Abstract:
We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.
Abstract:
Apparatuses and methods for performing spectroscopy and optical microscopy are disclosed. In at least one embodiment, a Raman spectrometer includes a vacuum ultraviolet light source configured to generate light having a wavelength within a window in the vacuum ultraviolet region of the electromagnetic spectrum within which a local minimum in the absorption coefficient of Oxygen occurs. The spectrometer also includes a lens device that receives a first portion of the generated light, directs at least some of the first portion of the generated light toward a target location, receives reflected light from the target location, and directs the reflected light toward a further location. The spectrometer further includes a dispersive device that receives at least some of the reflected light and outputs dispersed light produced based thereupon, and a camera module that is positioned at additional location, where the camera module receives at least some of the dispersed light.
Abstract:
The color measurement instrument includes an illumination system and a sensing system. The illumination system is composed of a light emitting element and a light pipe. The light pipe has an incident surface at an illuminating end of the light emitting element and an ejected surface adjacent to a sensing platform of a sensing system. The sensing system includes a light collection device and a sensing platform for disposing a testing object. The light collection device includes an aperture stop for adjusting the shape of a light spot on a color sensor, a light collection lens set for detecting and projecting an image of a testing object on the sensing platform, a field stop for separating a light from an area, an uniform lens set for spreading the image on the field stop, and a color sensor for capturing and analyzing the color to adjust the brightness.
Abstract:
The invention is an optical method and apparatus for measuring the temperature of semiconductor substrates in real-time, during thin film growth and wafer processing. Utilizing the nearly linear dependence of the interband optical absorption edge on temperature, the present method and apparatus result in highly accurate measurement of the absorption edge in diffuse reflectance and transmission geometry, in real time, with sufficient accuracy and sensitivity to enable closed loop temperature control of wafers during film growth and processing. The apparatus operates across a wide range of temperatures covering all of the required range for common semiconductor substrates.
Abstract:
An apparatus (10) measures a spectral distribution of a printed product (12) produced with a printing device. The apparatus (10) has an illuminating source (20) for illuminating the printed product (12), an optoelectronic measuring means (32) for measurer the reflectance value of a section of the spectrum of the light (26) reflected from the printed product (12), an optical disperser (28) for dispersing the wavelengths of the reflected light (26), and a light entry gap plane that is definitive for the disperser (28). The light entry gap plane that is definitive for the disperser (28) is created by the surface of the printed product (12) to be examined.
Abstract:
A device for making spectroscopy measurements with reduced or eliminated surface reflections is provided, the device including an elongated member including an outermost opaque thin walled enclosure; an optically transparent thin-walled enclosure adjacent an inner surface of said outermost thin walled enclosure; one or more optical fibers centrally and axially disposed and spaced apart a distance B with respect to the optically transparent thin-walled enclosure; wherein the elongated member is adapted to be coupled to a spectrometer and an illumination source to provide a light signal from the illumination source along said optically transparent thin-walled enclosure and collect a scattered light signal from the sample by said one or more optical fibers to provide to the spectrometer.
Abstract:
We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.
Abstract:
Certain examples described herein are directed to optical devices and systems that include first and second optical elements. In some examples, the first optical element may be configured to pass light received from an excitation source, and the second optical element may be optically coupled to the first optical element and may be configured to reflect incident light from the first optical element back to the first optical element and configured to pass the light reflected from the first optical element. Methods using the devices and systems are also described.
Abstract:
An imaging optical system includes a set of mirrors including at least three mirrors on a beam path. Only a last mirror on the beam path has a positive optical power and all other mirrors have negative optical power. The sum of the optical powers of the mirrors is zero. An external posterior aperture stop is on the beam path between the last mirror and the image plane. A back focal length of the optical system is equal to or greater than an effective focal length of the optical system. The field of view is large, and typically at least 30-40 degrees in one plane.
Abstract:
An apparatus (10) measures a spectral distribution of a translucent printed product (12) produced with a printing device. The apparatus (10) has an illuminating source (20) for illuminating the printed product (12), an optoelectronic measuring means (32) for measurer the transmittance value of a section of the spectrum of the light (26) transmitted through the printed product (12), an optical disperser (28) for dispersing the wavelengths of the transmitted light (26), and a light entry gap plane that is definitive for the disperser (28). The light entry gap plane that is definitive for the disperser (28) is created by the surface of the printed product (12) to be examined.