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公开(公告)号:US20250112164A1
公开(公告)日:2025-04-03
申请号:US18374932
申请日:2023-09-29
Applicant: Intel Corporation
Inventor: Bohan SHAN , Onur OZKAN , Ryan CARRAZZONE , Rui ZHANG , Haobo CHEN , Ziyin LIN , Yiqun BAI , Kyle ARRINGTON , Jose WAIMIN , Hongxia FENG , Srinivas Venkata Ramanuja PIETAMBARAM , Gang DUAN , Dingying David XU , Bin MU , Mohit GUPTA , Jeremy D. ECTON , Brandon C. MARIN , Xiaoying GUO , Steve S. CHO , Ali LEHAF , Venkata Rajesh SARANAM , Shripad GOKHALE , Kartik SRINIVASAN , Edvin CETEGEN , Mine KAYA , Nicholas S. HAEHN , Deniz TURAN
IPC: H01L23/538 , H01L21/48 , H01L23/00 , H01L25/065
Abstract: A device comprises a substrate comprising a plurality of build-up layers and a cavity. A bridge die is located within the cavity and a plurality of cavity side bumps are on one side of the bridge die. A plurality of interconnect pads with variable heights are on one of the build-up layers of the substrate coupled to the plurality of the cavity side bumps to bond the bridge die to the substrate.
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22.
公开(公告)号:US20240105571A1
公开(公告)日:2024-03-28
申请号:US17954288
申请日:2022-09-27
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Haobo CHEN , Bai NIE , Srinivas V. PIETAMBARAM , Gang DUAN , Jeremy D. ECTON , Suddhasattwa NAD
IPC: H01L23/498 , H01L21/48
CPC classification number: H01L23/49827 , H01L21/486 , H01L23/49894 , H01L23/15
Abstract: Embodiments disclosed herein include glass cores and methods of forming glass cores. In an embodiment, a core for an electronic package comprises a substrate with a first surface and a second surface opposite from the first surface, where the substrate comprises glass, In an embodiment, a via opening is provided through the substrate, and a diffusion layer is along the first surface, the second surface, and the via opening.
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公开(公告)号:US20240097079A1
公开(公告)日:2024-03-21
申请号:US17949857
申请日:2022-09-21
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Khaled AHMED , Srinivas V. PIETAMBARAM , Hiroki TANAKA , Paul WEST , Kristof DARMAWIKARTA , Gang DUAN , Jeremy D. ECTON , Suddhasattwa NAD
IPC: H01L33/48 , H01L25/075 , H01L33/00 , H01L33/32 , H01L33/62
CPC classification number: H01L33/486 , H01L25/0753 , H01L33/0075 , H01L33/32 , H01L33/62 , H01L2933/0066
Abstract: Integrated circuit (IC) packages are disclosed. In some embodiments, an IC package includes a glass substrate, a micro light emitting diode (LED), a semiconductor die, one or more through glass vias (TGVs) and a package substrate. The micro LED is positioned over the glass substrate. The TGVs are integrated into the glass substrate and connect the micro LED to the semiconductor die. The semiconductor die is connected to the package substrate to receive external signals when connected to a motherboard.
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24.
公开(公告)号:US20240087971A1
公开(公告)日:2024-03-14
申请号:US17943915
申请日:2022-09-13
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Gang DUAN , Srinivas V. PIETAMBARAM , Kristof DARMAWIKARTA , Jeremy D. ECTON , Suddhasattwa NAD , Hiroki TANAKA , Pooya TADAYON
IPC: H01L23/15 , H01L23/00 , H01L23/538
CPC classification number: H01L23/15 , H01L23/5381 , H01L23/5384 , H01L24/16 , H01L2224/16225
Abstract: Embodiments disclosed herein include interposers and methods of forming interposers. In an embodiment, an interposer comprises a substrate with a first surface and a second surface opposite from the first surface, where the substrate comprises glass. In an embodiment, the interposer further comprises a cavity into the first surface of the substrate, a via through the substrate below the cavity, a first pad in the cavity over the via, and a second pad on the second surface of the substrate under the via.
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公开(公告)号:US20240063100A1
公开(公告)日:2024-02-22
申请号:US17889229
申请日:2022-08-16
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Mohammad Mamunur RAHMAN , Jeremy D. ECTON , Gang DUAN , Suddhasattwa NAD , Srinivas V. PIETAMBARAM , Kemal AYGÜN , Cemil GEYIK
IPC: H01L23/498
CPC classification number: H01L23/49822 , H01L23/49838 , H01L23/49811
Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises a first layer, where the first layer comprises glass, a second layer over the first layer, where the second layer comprises glass, and a third layer over the second layer, where the third layer comprises glass. In an embodiment, a pair of traces are in the second layer, and a first gap is below the pair of traces, where the first gap is in the first layer and the second layer. In an embodiment, a second gap is above the pair of traces, where the second gap is in the second layer and the third layer.
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公开(公告)号:US20230420357A1
公开(公告)日:2023-12-28
申请号:US17848624
申请日:2022-06-24
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Suddhasattwa NAD , Srinivas V. PIETAMBARAM , Gang DUAN , Jeremy D. ECTON , Kristof DARMAWIKARTA , Sameer PAITAL
IPC: H01L23/498 , H01L21/02 , H01L21/48
CPC classification number: H01L23/49894 , H01L23/49811 , H01L23/49822 , H01L23/49838 , H01L21/0217 , H01L21/486 , H01L24/16
Abstract: Embodiments herein relate to systems, apparatuses, or processes directed to forming an LGA pad on a side of a substrate, with a layer of silicon nitride between the LGA pad and a dielectric layer of the substrate. The LGA pad may have a reduced footprint, or a reduced lateral dimension with respect to a plane of the substrate, as compared to legacy LGA pads to reduce insertion loss by reducing the resulting capacitance between the reduced LGA footprint and metal routings within the substrate. The layer of silicon nitride may provide additional mechanical support for the reduced footprint. Other embodiments may be described and/or claimed.
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27.
公开(公告)号:US20230093008A1
公开(公告)日:2023-03-23
申请号:US17482092
申请日:2021-09-22
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Aleksandar ALEKSOV , Jeremy D. ECTON
IPC: H01L23/498 , H01L21/48
Abstract: Techniques for self-assembly of regions in a dielectric layer with different electrical properties are described herein. In one example, a package includes a substrate, a layer of dielectric material over the substrate, the layer of dielectric material including a filler material. The package includes a plurality of conductive traces in the layer of dielectric material, and a filler-depleted radial region of the dielectric material around each of the plurality of conductive traces. The filler-depleted radial region has a lower volume-percentage of filler than other regions of the layer of dielectric material. In one example, the conductive traces, filler, or both include a coating to cause the filler and traces to have opposing surface chemistry.
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公开(公告)号:US20210305668A1
公开(公告)日:2021-09-30
申请号:US17344715
申请日:2021-06-10
Applicant: Intel Corporation
Inventor: Brandon C. MARIN , Jeremy D. ECTON , Aleksandar ALEKSOV , Kristof DARMAWIKARTA , Yonggang LI , Dilan SENEVIRATNE
IPC: H01P1/208 , H01L23/66 , H01P7/10 , H01P3/16 , H01L21/768 , H01P11/00 , H01L21/288 , H01P1/20
Abstract: A method of fabricating an RF filter on a semiconductor package comprises forming a first dielectric buildup film. A second dielectric buildup film is formed over the first dielectric buildup film, the second dielectric buildup film comprising a dielectric material that contains a metallization catalyst, wherein the dielectric material comprises one of an epoxy-polymer blend dielectric material, silicon dioxide and silicon nitride, and a low-k dielectric. A trench is formed in the second dielectric buildup film with laser ablation, wherein the laser ablation selectively activates sidewalls of the trench for electroless metal deposition. A metal selectively is plated to sidewalls of the trench based at least in part on the metallization catalyst and immersion in an electroless solution. A low-loss buildup film is formed over the metal that substantially fills the trench.
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公开(公告)号:US20250106983A1
公开(公告)日:2025-03-27
申请号:US18373457
申请日:2023-09-27
Applicant: Intel Corporation
Inventor: Bohan SHAN , Kyle ARRINGTON , Dingying David XU , Ziyin LIN , Timothy GOSSELIN , Elah BOZORG-GRAYELI , Aravindha ANTONISWAMY , Wei LI , Haobo CHEN , Yiqun BAI , Jose WAIMIN , Ryan CARRAZZONE , Hongxia FENG , Srinivas Venkata Ramanuja PIETAMBARAM , Gang DUAN , Bin MU , Mohit GUPTA , Jeremy D. ECTON , Brandon C. MARIN , Xiaoying GUO , Ashay DANI
Abstract: Embodiments disclosed herein include glass core package substrates with a stiffener. In an embodiment, an apparatus comprises a substrate with a first layer with a first width, where the first layer is a glass layer, a second layer under the first layer, where the second layer has a second width that is smaller than the first width, and a third layer over the first layer, where the third layer has a third width that is smaller than the first width. In an embodiment, the apparatus further comprises a metallic structure with a first portion and a second portion, where the first portion is over a top surface of the substrate and the second portion extends away from the first portion and covers at least a sidewall of the first layer.
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公开(公告)号:US20240222130A1
公开(公告)日:2024-07-04
申请号:US18091026
申请日:2022-12-29
Applicant: Intel Corporation
Inventor: Shaojiang CHEN , Jeremy D. ECTON , Oladeji FADAYOMI , Hsin-Wei WANG , Changhua LIU , Bin MU , Hongxia FENG , Brandon C. MARIN , Srinivas V. PIETAMBARAM
IPC: H01L21/306 , H01L21/321 , H01L21/48 , H01L21/768
CPC classification number: H01L21/30604 , H01L21/3212 , H01L21/486 , H01L21/7688 , H01L21/76898 , H01L21/268
Abstract: Embodiments disclosed herein include electronic packages and methods of forming electronic packages. In an embodiment, an electronic package comprises a core, where the core comprises glass. In an embodiment, a through glass via (TGV) is provided through a thickness of the core. In an embodiment, the TGV comprises a top surface that is non-planar and includes a symmetric ridge on the non-planar top surface.
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