Abstract:
The apparatus includes an operational amplifier (56) which has inverting (72) and non-inverting (70) inputs and an output (74) that is a function of the voltage at the inverting and non-inverting inputs (72-70). An attenuator network (54) is connected to the operational amplifier (56). The attenuator network (54) includes circuitry for reducing a voltage of a first value at the inputs (62, 64) of the attenuator network (54) to a voltage that is a fraction of the first value at the output of the attenuator network (54) which voltage is then transmitted to the operational amplifier (56) inputs (70, 72). The attenuator network (54) includes additional circuitry (66) for reducing a common-mode feed-through voltage of a second value at the inputs (62, 64) ot the attenuator network (54) to a common-mode feed-through voltage that is a fraction of the second voltage at the output of the operational amplifier (56).
Abstract:
The invention comprises an n-bit analog-to-digital flash converter comprising 2n/2 input comparators, each having a first input coupled to receive the analog voltage to be converted and a second input coupled to a different reference voltage. The reference voltages of each consecutive input comparator are spaced apart two LSBs of the converter. Each input comparator has two outputs, OUT and an inverted version thereof, O^¨B7U^¨B7T^¨B7. 2n-1 consecutive latches are provided. Every other latch receives at its inputs the OUT and O^¨B7U^¨B7T^¨B7 signals from a single associated input comparator. All other latches receive the OUT signal of one of the input comparators and the O^¨B7U^¨B7T^¨B7 signal of an adjacent input comparator. The latches having inputs coupled to the OUT and O^¨B7U^¨B7T^¨B7 signals of a single input comparator produce a comparison output which change state every two LSBs of the converter and the latches having one input coupled to the OUT signal of one input comparator and the O^¨B7U^¨B7T^¨B7 signal of an adjacent input comparator produce comparison signals which change state halfway between the output signals of the adjacent latches. Thus, a comparison output is provided for every LSB of the full scale range of the converter using only 2n/2 input comparators.
Abstract:
A voltage coupling circuit for use in a digital-to-time converter insures that converter operation is stabilized against temperature and power supply variations. The digital-to-time converter operates by comparing a ramp voltage to a threshold voltage that is set in accordance with an input digital word. The voltage coupling circuit, which causes the ramp voltage to track changes in the threshold voltage, includes a current mirror arrangement that separates the voltage coupling and ramp generation functions. As a result, transistor base currents are not drawn through the ramp capacitor, and accuracy is improved in the case of long time delays.
Abstract:
In an integrated circuit package, a ROM is provided for identifying the device for testing purposes. The ROM is programmed, for example, by cutting resistor links. The resistor links set the output of the PROM. This output is a binary word which is read by the tester at the same time that the tester performs measurements on the reference device. With this information the tester can then perform various calculations.
Abstract:
A technique and circuit for switching a bipolar output stage between an active mode in which the stage operates as a voltage source and an inhibit mode in which the stage is deactivated and the output node presents a floating high-impedance. The output stage may be in a digital device such as a digital pin driver circuit, or in an analog amplifier. Considering first the digital application, in the active mode, a digital output is switched between logic high and logic low voltages established by external references. The logic high and logic low reference voltages, and the corresponding output voltages, may be set to zero, a positive voltage or negative voltage independently of each other; a logic ''one'' can thus be set to a voltage below a logic ''zero''. When the output stage is an analog amplifier, in active mode it amplifies its input signal. In either arrangement, in the ''inhibit mode'', the output stage transistors are turned off by reverse-biasing their base-emitter junctions relative to the output node of the circuit, to provide a floating high-impedance output node. In the inhibit mode, additional means are provided for substantially cancelling leakage current at the output node.
Abstract:
A subranging converter employing a flash converter and a current-summing DAC which produces a current output. The DAC has a set of 2 - 1 current sources and 2 - 1 digital switches. Each switch channels its associated current source output either to the common output summing node or to ground. Each DAC switch, other than the first switch, takes its control input directly from an associated comparator in the flash converter. The direct connection between the comparators and the DAC eliminates the need for a video delay line and provides a fast conversion process.
Abstract:
A multiport RAM register file adapted for flowing data directly from an input port to an output port and for simultaneously writing to a location in the register file. In addition to the RAM register, the apparatus includes (1) a first set of multiplexers between the input ports and the RAM, (2) a second set of multiplexers between the output of the RAM and the output ports and (3) logic for controlling the multiplexers and writing to the RAM. The input multiplexers are controlled by flow-through address comparators; the output multiplexers are controlled by read address comparators. The data at any input port of the register file may be written to any of the RAM data bit buses by selecting the input multiplexer appropriately. Because the bit buses are being driven, this data simultaneously may be passed to the RAM output just as if the RAM were being read, i.e., as a flow-through. Further, if the RAM address lines are activated concurrently, this data can be written to a selected cell while it is flowing-through to the output port. The output multiplexers feed the data from the bit lines to a selected output port (or ports).
Abstract:
A fast full adder cell, for use in multiplier arrays. The cell uses simple 2-input gates (16, 18, 22, 24) and a pair of multiplexers (11, 21) made from pass transistors (12, 14, 26, 28). The 2-input gates (16, 18, 22, 24) may also be made from pass transistors and, in the case of AND and OR gates, a single additional field-effect transistor. In a first embodiment, the cell employs a one-bit-wide multiplexer (11) for selecting as the sum output either the output of a 2-input exclusive-OR gate (16) or the output of a 2-input exclusive-NOR gate (18). A second one-bit-wide multiplexer (21) selects as the cell's carry output either the output of a 2-input OR gate (24) or the output of a 2-input AND gate (22). In a second embodiment, the 2-input exclusive-OR and exclusive-NOR gates also are formed from either one or two single-bit multiplexers (Figs. 3 and 4, respectively), while the AND and OR gates are formed from pass transistors (36, 42) with a pull-up or pull-down transistor (38, 44) on their outputs, as appropriates. Both the P-type device and the N-type device of each pass transistor are formed with the same minimum possible with; to compensate for unequal propagation of 1's and 0's, an inverter follows each pair of pass transistors and the P-type and N-type devices of the inverter are of approximately the same size.
Abstract:
A high speed wide bandwidth peak detector (10) uses multiple peak detection stages (12a, 12b, ..., 12n) that detect different sub-ranges of a full-scale analog signal range. Splitting the peak detector into multiple stages reduces the number of taps in each stage, and hence their capacitance, which increases their bandwidth. The number of taps can be further reduced by using a non-uniform resolution of the desired full-scale amplitude range. In the preferred embodiment, identical peak detection stages are separated by fixed gain stages (14a, 14b, ..., 14n-1) that map the different sub-ranges to respective detection stages. This approach minimizes the effects of offset errors in the individual stages but requires gain stages that have wider bandwidths than the detection stages and which can be closely matched to maintain amplitude resolution.
Abstract:
A variable gain amplifier includes an input transconductor (10) having a transconductance that is variable in response to a first control signal (Ci), an output circuit (20) having a transresistance that is variable in response to the second control signal (Co) and a gain controller (30) responsive to a gain control signal x for providing the first and second control signals to the input transconductor and the output circuit. The amplifier has a voltage gain equal to the product of the transconductance and the transresistance. When the first control signal is a function (1 + x) of the gain control signal and the second control signal is a function (1 - x) of the gain control signal, the voltage gain of the amplifier is approximately an exponential function of the gain control signal.