Abstract:
A process for forming an electronic device includes forming a first layer over a substrate, wherein the first layer includes an organic layer, and depositing a second layer over the substrate after forming the first layer, wherein depositing the second layer is performed using ion beam sputtering. In another embodiment, a process for forming an electronic device includes placing a workpiece within a depositing chamber of a depositing apparatus, wherein the workpiece includes a substrate and an organic layer overlying the workpiece. The process includes generating a plasma within a plasma-generating chamber of the depositing apparatus, wherein the plasma is not in direct contact with the workpiece. The process also includes sending an ion beam from the plasma-generating chamber towards a target within the depositing chamber, wherein the target includes a material, and depositing a layer of the material over the organic layer.
Abstract:
Compositions are described comprising small molecule active material, polymer, and aprotic solvent, and methods for making the same, as well as devices and sub-assemblies including the same.
Abstract:
A process for forming an organic electronic device includes the steps of: (a) forming a first conductive member and a conductive lead over a substrate, wherein the first conductive member and conductive lead are spaced apart from each other; (b) forming an organic layer over the substrate, the first conductive member, and the conductive lead; (c) forming a patterned conductive layer over the organic layer, wherein the patterned conductive layer includes a second conductive member, and the patterned conductive layer creates an exposed portion of the organic layer and an unexposed portion of the organic layer; and (d) dry etching at least the exposed portion of the organic layer to expose a portion of the conductive lead using at least one oxygen-containing gas, wherein dry etching is performed at a pressure in a range of approximately 0.01 to 7.5 mTorr.
Abstract:
An electronic device (10) can include an organic device layer having a first (22) and a second portion (24). In one embodiment, the first portion (22) can have a higher resistivity than the second portion (24) and lie between a first and a second electrode (14, 16, 18) and include not more than 15 mole percent basic material. In a particular embodiment, the first and the second electrode can be an anode and cathode of a pixel. In another particular embodiment, the first and the second electrode (14, 16, 18) can be either both anodes or both cathodes of different pixels. In another embodiment, the organic device layer can include a large molecule material. In still another embodiment, a process of forming the electronic device can include selectively modifying the first portion of the organic device layer.
Abstract:
A process for forming an electronic device includes forming a first layer over a substrate and placing a first liquid composition over a first portion of the first layer. The first liquid composition includes at least a first guest material and a first liquid medium. The first liquid composition comes in contact with the first layer and a substantial amount of the first guest material intermixes with the first layer. An electronic device includes a substrate and a continuous first layer overlying the substrate. The continuous layer includes a first portion in which an electronic component lies and a second portion where no electronic component lies. The first portion is at least 30nm thick and includes a first guest material, and the second portion is no more than 40nm thick.
Abstract:
Methods, apparatus, and computer readable media with executable instructions stored thereon for virtual machine placement are provided. A user's demands on execution of a number of tasks, each task including a demand trace, can be defined as Service Level Agreement (SLA) information, including one or more Class of Service (CoS) levels defined by a Base Resource Entitlement (BRE) criteria and a Reserved Resource Entitlement (RRE) criteria (222). A highest CoS level of the one or more CoS levels can be selected (224) and the tasks within the Cos level can be load-balanced across a pool of servers (226). At least a portion of the RRE criteria can be removed from the demand trace of the selected CoS level (228). The selecting, load-balancing, and removing steps can be repeated until there are no more CoS levels (230).
Abstract:
The present disclosure includes a system and method for apportioning power consumption. In an example of apportioning power consumption according to the present disclosure, a transaction mix for a service is determined (104, 204, 330, 420), component resource usage for each of a number of components that are used while completing the service is determined (106, 206, 108, 208, 422), and component power consumption for each of the number of components is determined by use of the component resource usage (334, 424).
Abstract:
An embodiment includes gathering input data including observed utilizations of allocations and business service response times. The input data is partitioned into a plurality of data sets that include at least one training data set and at least one test data set. A model is generated that predicts responsiveness using the at least one training data set. The model is evaluated using the at least one test data set, and a business service response time distribution is predicted using the model. An embodiment may use a trace-based capacity planning methodology to estimate the impact of planning alternatives on business service responsiveness.
Abstract:
A multiary tree represents relationships among physical storage units and host computing devices. Virtual machines are optimally assigned among the host computing devices, and virtual disks of the virtual machines are optimally assigned among the physical storage units, using and extending the multiary tree used on constraints. The constraints regard the physical storage units, the host computing devices, the virtual machines, and the virtual disks.
Abstract:
Example methods, apparatus and articles of manufacture to migrate virtual machines are disclosed. A disclosed example method includes identifying via a processor a first virtual machine to be migrated from a first host to a second host to improve a performance of the first virtual machine, determining that a frequency threshold associated with the first virtual machine will not be exceeded if the first virtual machine is migrated, determining a reliability rating for the first virtual machine, and migrating the first virtual machine to the second host based on the frequency threshold and the reliability rating.