Abstract:
Integrated passive devices (IPDs), electronic packaging structures, and methods of testing IPDs are described. In an embodiment, an electronic package structure includes an IPD with an array of capacitor banks that are electrically separate in the IPD, and a package routing that includes an interconnect electrically connected to an IC and a plurality of the capacitor banks in parallel.
Abstract:
Package on package structures and methods of manufacture are described. In various embodiments, DRAM die are integrated into various locations within a package on package structure, including within a bottom logic die package, as a co-package with a top NAND die package, and as a hybrid package structure between a top NAND die package and a bottom logic die package.
Abstract:
Packages and methods of formation are described. In an embodiment, a package includes a redistribution layer (RDL) formed directly on a top die, and a bottom die mounted on a back surface of the RDL.
Abstract:
In some embodiments, it is desirable to increase memory bandwidth using an integrated solution. In one embodiment, wide I/O memory may be used. Described herein are embodiments of systems and methods of reconfiguring wide I/O memory modules. The reconfigured memory modules may be configured such that the memory modules function in combination with current packaging architectures.
Abstract:
A disclosed system includes a package body that includes a system-on-a-chip (SoC) and an interconnect region. In an embodiment, the interconnect region includes a first conductive path between the SoC and a voltage regulator module (VRM), a second conductive path between the SoC and a first external connection, and a third conductive path between the VRM and a second external connection. In another embodiment, the VRM is positioned between and coupled to a first portion of the SoC and a first surface of the interconnect region. A second portion of the SoC is coupled directly to the first surface of the interconnection region. In another embodiment, the interconnect region has first and second opposing surfaces. The SoC is positioned on the first surface of the interconnect region. The VRM is externally coupled to a first surface of the package body adjacent to the second surface of the interconnect region.
Abstract:
Package structure with folded die arrangements and methods of fabrication are described. In an embodiment, a package structure includes a first die and vertical interposer side-by-side. A second die is face down on an electrically connected with the vertical interposer, and a local interposer electrically connects the first die with the vertical interposer.
Abstract:
Multiple component package structures are described in which an interposer chiplet is integrated to provide fine routing between components. In an embodiment, the interposer chiplet and a plurality of conductive vias are encapsulated in an encapsulation layer. A first plurality of terminals of the first and second components may be in electrical connection with the plurality of conductive pillars and a second plurality of terminals of first and second components may be in electrical connection with the interposer chiplet.
Abstract:
Package structure with folded die arrangements and methods of fabrication are described. In an embodiment, a package structure includes a first die and vertical interposer side-by-side. A second die is face down on an electrically connected with the vertical interposer, and a local interposer electrically connects the first die with the vertical interposer.
Abstract:
Systems that include integrated circuit dies and voltage regulator units are disclosed. Such systems may include a voltage regulator module and an integrated circuit mounted in a common system package. The voltage regulator module may include a voltage regulator circuit and one or more passive devices mounted to a common substrate, and the integrated circuit may include a System-on-a-chip. The system package may include an interconnect region that includes wires fabricated on multiple conductive layers within the interconnect region. At least one power supply terminal of the integrated circuit may be coupled to an output of the voltage regulator module via a wire included in the interconnect region.
Abstract:
Multiple component package structures are described in which an interposer chiplet is integrated to provide fine routing between components. In an embodiment, the interposer chiplet and a plurality of conductive vias are encapsulated in an encapsulation layer. A first plurality of terminals of the first and second components may be in electrical connection with the plurality of conductive pillars and a second plurality of terminals of first and second components may be in electrical connection with the interposer chiplet.