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    LUMINESCENCE MEASURING DEVICE
    261.
    发明公开
    LUMINESCENCE MEASURING DEVICE 审中-公开
    LUMINESZENZMESSVORRICHTUNG

    公开(公告)号：EP2869064A4

    公开(公告)日：2016-03-02

    申请号：EP13810806

    申请日：2013-05-22

    Applicant: HITACHI HIGH TECH CORP

    Inventor： NODA HIDEYUKI ,  OKANOJO MASAHIRO

    IPC: G01N21/76 ,  C12M1/34

    CPC classification number: G01N21/76 ,  C12M1/34 ,  G01J1/0252 ,  G01N2201/0231 ,  G01N2201/1211 ,  G02B7/008 ,  H01L31/024

    Abstract: Provided is a weak luminescence detecting device that is capable of, in luminescence measurements, reducing dark current values and dark current pulse counts, preventing fluctuations in dark current values and dark current pulse counts with respect to temperature, and capturing an optical signal with a large solid angle, and that can, with high sensitivity, detect luminescence without directivity, such as bioluminescence and chemiluminescence. A luminescence measuring device is provided with a plate member to hold a container holder in which a sample is stored, a light detector to detect luminescence in the sample, a temperature control unit to control the temperature of the light detector, and a ventilator to blow air on the light receiving face of the light detector.

    Abstract translation: 提供了一种弱发光检测装置，其能够在发光测量中降低暗电流值和暗电流脉冲计数，防止暗电流值和暗电流脉冲计数相对于温度的波动，并且捕获具有大的光信号 可以以高灵敏度检测发光，无生物发光和化学发光等方向性。 发光测量装置设置有用于保持其中存储样品的容器保持器的板构件，用于检测样品中的发光的光检测器，用于控制光检测器的温度的温度控制单元，以及吹风机 光检测器的光接收面上的空气。

    REFRACTIVE INDEX BASED MEASUREMENTS
    262.
    发明公开
    REFRACTIVE INDEX BASED MEASUREMENTS 审中-公开
    基于折射指数的测量

    公开(公告)号：EP2976624A1

    公开(公告)日：2016-01-27

    申请号：EP14711499.5

    申请日：2014-03-18

    Applicant: The Technical University of Denmark

    Inventor： SØRENSEN, Henrik Schiøtt ,  JØRGENSEN, Thomas Martini

    IPC: G01N21/85

    CPC classification number: G01N21/45 ,  G01N21/85 ,  G01N2201/0231

    Abstract: In a method for performing a refractive index based measurement of a property of a fluid such as chemical composition or temperature, a chirp in the local spatial frequency of interference fringes of an interference pattern is reduced by mathematical manipulation of the recorded light intensity in the interference pattern or by the physical positioning and arrangement of a detector used for capturing the interference pattern.

    Abstract translation: 在用于执行诸如化学成分或温度的流体特性的基于折射率的测量的方法中，干涉图案的干涉条纹的局部空间频率中的啁啾通过对干涉中记录的光强度进行数学处理而降低 图案或通过用于捕获干涉图案的检测器的物理定位和布置。

    LUMINESCENCE MEASURING DEVICE
    263.
    发明公开
    LUMINESCENCE MEASURING DEVICE 审中-公开
    发光测量装置

    公开(公告)号：EP2869064A1

    公开(公告)日：2015-05-06

    申请号：EP13810806.3

    申请日：2013-05-22

    Applicant: Hitachi High-Technologies Corporation

    Inventor： NODA, Hideyuki ,  OKANOJO, Masahiro

    IPC: G01N21/76 ,  C12M1/34

    CPC classification number: G01N21/76 ,  C12M1/34 ,  G01J1/0252 ,  G01N2201/0231 ,  G01N2201/1211 ,  G02B7/008 ,  H01L31/024

    Abstract: Provided is a weak luminescence detecting device that is capable of, in luminescence measurements, reducing dark current values and dark current pulse counts, preventing fluctuations in dark current values and dark current pulse counts with respect to temperature, and capturing an optical signal with a large solid angle, and that can, with high sensitivity, detect luminescence without directivity, such as bioluminescence and chemiluminescence. A luminescence measuring device is provided with a plate member to hold a container holder in which a sample is stored, a light detector to detect luminescence in the sample, a temperature control unit to control the temperature of the light detector, and a ventilator to blow air on the light receiving face of the light detector.

    Abstract translation: 提供一种弱发光检测装置，其能够在发光测量中减少暗电流值和暗电流脉冲计数，防止暗电流值的波动和相对于温度的暗电流脉冲计数，并且捕获大的光信号 立体角，并且可以以高灵敏度检测没有方向性的发光，如生物发光和化学发光。 发光测量装置具备板状部件，该板状部件用于保持收纳有试样的容器支架，检测试样中的发光的光检测器，控制光检测器的温度的温度控制单元， 空气在光检测器的光接收面上。

    AUTOMATIC ANALYSIS DEVICE
    265.
    发明公开
    AUTOMATIC ANALYSIS DEVICE 审中-公开
    自动分析装置

    公开(公告)号：EP2642299A9

    公开(公告)日：2013-12-11

    申请号：EP11841497.8

    申请日：2011-10-18

    Applicant: Hitachi High-Technologies Corporation

    Inventor： YOSHIKAWA, Keiko ,  YAMAZAKI, Hajime

    IPC: G01N35/00 ,  G01N21/01

    CPC classification number: G01N21/17 ,  F21Y2115/10 ,  G01N21/272 ,  G01N2021/3181 ,  G01N2035/00346 ,  G01N2201/0231 ,  G01N2201/0624 ,  G01N2201/0695 ,  G01N2201/1211

    Abstract: An automatic analyzing apparatus which can make an adjustment to a target temperature so as to stabilize the light intensity of an LED and also can make the adjustment to that temperature in a short time is provided. The automatic analyzing apparatus in which an LED is used for a light source 114 includes a temperature adjusting mechanism 201 for the LED, and the temperature adjusting mechanism 201 includes a metal member 202 provided with the light source 114, a pair of metal pipes (water-flowing pipes) 203 buried in the metal member 202 and allowing constant-temperature bath water to flow therein, and pins (small metal piece members) 204 bringing only a heat-generating lead 252 of the light source 114 into direct contact with the metal member 202. Therefore, the temperature adjusting mechanism 201 can make an adjustment to a target temperature so as to stabilize the light intensity of the LED, and the adjustment to that temperature can be made in a short time.

    Abstract translation: 本发明提供一种自动分析装置，其能够对目标温度进行调整以稳定LED的光强度，并且还能够在短时间内对该温度进行调整。 其中LED用于光源114的自动分析装置包括用于LED的温度调节机构201，并且温度调节机构201包括设置有光源114的金属构件202，一对金属管（水 埋入金属构件202内且使恒温槽内的水流入的金属管203），仅使光源114的发热引线252与金属直接接触的销（小金属片构件）204 因此，温度调节机构201可以对目标温度进行调节，以便稳定LED的光强度，并且可以在短时间内对该温度进行调节。

    AN OPTICAL MEASUREMENT INSTRUMENT
    266.
    发明公开
    AN OPTICAL MEASUREMENT INSTRUMENT 有权
    OPTISCHES MESSINSTRUMENT

    公开(公告)号：EP2486465A1

    公开(公告)日：2012-08-15

    申请号：EP10776758.4

    申请日：2010-10-06

    Applicant: Wallac OY

    Inventor： OJALA, Markku ,  LAITINEN, Jyrki ,  ISAKSSON, Christer ,  ELO, Tommi

    IPC: G05D23/19 ,  G01N21/25 ,  G01N21/64

    CPC classification number: G01N21/6452 ,  G01N21/0332 ,  G01N2201/0231 ,  G05D23/1919

    Abstract: An optical measurement instrument comprises: an excitation light source (120) arranged to produce an excitation beam for at least one of samples to be measured and a detector (132) arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam. The optical measurement instrument further comprises an arrangement for controlling temperature of the samples to be measured. The arrangement comprises: one or more temperature sensors (176) for producing one or more temperature signals responsive to temperature of a measurement chamber (170) of the optical measurement instrument, one or more heating resistors (171-175) arranged to warm the measurement chamber, and a controller (177) arranged to control electrical power supplied to the heating resistors on the basis of the one or more temperature signals.

    Abstract translation: 一种光学测量仪器包括：激发光源（120），被布置成产生用于要测量的样本中的至少一个的激发光束;以及检测器（132），其被布置成检测被测样品之一发射的发射光束;以及 以产生响应于检测到的发射光束的检测信号。 光学测量仪器还包括用于控制要测量的样品的温度的装置。 该装置包括：用于产生响应于光学测量仪器的测量室（170）的温度的一个或多个温度信号的一个或多个温度传感器（176），布置成加热测量的一个或多个加热电阻器（171-175） 以及控制器（177），其被配置为基于所述一个或多个温度信号来控制提供给所述加热电阻器的电力。

    Refraktometer
    267.
    发明公开
    Refraktometer 有权

    公开(公告)号：EP2266693A1

    公开(公告)日：2010-12-29

    申请号：EP10166396.1

    申请日：2010-06-17

    Applicant: Mettler-Toledo AG

    Inventor： Forrer, Christian ,  Bossart, Erwin ,  Bécheiraz, Félix

    IPC: B01L3/00 ,  B01L7/00 ,  G01N21/41

    CPC classification number: G01N21/41 ,  B01L3/508 ,  B01L7/00 ,  B01L2200/04 ,  B01L2300/043 ,  B01L2300/046 ,  B01L2300/048 ,  B01L2300/0809 ,  G01N2201/0224 ,  G01N2201/0231

    Abstract: Refraktometer mit einem Gehäuse (1), einer im Gehäuse (1) angeordneten Messzelle (8) und einer Deckeleinheit (2), welche eine Grundplatte (3) mit einer Aussparung (7), die einen Zugang zur Messzelle des Refraktometers bildet, und eine Deckel (4) zum Abdecken der Messzelle aufweist, wobei der Deckel (4) über ein Scharnier mit der Grundplatte (3) verbunden ist, dadurch gekennzeichnet, dass die Deckeleinheit (2) ferner einen Deckeleinsatz (11, 17, 18, 28, 31, 35, 39) aufweist, welcher Deckeleinsatz (11, 17, 18, 28, 31, 35, 39) auswechselbar im Deckel (4) angeordnet ist, und dass die Deckeleinheit (2) über ein mit der Grundplatte (3) verbundenes Verbindungselement lösbaren mit dem Gehäuse (1) verbunden ist.

    Abstract translation: 折射计具有壳体（1），设置在壳体中的测量单元（8）和包括用于允许进入测量单元的基板（3）和切口（7）的盖单元（2）。 盖（4）覆盖测量单元。 一对铰链部分（9,10）将盖子铰接地连接到基板。 盖子插入件（11）可更换地布置在盖子中。 连接元件例如 卡扣连接，通过将壳体连接到基板，可将盖单元可拆卸地连接到壳体。 铰链部分彼此连接，使得盖与基板分离。

    ANALYSIS METHOD AND ANALYSIS APPARATUS
    269.
    发明公开
    ANALYSIS METHOD AND ANALYSIS APPARATUS 有权
    Analyseverfahren und Analysevorrichtung

    公开(公告)号：EP2048498A1

    公开(公告)日：2009-04-15

    申请号：EP07791811.8

    申请日：2007-08-02

    Applicant: Arkray, Inc.

    Inventor： TANJI, Hideki

    IPC: G01N33/48 ,  G01N21/78 ,  G01N33/52

    CPC classification number: G01N35/00712 ,  G01N21/78 ,  G01N31/222 ,  G01N2035/00455 ,  G01N2201/0231 ,  G01N2201/0238 ,  G01N2201/1214

    Abstract: An analysis method includes the steps of causing a moist sample to react with a reagent and measuring concentration of a particular component contained in the sample based on the state after the reaction of the sample with the reagent. The reaction step and the measurement step are performed while the amount of moisture contained in the air in a space accommodating the sample and the reagent is directly or indirectly measured. The method further includes the step of correcting the measurement result of the concentration of the particular component based on the amount of moisture contained in the air.

    Abstract translation: 分析方法包括以下步骤：根据样品与试剂反应后的状态，使湿样品与试剂反应并测定样品中所含特定成分的浓度。 执行反应步骤和测量步骤，同时直接或间接测量容纳样品和试剂的空间中的空气中所含的水分量。 该方法还包括基于空气中含有的水分的量来校正特定成分的浓度的测量结果的步骤。

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