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公开(公告)号：NO993674D0
公开(公告)日：1999-07-28
申请号：NO993674
申请日：1999-07-28
Applicant: ABB RESEARCH LTD
Inventor： BYATT ANTHONY , CHRISTEN THOMAS , KLEINER THOMAS , MATTER DANIEL , RUEEGG WALTER
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公开(公告)号：NO985935A
公开(公告)日：1999-06-23
申请号：NO985935
申请日：1998-12-17
Applicant: ABB RESEARCH LTD
Inventor： BYATT ANTHONY , CHRISTEN THOMAS , KLEINER THOMAS , MATTER DANIEL , RUEEGG WALTER
CPC classification number: G01F23/266 , G01B7/085 , G01F23/268
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Patent Agency Ranking
公开(公告)号：AU8076198A
公开(公告)日：1998-08-18
申请号：AU8076198
申请日：1997-12-24
Applicant: ABB RESEARCH LTD
Inventor： BYATT ANTHONY , RUEEGG WALTER , MATTER DANIEL , KLEINER THOMAS , CHRISTEN THOMAS
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公开(公告)号：DE10006503A1
公开(公告)日：2001-08-16
申请号：DE10006503
申请日：2000-02-14
Applicant: ABB RESEARCH LTD
Inventor： CHRISTEN THOMAS , RUEEGG WALTER , MATTER DANIEL , PRETRE PHILIPPE
Abstract: Multiple fixed electrodes (3) are arranged at specific interval from a counting wheel (1). Multiple measurement electrodes (12) are arranged inbetween non-conductive sections (13) of counting wheel along its periphery. The capacitance change between measurement and fixed electrodes based on position of the counting wheel, is measured.
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公开(公告)号：NO993674L
公开(公告)日：1999-09-28
申请号：NO993674
申请日：1999-07-28
Applicant: ABB RESEARCH LTD
Inventor： MATTER DANIEL , BYATT ANTHONY , CHRISTEN THOMAS , RUEEGG WALTER , KLEINER THOMAS
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公开(公告)号：NO985935L
公开(公告)日：1999-06-23
申请号：NO985935
申请日：1998-12-17
Applicant: ABB RESEARCH LTD
Inventor： BYATT ANTHONY , CHRISTEN THOMAS , KLEINER THOMAS , MATTER DANIEL , RUEEGG WALTER
Abstract: The coverings have differing thicknesses (di, dj). Measurements of capacity between electrodes (4, 5, 6, 13) are used to calculate the effective thickness (ds/ epsilon s) of an insulating film of contamination (14). An Independent claim is included for a capacitative level sensor. Preferred Features: The quotient of double layer capacities CDSj and CDSi for the ith and jth electrodes is obtained from a cited equation. The effective thickness is obtained from a further equation, relating dielectric constant of the coverings, their thicknesses, and capacitor areas. The sensor has a covering thickness of ca. 1 mm, with a dielectric constant below 5. The contaminant film electrical characteristics are specified in terms of a critical frequency related to measurement. Measurement frequency is specified as a function of dielectric relaxation frequency at the boundary layer. Though dielectric thickness varies and the electrodes are segmented, the probe external configuration, is a long, smooth, cylindrical rod.
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公开(公告)号：NO985935D0
公开(公告)日：1998-12-17
申请号：NO985935
申请日：1998-12-17
Applicant: ABB RESEARCH LTD
Inventor： BYATT ANTHONY , CHRISTEN THOMAS , KLEINER THOMAS , MATTER DANIEL , RUEEGG WALTER
Abstract: The coverings have differing thicknesses (di, dj). Measurements of capacity between electrodes (4, 5, 6, 13) are used to calculate the effective thickness (ds/ epsilon s) of an insulating film of contamination (14). An Independent claim is included for a capacitative level sensor. Preferred Features: The quotient of double layer capacities CDSj and CDSi for the ith and jth electrodes is obtained from a cited equation. The effective thickness is obtained from a further equation, relating dielectric constant of the coverings, their thicknesses, and capacitor areas. The sensor has a covering thickness of ca. 1 mm, with a dielectric constant below 5. The contaminant film electrical characteristics are specified in terms of a critical frequency related to measurement. Measurement frequency is specified as a function of dielectric relaxation frequency at the boundary layer. Though dielectric thickness varies and the electrodes are segmented, the probe external configuration, is a long, smooth, cylindrical rod.
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