated control sensor.