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公开(公告)号：EP2136191B1
公开(公告)日：2012-02-01
申请号：EP09250995.9
申请日：2009-03-31
Applicant: Com Dev International Limited
Inventor： Scott, Alan Douglas
CPC classification number: G01J3/4532 , G01J3/02 , G01J3/024 , G01J3/0259 , G01J3/0289 , G01J3/0294 , G01J3/1895 , G01J3/4531 , G02B6/29352 , G02B6/29358 , G02B6/29389 , G02B6/30 , G02B2006/12119 , G02B2006/12159
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公开(公告)号：EP2402734A2
公开(公告)日：2012-01-04
申请号：EP11004519.2
申请日：2011-06-01
Applicant: Sony Corporation , ICyt Mission Technology Inc.
Inventor： Takasaki, Koji , Seo, Katsuhiro , Toishi, Mitsuru , Yamada, Shinji , Fukumoto, Atsushi , Durack, Gary
CPC classification number: G01N15/1434 , G01J3/024 , G01J3/1256 , G01N15/1459 , G01N21/53 , G01N21/645 , G02B6/14 , G02B6/32 , G02B6/4215
Abstract: A minute particle analyzing device includes: a light source; a first condenser lens for condensing light from the light source to a first end of a multimode optical fiber; a second condenser lens for condensing the light emerging from a second end of the multimode optical fiber to a minute particle; and a detector for detecting light generated from the minute particle by the application of the light from the light source.
Abstract translation: 微小颗粒分析装置包括：光源; 第一聚光透镜，用于将来自光源的光会聚到多模光纤的第一端; 第二聚光透镜，用于将从多模光纤的第二端出射的光聚集成微小颗粒; 以及检测器，用于通过施加来自光源的光来检测从微小颗粒产生的光。
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233.发明公开
公开(公告)号：EP2277073A1
公开(公告)日：2011-01-26
申请号：EP08755352.5
申请日：2008-05-12
Applicant: Raytheon Company
Inventor： COOK, Lacy
CPC classification number: G02B17/0642 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/024 , G01J3/0291 , G01J3/14 , G02B13/14 , G02B17/0663 , G02B17/0694
Abstract: A catoptric, wide-angle optical system includes at least three mirrors. Only the last mirror on the beam path (22) has a positive optical power and all other mirrors have negative optical power. The sum of the optical powers of the mirrors is zero. An external posterior aperture stop (35) is located on the beam path (22) between the last mirror and the image plane (24). The back focal length of the optical system (20) is equal to or greater than an effective focal length of the optical system (20). The field of view is large, and typically at least 30-40 degrees in one plane.
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公开(公告)号：EP2136191A1
公开(公告)日：2009-12-23
申请号：EP09250995.9
申请日：2009-03-31
Applicant: Com Dev International Limited
Inventor： Scott, Alan Douglas
CPC classification number: G01J3/4532 , G01J3/02 , G01J3/024 , G01J3/0259 , G01J3/0289 , G01J3/0294 , G01J3/1895 , G01J3/4531 , G02B6/29352 , G02B6/29358 , G02B6/29389 , G02B6/30 , G02B2006/12119 , G02B2006/12159
Abstract: An optical broadband micro-spectrometer containing an input optical assembly, a group of slab waveguide spatial heterodyne spectrometer (SHS) integrated circuits (ICs), a detection module and a processor for multi-line detection. The input optical assembly applies an input light signal uniformly with respect to brightness and frequency to the apertures of the waveguides and may project a pupil image onto the SHS input face and may be a scanner. Each slab waveguide spatial heterodyne spectrometer (SHS) integrated circuit (IC) contains at least one slab waveguide SHS IC. The detection module bonds directly to the slab waveguide output apertures. Each slab waveguide SHS IC may contain one or more slab waveguide SHS.
Abstract translation: 一种光学宽带微谱仪，包含一个输入光学组件，一组平板波导空间外差谱仪（SHS）集成电路（IC），一个检测模块和一个用于多线检测的处理器。 输入光学组件将关于亮度和频率的输入光信号均匀地施加到波导的孔，并且可以将瞳孔图像投影到SHS输入面上并且可以是扫描仪。 每个平板波导空间外差光谱仪（SHS）集成电路（IC）包含至少一个平板波导SHS IC。 检测模块直接连接到平板波导输出孔。 每个平板波导SHS IC可以包含一个或多个平板波导SHS。
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公开(公告)号：EP2062016A2
公开(公告)日：2009-05-27
申请号：EP07814513.3
申请日：2007-08-28
Applicant: Thermo Electron Scientific Instruments LLC
Inventor： DECK, Francis J.
IPC: G01J3/00
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0237 , G01J3/024 , G01J3/0262
Abstract: In a spectrometer, preferably in a spectrometric microscope, light from a specimen is collected at a collector objective element and delivered to a camera element, which in turn provides the light to a photosensitive detector. A focal plane is provided between the collector objective element and the camera element, and one or more aperture arrays may be situated in the focal plane to restrict the detector's field of view of the specimen to the areas within the apertures. By utilizing aperture arrays with apertures of different sizes and shapes, the spatial resolution of the spectrometer readings may be varied without the need to vary the optics of the spectrometer. As a result, if the optics are optimized to minimize vignetting, spatial resolution may be varied without adverse increases in vignetting.
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Patent Agency Ranking
公开(公告)号：EP1413860A4
公开(公告)日：2009-02-25
申请号：EP02743845
申请日：2002-07-05
Applicant: HAMAMATSU PHOTONICS KK
Inventor： SAKAI SHIROU
CPC classification number: G01J3/06 , G01J3/02 , G01J3/0218 , G01J3/0221 , G01J3/0235 , G01J3/0237 , G01J3/024 , G01J3/0264 , G01J3/0291 , G01J3/18 , G01J3/2803 , G01J3/36 , G01N21/645 , G01N2021/6417 , G01N2021/6421 , G01N2021/6423
Abstract: A spectroscopic device (10) comprising an optical fiber bundle (12) having its output end (12a) arranged in a vertical direction, a slit (16) provided so as to face the output end (12a) of the optical fiber bundle (12), a spectroscopic element arranging means (20) capable of arranging, on the optical path of light output from the output end (12a) of the bundle (12) and passed through the slit (16), a first diffraction grating (23) provided with a groove extending along a vertical direction at a specified line dispersion horizontally and a second diffraction grating (24) provided with a groove extending along a vertical direction at a line dispersion larger than that for the first diffraction grating (23) horizontally so as to enable switching between the diffraction gratings, and a photomultiplier (30) comprising a plurality of horizontally-arranged rows of anodes (53) extending along a vertical direction.
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公开(公告)号：EP1521942A2
公开(公告)日：2005-04-13
申请号：EP03736659.8
申请日：2003-05-23
Applicant: Cymer, Inc.
Inventor： SANDSTROM, Richard, L. , MELCHIOR, John, T. , RAO, Rahasekhar
IPC: G01B9/02
CPC classification number: G01J3/26 , G01J1/4257 , G01J1/429 , G01J3/02 , G01J3/0205 , G01J3/0208 , G01J3/024 , G01J3/027 , G01J9/02 , G01J9/0246 , G03F7/70025 , G03F7/70575 , G03F7/70933 , H01S3/0057 , H01S3/0071 , H01S3/02 , H01S3/036 , H01S3/038 , H01S3/0385 , H01S3/0401 , H01S3/041 , H01S3/08009 , H01S3/08036 , H01S3/097 , H01S3/0971 , H01S3/0975 , H01S3/1024 , H01S3/104 , H01S3/105 , H01S3/1055 , H01S3/1305 , H01S3/134 , H01S3/139 , H01S3/22 , H01S3/2207 , H01S3/223 , H01S3/225 , H01S3/2251 , H01S3/2256 , H01S3/2258 , H01S3/2333 , H01S3/2366
Abstract: The present invention provides a wavemeter for an ultraviolet laser capable of long life beam quality monitoring in a pulsed ultraviolet laser system at pulse rates greater that 2000 Hz at pulse energies at 5 mJ or greater. In a preferred embodiment an enhanced illumination configuration reduces per pulse illumination of an etalon by a factor of 28 compared to a popular prior art configuration. Optics are provided in this embodiment which reduce light entering the etalon to only that amount needed to illuminate a linear photo diode array positioned to measure interference patterns produced by the etalon. In this preferred embodiment tow sample beams produced by reflections from two surfaces of a beam splitter are diffused by a defractive diffuser and the output of the defractive diffuser is focused on tow separate secondary diffusers effectively combining both beams in two separate secondary diffusers effectively combining both beams in two separate spectrally equivalent diffuse beams. One beam is used for wavelength and bandwidth measurement and the other beam is used for calibration. In preferred embodiments an etalon chamber contains nitrogen with an oxygen concentration of between 1.6 and 2.4 percent.
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公开(公告)号：EP0135761B1
公开(公告)日：1991-06-05
申请号：EP84109506.0
申请日：1984-08-09
Applicant: THE PERKIN-ELMER CORPORATION
Inventor： Young, Eugene F.
CPC classification number: G01J3/02 , G01J3/0229 , G01J3/024 , G01J3/08 , G01J3/453
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公开(公告)号：EP3682203B1
公开(公告)日：2024-08-28
申请号：EP18855255.8
申请日：2018-09-14
CPC classification number: G01J3/44 , G01N21/65 , G01N2201/0820130101 , G01J3/021 , G01J3/06 , G01J3/32 , G01J2003/06420130101 , G01J3/0208 , G01J3/0218 , G01J3/024 , G01N2021/65620130101 , G01N21/474
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公开(公告)号：EP2286195B1
公开(公告)日：2017-12-20
申请号：EP09759415.4
申请日：2009-06-04
Applicant: PerkinElmer Health Sciences, Inc.
Inventor： VILLAUMIE, Julien, S.
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/024 , G01J3/0291 , G01J3/0294 , G01J3/10 , G01J3/44 , G01J2003/1213 , G01J2003/1243 , G01N21/65 , G01N2021/6419 , G01N2021/6484 , G01N2201/0826 , G01N2201/0833
Abstract: Certain examples described herein are directed to optical devices and systems that include first and second optical elements. In some examples, the first optical element may be configured to pass light received from an excitation source, and the second optical element may be optically coupled to the first optical element and may be configured to reflect incident light from the first optical element back to the first optical element and configured to pass the light reflected from the first optical element. Methods using the devices and systems are also described.
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