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    X-RAY EXAMINATION DEVICE AND METHOD
    22.
    发明申请
    X-RAY EXAMINATION DEVICE AND METHOD 审中-公开
    X射线检查装置及方法

    公开(公告)号：WO2010070583A1

    公开(公告)日：2010-06-24

    申请号：PCT/IB2009/055761

    申请日：2009-12-15

    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH ,  SCHLOMKA, Jens-peter ,  ROESSL, Ewald ,  PROKSA, Roland

    Inventor： SCHLOMKA, Jens-peter ,  ROESSL, Ewald ,  PROKSA, Roland

    IPC: A61B6/03 ,  H05G1/34

    CPC classification number: A61B6/405 ,  A61B6/032 ,  A61B6/4241 ,  A61B6/482 ,  A61B6/508 ,  A61B6/542 ,  G01T1/2985 ,  G06T11/006 ,  H05G1/34

    Abstract: The present invention relates to an X-ray examination device by which the problems of high count rate in the construction of a spectral CT scanner based on photon counting can be overcome. The proposed X-ray examination device comprises: an X-ray source (2) for emitting an X-ray beam (4) of X-ray radiation while rotating around an imaging region (5), an X-ray detector (6) having a plurality of detector cells (61) for detecting X- ray radiation emitted by said X-ray source (2) and having passed through said imaging region (5), a control unit (9) for modulating the source current of said X-ray source (2) between at least two different source currents to obtain at least two detection data sets for at least two different X-ray fluxes, wherein the lowest X-ray flux is low enough to avoid overloading of the X-ray detector (6) in the direct X-ray beam, and a reconstruction unit (10) for reconstructing an X-ray image from said at least two detection data sets, wherein the pixel values of the pixels of said X-ray image are reconstructed taking into account whether or not the higher X-ray flux resulted in an overloading of the X-ray detector (6) at the respective detector cells.

    Abstract translation: 本发明涉及一种能够克服基于光子计数的光谱CT扫描器的高计数率问题的X射线检查装置。 所提出的X射线检查装置包括：X射线源（2），用于在围绕成像区域（5）旋转的同时发射X射线辐射的X射线束（4），X射线检测器（6） 具有用于检测由所述X射线源（2）发射并穿过所述成像区域（5）的X射线辐射的多个检测器单元（61），用于调制所述X射线源的源电流的控制单元（9） 至少两个不同源电流之间的射线源（2），以获得用于至少两个不同X射线通量的至少两个检测数据组，其中最低X射线通量足够低以避免X射线检测器的过载 （6），以及用于从所述至少两个检测数据集重构X射线图像的重建单元（10），其中，所述X射线图像的像素的像素值被重建 考虑较高的X射线通量是否导致X射线检测器（6）在相应检测器单元处的过载。

    IMAGING APPARATUS, CALIBRATION ASSEMBLY, DEVICE AND METHOD FOR OBTAINING A MONOCHROMATIC FLOW OF X-RAY RADIATION, AND METHODS OF CALIBRATING A DETECTOR ELEMENT
    24.
    发明申请
    IMAGING APPARATUS, CALIBRATION ASSEMBLY, DEVICE AND METHOD FOR OBTAINING A MONOCHROMATIC FLOW OF X-RAY RADIATION, AND METHODS OF CALIBRATING A DETECTOR ELEMENT 审中-公开
    成像装置，校准装置，用于获得X射线辐射的单色流动的装置和方法，以及校准检测元件的方法

    公开(公告)号：WO2009072044A3

    公开(公告)日：2009-08-13

    申请号：PCT/IB2008054997

    申请日：2008-11-28

    Applicant: KONINKL PHILIPS ELECTRONICS NV ,  PHILIPS INTELLECTUAL PROPERTY ,  SCHLOMKA JENS-PETER ,  ROESSL EWALD

    Inventor： SCHLOMKA JENS-PETER ,  ROESSL EWALD

    IPC: G21K1/06

    CPC classification number: G21K1/06 ,  G21K2201/062 ,  G21K2201/067

    Abstract: An imaging apparatus based on the detection of X-ray photons, in particular for medical use, is described. The imaging apparatus comprises a radiation source (16) for generating a flow (18) of X-ray radiation, a detector (20) for detecting X-ray radiation, a control unit adapted to control the radiation source (16), to read out information from the detector (20) and to process the information into a visual image, and a device (10) for obtaining a monochromatic flow (12) of X-ray radiation. Furthermore, a device (10) is described, which comprises a positioning apparatus (34) and a crystalline element (36) mounted on the positioning apparatus (34), wherein the positioning apparatus (34) is adapted to position the crystalline element (36) relative to a flow (18) of X-ray radiation generated by a radiation source (16) such that the crystalline element (36) reflects a monochromatic flow (12) of X-ray radiation according to Bragg' s law. Finally, a corresponding calibration assembly, a method of obtaining a monochromatic flow (12) of X-ray radiation and methods of calibrating a detector element (42) of a detector (20) are described.

    Abstract translation: 描述了基于X射线光子的检测，特别是用于医疗用途的成像装置。 成像装置包括用于产生X射线辐射流（18）的辐射源（16），用于检测X射线辐射的检测器（20），适于控制辐射源（16）的控制单元 （20）的信息和将信息处理成可视图像的装置（10），以及用于获得X射线辐射的单色流（12）的装置（10）。 此外，描述了一种装置（10），其包括定位装置（34）和安装在定位装置（34）上的结晶元件（36），其中定位装置（34）适于将结晶元件（36） ）相对于由辐射源（16）产生的X射线辐射的流（18），使得结晶元件（36）根据布拉格定律反射X射线辐射的单色流（12）。 最后，描述了相应的校准组件，获得X射线辐射的单色流（12）的方法和校准检测器（20）的检测器元件（42）的方法。

    DETECTION DEVICE FOR DETECTING RADIATION
    25.
    发明申请
    DETECTION DEVICE FOR DETECTING RADIATION 审中-公开
    用于检测辐射的检测装置

    公开(公告)号：WO2008149292A3

    公开(公告)日：2009-06-25

    申请号：PCT/IB2008052170

    申请日：2008-06-04

    Applicant: KONINKL PHILIPS ELECTRONICS NV ,  PHILIPS INTELLECTUAL PROPERTY ,  PROKSA ROLAND ,  SCHLOMKA JENS-PETER ,  ROESSL EWALD

    Inventor： PROKSA ROLAND ,  SCHLOMKA JENS-PETER ,  ROESSL EWALD

    IPC: G01T1/164

    CPC classification number: G01T1/1648

    Abstract: The present invention relates to a detection device for detecting radiation emitted from a radiation source, wherein the detection device (6) comprises a detection surface (19) and lamellae (18) protruding from the detection surface (19), wherein the lamellae (18) comprise a first end portion (20) close to the detection surface (19) and a second end portion (21) remote from the detection surface (19) and wherein the first end portion (20) has a larger width than the second end portion (21). The invention relates further to a computed tomography apparatus comprising this detection device.

    Abstract translation: 本发明涉及一种用于检测从辐射源发射的辐射的检测装置，其中检测装置（6）包括从检测表面（19）突出的检测表面（19）和薄片（18），其中薄片（18） ）包括靠近检测表面（19）的第一端部（20）和远离检测表面（19）的第二端部（21），并且其中第一端部（20）的宽度大于第二端 部分（21）。 本发明进一步涉及包括该检测装置的计算机断层摄影装置。

    CALIBRATION OF DIFFERENTIAL PHASE-CONTRAST IMAGING SYSTEMS
    27.
    发明申请
    CALIBRATION OF DIFFERENTIAL PHASE-CONTRAST IMAGING SYSTEMS 审中-公开
    差分相位成像系统的校准

    公开(公告)号：WO2011070521A1

    公开(公告)日：2011-06-16

    申请号：PCT/IB2010/055664

    申请日：2010-12-08

    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH ,  VOGTMEIER, Gereon ,  ENGEL, Klaus Jürgen ,  GELLER, Dieter ,  KOEHLER, Thomas ,  ROESSL, Ewald

    Inventor： VOGTMEIER, Gereon ,  ENGEL, Klaus Jürgen ,  GELLER, Dieter ,  KOEHLER, Thomas ,  ROESSL, Ewald

    IPC: A61B1/00

    CPC classification number: A61B6/4291 ,  A61B6/4092 ,  A61B6/484 ,  A61B6/583 ,  G21K2207/005

    Abstract: The present invention relates to an X-ray imaging system and a method for differential phase - contrast imaging of an object. To improve calibration of differential phase - contrast imaging systems and the alignment of the gratings an X-ray imaging system is provided that comprises an X-ray emitting arrangement providing at least partially coherent X-ray radiation and an X-ray detection arrangement comprising a phase- shift diffraction grating, a phase analyzer grating, and an X-ray image detector, all arranged along an optical axis. For stepping, the gratings and/or the X-ray emitting arrangement are provided with at least two actuators arranged opposite to each other with reference to the optical axis. For calibration, calibration projections are acquired without an object, wherein, the emitted X-ray radiation or one of the gratings is stepwise displaced with a calibration displacement value. For examination, measurement projections are acquired with an object, wherein the emitted X-ray radiation or one of the gratings is stepwise displaced with a measurement, a calibration projection is associated to each of the measurement projections by registering the latter with the calibration projections.

    Abstract translation: 本发明涉及一种用于对象的差分相位对比成像的X射线成像系统和方法。 为了改进差分相位对比成像系统的校准和光栅的对准，提供了一种X射线成像系统，其包括提供至少部分相干X射线辐射的X射线发射装置和包括 相移衍射光栅，相位分析仪光栅和X射线图像检测器，均沿光轴排列。 对于步进，光栅和/或X射线发射装置设置有相对于光轴彼此相对布置的至少两个致动器。 对于校准，在没有物体的情况下获取校准投影，其中，所发射的X射线辐射或其中一个光栅以校准位移值逐步位移。 为了进行检查，用物体获取测量投影，其中所发射的X射线辐射或其中一个光栅通过测量而逐步移位，通过将校准投影与校准投影相对应地将校准投影与每个测量投影相关联。

    GRATING FOR PHASE-CONTRAST IMAGING
    29.
    发明申请
    GRATING FOR PHASE-CONTRAST IMAGING 审中-公开
    用于相位对比成像的图像

    公开(公告)号：WO2010134012A1

    公开(公告)日：2010-11-25

    申请号：PCT/IB2010/052168

    申请日：2010-05-17

    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH ,  KOEHLER, Thomas ,  ROESSL, Ewald

    Inventor： KOEHLER, Thomas ,  ROESSL, Ewald

    IPC: G21K1/06

    CPC classification number: G21K1/06 ,  G21K2207/005

    Abstract: The invention relates to gratings for X-ray differential phase-contrast imaging, a focus detector arrangement and X-ray system for generating phase-contrast images of an object and a method of phase-contrast imaging for examining an object of interest. In order to provide gratings with a high aspect ratio but low costs, a grating for X-ray differential phase- contrast imaging is proposed, comprising a first sub-grating (112), and at least a second sub- grating (114; 116; 118), wherein the sub-gratings each comprise a body structure (120) with bars (122) and gaps (124) being arranged periodically with a pitch (a), wherein the sub- gratings (112; 114; 116; 118) are arranged consecutively in the direction of the X-ray beam, and wherein the sub-gratings (112; 114; 116; 118) are positioned displaced to each other perpendicularly to the X-ray beam.

    Abstract translation: 本发明涉及用于X射线差分相位对比成像的光栅，用于产生对象的相位对比图像的焦点检测器布置和X射线系统以及用于检查感兴趣对象的相位对比成像方法。 为了提供具有高纵横比但成本较低的光栅，提出了一种用于X射线差分相位对比成像的光栅，包括第一子光栅（112）和至少第二子光栅（114; 116 ; 118），其中所述子光栅各自包括具有杆（122）和间隙（124）的主体结构（120），所述杆具有间距（a）周期性地布置，其中所述子光栅（112; 114; 116; 118 ）沿X射线束的方向连续布置，并且其中子光栅（112; 114; 116; 118）被定位成垂直于X射线束彼此位移。

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