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公开(公告)号：US10718635B2
公开(公告)日：2020-07-21
申请号：US15668825
申请日：2017-08-04
Applicant: CHROMA ATE INC.
Inventor： Tsz-Lang Chen , Ming-Chieh Lin , Yen-Ching Liu
Abstract: A contact detection circuit is applied to a four-terminal measurement device. The contact detection circuit comprises a first isolator, a signal generator, a multiplier and a calculator. The first isolator comprises a primary side and a secondary side, with the secondary side comprising a first terminal and a second terminal, with the first terminal configured to be electrically connected to a driving terminal and the second terminal configured to be electrically connected to a measuring terminal. The signal generator is configured to provide a measuring signal. The multiplier is configured to generate an output signal based on the measuring signal and a first reflected signal when the first reflected signal is induced at the primary side of the first isolator based on the measuring signal. The calculator calculates contact resistance between the driving terminal and the measuring terminal based on a direct-current component of the output signal.
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公开(公告)号：US10665906B2
公开(公告)日：2020-05-26
申请号：US16108081
申请日：2018-08-21
Applicant: CHROMA ATE INC.
Inventor： Hsu-Chang Hsu , Kuo-Yen Hsu , Kuan-Chen Chen , Chuan-Tse Lin
Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.
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273.发明授权公开(公告)号：US10520528B2
公开(公告)日：2019-12-31
申请号：US15790185
申请日：2017-10-23
Applicant: Chroma Ate Inc.
Inventor： Xin-Yi Wu , Chien-Hung Lo , Jui-Chih Chou , Hao-Che Yang , Nan-Yi Kuo
Abstract: A dew resistant module for a test socket, and an electronic component testing device having the same are provided. An enclosure body is provided to circumscribe the test socket; and a test socket base plate provided on top of the test socket and enclosure body. A cover is provided to cover the test socket, enclosure body and test socket base plate. With the provision of the enclosure body and the cover, the test socket, test socket base plate and a portion of the thermal head are prevented from coming into contact directly with the atmosphere, whereby condensation or dewing is prevented, thermal insulation achieved and energy consumption minimized.
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274.发明申请公开(公告)号：US20190172740A1
公开(公告)日：2019-06-06
申请号：US15903228
申请日：2018-02-23
Applicant: CHROMA ATE INC.
Inventor： Chi-Chen WU , Yun-Jui CHENG , Chien-Ming CHEN
IPC: H01L21/673 , G01R1/04 , H01R13/629 , B21D43/05 , H01L21/677 , H01L23/32 , B30B15/00
Abstract: A modular pressing device capable of generating stage downward forces is provided. The modular pressing device comprises a non-exchangeable pressing module and an exchangeable pressing module. The non-exchangeable pressing module includes a first downward force generating unit. The exchangeable pressing module includes a second downward force generating unit. The first downward force generating unit applies a first downward force to at least one of a testing seat and an electronic device through the exchangeable pressing module. The second downward force generating unit applies a second downward force to the electronic device. Thereby, the modular pressing device is capable to generate two different downward forces to reduce the downward surge force. In addition, as the exchangeable pressing module is worn, the exchangeable pressing module can be replaced quickly such that the maintenance cost can be effectively reduced and the stability of the apparatus can be enhanced.
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275.发明授权公开(公告)号：US10309986B2
公开(公告)日：2019-06-04
申请号：US15628069
申请日：2017-06-20
Applicant: CHROMA ATE INC.
Inventor： Chia-Hung Chien , Xin-Yi Wu
Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.
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Patent Agency Ranking
276.发明授权公开(公告)号：US10254308B2
公开(公告)日：2019-04-09
申请号：US15480427
申请日：2017-04-06
Applicant: Chroma ATE Inc.
Inventor： Chien-Ming Chen
IPC: G01R1/04 , H01R13/629
Abstract: An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.
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公开(公告)号：US20180172762A1
公开(公告)日：2018-06-21
申请号：US15846031
申请日：2017-12-18
Applicant: CHROMA ATE INC.
Inventor： Po-Kai CHENG
CPC classification number: G01R31/2891 , G01R1/06716 , G01R31/2863
Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.
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278.发明授权公开(公告)号：US09983259B2
公开(公告)日：2018-05-29
申请号：US15420154
申请日：2017-01-31
Applicant: CHROMA ATE INC.
Inventor： Xin-Yi Wu , Chien-Hung Lo
CPC classification number: G01R31/2875 , F25B21/04 , F25B2321/021 , F25B2321/0212 , F25B2321/0252 , F28D15/00 , G01R31/2877 , G05D23/19 , G05D23/1919
Abstract: A dual loop type temperature control module and an electronic device testing apparatus having the same are provided. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise/fall of its temperature dependent on the working fluid. The thermoelectric cooling device regulates the temperature of the tested object under a wide range of temperature difference and with accuracy based on the reference temperatures to facilitate the detection of high/low temperature.
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公开(公告)号：US20180045537A1
公开(公告)日：2018-02-15
申请号：US15668825
申请日：2017-08-04
Applicant: CHROMA ATE INC.
Inventor： Tsz-Lang CHEN , Ming-Chieh LIN , Yen-Ching LIU
IPC: G01D5/16
Abstract: A contact detection circuit is applied to a four-terminal measurement device. The contact detection circuit comprises a first isolator, a signal generator, a multiplier and a calculator. The first isolator comprises a primary side and a secondary side, with the secondary side comprising a first terminal and a second terminal, with the first terminal configured to be electrically connected to a driving terminal and the second terminal configured to be electrically connected to a measuring terminal. The signal generator is configured to provide a measuring signal. The multiplier is configured to generate an output signal based on the measuring signal and a first reflected signal when the first reflected signal is induced at the primary side of the first isolator based on the measuring signal. The calculator calculates contact resistance between the driving terminal and the measuring terminal based on a direct-current component of the output signal.
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280.发明申请公开(公告)号：US20180024162A1
公开(公告)日：2018-01-25
申请号：US15628069
申请日：2017-06-20
Applicant: CHROMA ATE INC.
Inventor： Chia-Hung CHIEN , Xin-Yi WU
CPC classification number: G01R1/0458 , G01R1/44 , G01R31/2891 , G05D23/1919 , G05D23/24
Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.
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