公开(公告)号：US20220391543A1

公开(公告)日：2022-12-08

申请号：US17775322

申请日：2020-11-03

Applicant: KONINKLIJKE PHILIPS N.V. ,  Stichting VU

Inventor： Hendrik Jaap BOS ,  Elias ATHANASOPOULOS ,  Radhesh Krishnan KONOTH ,  Kaveh RAZAVI

IPC: G06F21/72 ,  G06F21/74 ,  G06F21/84 ,  G06F21/34 ,  G06F21/60

Abstract: Some embodiments are directed to secure communication with a server from a device. The device is configured to decrypt an encrypted message in a secure mode with a private key, and to display secret shared with the user together with the decrypted message on a display of the device to indicate to the user that the message is being displayed by software running in the secure mode.

公开(公告)号：US11267694B2

公开(公告)日：2022-03-08

申请号：US16928851

申请日：2020-07-14

Applicant: Stichting VU-VUMC ,  FOM-Nikhef

Inventor： Eric Hennes ,  Alessandro Bertolini ,  Johannes Franciscus Van Den Brand

IPC: B81B3/00 ,  G01P15/13 ,  G01P15/08 ,  G01P15/09 ,  G01P15/125

Abstract: A MEMS sensor comprising preloaded suspension springs and a method for mechanically preloading suspension springs of a MEMS sensor are described. The MEMS sensor comprises a MEMS support structure; a plurality of suspension springs connected to said support structure; and, a proof mass flexibly suspended by said suspension springs; wherein at least one of said suspension springs is mechanically preloaded with a compressive force for reducing the natural frequency of said proof mass.

公开(公告)号：US20210102185A1

公开(公告)日：2021-04-08

申请号：US17048284

申请日：2019-04-18

Applicant: Stichting VU

Inventor： Tom Norbert Grossmann ,  Marta Pelay Gimeno ,  Sven Hennig ,  Saskia Antonie Neubacher

IPC: C12N9/52 ,  C12N15/113

Abstract: The present invention relates to methods and cross-linkers for the macrocyclization of proteins. The invention is useful for increasing the stability of a protein.

公开(公告)号：US20200232931A1

公开(公告)日：2020-07-23

申请号：US16751104

申请日：2020-01-23

Applicant: ASML Netherlands B.V. ,  Stichting Nederlandse Wetenschappelijk Onderzoek Instituten ,  Stichting VU ,  Universiteit van Amsterdam

Inventor： Stefan Michiel WITTE ,  Gijsbert Simon Matthijs JANSEN ,  Lars Christian FREISEM ,  Kjeld Sijbrand Eduard EIKEMA ,  Simon Gijsbert Josephus MATHIJSSEN

IPC: G01N21/88 ,  G03F7/20 ,  G01J9/00 ,  G01J1/42 ,  G01N21/95

Abstract: A metrology apparatus (302) includes a higher harmonic generation (HHG) radiation source for generating (310) EUV radiation. Operation of the HHG source is monitored using a wavefront sensor (420) which comprises an aperture array (424, 702) and an image sensor (426). A grating (706) disperses the radiation passing through each aperture so that the image detector captures positions and intensities of higher diffraction orders for different spectral components and different locations across the beam. In this way, the wavefront sensor can be arranged to measure a wavefront tilt for multiple harmonics at each location in said array. In one embodiment, the apertures are divided into two subsets (A) and (B), the gratings (706) of each subset having a different direction of dispersion. The spectrally resolved wavefront information (430) is used in feedback control (432) to stabilize operation of the HGG source, and/or to improve accuracy of metrology results.

公开(公告)号：US10660068B2

公开(公告)日：2020-05-19

申请号：US14896610

申请日：2014-06-06

Applicant: Stichting VU-VUMC ,  FOM-Nikhef

Inventor： Henk Jan Bulten ,  Johannes Franciscus Josephina Van Den Brand

IPC: H04W72/00 ,  H04W72/04 ,  H04W52/02 ,  H04B7/26 ,  H04W84/18

Abstract: A method for managing communication in a wireless mesh network comprising a plurality of wireless nodes and a wireless node for use in such network are described, wherein said method may comprise: providing a time slot schedule (frame), preferably a TDMA time slot schedule (frame), comprising one or more time slots, including a transmission time slot enabling a node to transmit a broadcast message, a reception time slot enabling a node to receive a broadcast message from one or more other nodes; and/or a sleep time slot for configuring said node in an idle state; and, assigning said time slots to nodes in said network on the basis of the position of said nodes in said network.

公开(公告)号：US20200041563A1

公开(公告)日：2020-02-06

申请号：US16527142

申请日：2019-07-31

Applicant: Stichting VU

Inventor： Patricius Aloysius Jacobus TINNEMANS ,  Patrick WARNAAR ,  Vasco Tomas Tenner ,  Maurits Van der schaar

IPC: G01R31/265

Abstract: Disclosed is a method for obtaining a computationally determined interference electric field describing scattering of radiation by a pair of structures comprising a first structure and a second structure on a substrate. The method comprises determining a first electric field relating to first radiation scattered by the first structure; determining a second electric field relating to second radiation scattered by the second structure; and computationally determining the interference of the first electric field and second electric field, to obtain a computationally determined interference electric field.

公开(公告)号：US20190107781A1

公开(公告)日：2019-04-11

申请号：US16150879

申请日：2018-10-03

Applicant: Stichting VU ,  Stichting Nederlandse Wetenschappelijk Onderzoek Instituten ,  Universiteit van Amsterdam ,  ASML Netherlands B.V.

Inventor： Patricius Aloysius Jacobus TINNEMANS ,  Arie Jeffrey Den Boef ,  Armand Eugene Albert Koolen ,  Nitesh Pandey ,  Vasco Tomas Tenner ,  Willem Marie Julia Marcel Coene ,  Patrick Warnaar

IPC: G03F7/20 ,  G03F9/00 ,  G01N21/47 ,  G01N21/95

Abstract: Described is a metrology system for determining a characteristic of interest relating to at least one structure on a substrate, and associated method. The metrology system comprises a processor being configured to computationally determine phase and amplitude information from a detected characteristic of scattered radiation having been reflected or scattered by the at least one structure as a result of illumination of said at least one structure with illumination radiation in a measurement acquisition, and use the determined phase and amplitude to determine the characteristic of interest.

公开(公告)号：US20170322215A1

公开(公告)日：2017-11-09

申请号：US15528322

申请日：2015-11-18

Applicant: Stichting Katholieke Universiteit ,  Stichting VU-Vumc

Inventor： Anna Catharina Navis ,  Wilhelmus Petrus Johannes Leenders ,  Thomas Würdinger

IPC: G01N33/574 ,  G01N33/74 ,  C07K14/71 ,  C12Q1/68

CPC classification number: G01N33/5748 ,  A61K2039/505 ,  C07K14/71 ,  C07K16/2863 ,  C12Q1/6883 ,  C12Q1/6886 ,  C12Q2600/106 ,  C12Q2600/156 ,  G01N33/574 ,  G01N33/74 ,  G01N2333/71

Abstract: The present invention relates to the fields of medicine and molecular diagnostics. In particular, it relates to a novel method for the treatment, prevention and/or delay of cancer and to a diagnostic method involving detection of a novel auto-active and intracellular mutant of MET.

公开(公告)号：US20170269482A1

公开(公告)日：2017-09-21

申请号：US15453049

申请日：2017-03-08

Applicant: Stichting VU ,  Universiteit van Amsterdam ,  Stichting voor Fundamenteel Onderzoek der Materie ,  ASML Netherlands B.V.

Inventor： Dirk Ewoud Boonzajer Flaes ,  Stefan Michiel Witte ,  Kjeld Sijbrand Eduard Eikema

IPC: G03F7/20 ,  G01B11/00 ,  G01N21/956 ,  G01N21/47

CPC classification number: G03F7/7065 ,  G01B11/00 ,  G01N21/4788 ,  G01N21/956 ,  G01N2201/061 ,  G01N2201/0635 ,  G02B21/16 ,  G03F7/70625 ,  G03F7/70633 ,  H05G2/003 ,  H05G2/008

Abstract: In an inspection apparatus, a target on the surface is illuminated with illuminating radiation that comprises first and second illuminating components. The illuminating components form one or more periodic illuminating patterns on the surface. A plurality of scattered radiation patterns formed by the illuminating radiation after scattering by the target is captured at a detector for a number of values of a controllable characteristic of at least one of the illuminating components. The captured radiation is then used to reconstruct data describing the target.

公开(公告)号：US20160305945A1

公开(公告)日：2016-10-20

申请号：US15102075

申请日：2014-12-02

Applicant: Stichting VU-VUmc

Inventor： Gerrit Johan OSSENKOPPELE ,  Gerrit Jan SCHUURHUIS ,  Wendelien ZEIJLEMAKER

IPC: G01N33/574 ,  G01N15/14 ,  G01N33/50

CPC classification number: G01N33/57426 ,  G01N15/14 ,  G01N33/5011 ,  G01N33/5073 ,  G01N33/57492 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2015/149 ,  G01N2800/52

Abstract: The present invention relates to a method for identifying Leukemic stem cells (LSC), based on measurement of the presence of a specific set of markers. The invention further relates to a container for use in performing the method. Also provided is application of the method for predicting response to therapy and/or chance of relapse of Acute Myeloid Leukemia, and application of the method in the context of screening for compounds that specifically eradicate Leukemic cells and not benign cells.

Abstract translation: 本发明涉及一种用于鉴别白血病干细胞（LSC）的方法，该方法是基于特定标记物组的存在的测量。 本发明还涉及一种用于执行该方法的容器。 还提供了预测对急性骨髓性白血病的治疗反应和/或复发机率的方法的应用，以及在筛选特异性根除白血病细胞而不是良性细胞的化合物的上下文中应用该方法。