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公开(公告)号:DE69428181D1
公开(公告)日:2001-10-11
申请号:DE69428181
申请日:1994-12-09
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: TOMURA YOSHIHIRO , BESSHO YOSHIHIRO , HAKOTANI YASUHIKO
IPC: H01L21/48 , H01L21/56 , H01L23/485 , H01L23/498 , H05K1/18 , H05K3/24 , H05K3/32 , H05K3/40
Abstract: A chip carrier according to the present invention includes: a carrier body including an upper face, a lower face, and an internal conductor; and a plurality of terminal electrodes formed on the upper face of the carrier body, the plurality of terminal electrodes electrically connecting an LSI chip to the internal conductor. A plurality of concave portions for electrically connecting a plurality of electrodes on a circuit substrate to the internal conductor are provided on the lower face of the carrier body, the concave portions being electrically connected to the internal conductor.
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公开(公告)号:AU1053499A
公开(公告)日:1999-06-07
申请号:AU1053499
申请日:1998-11-13
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: TAKEZAWA HIROAKI , TSUKAMOTO MASAHIDE , ITAGAKI MINEHIRO , BESSHO YOSHIHIRO , HATANAKA HIDEO , FUKUMURA YASUSHI , EDA KAZUO , ISHIDA TORU
IPC: H01L23/12 , H01L21/60 , H01L23/32 , H01L23/498 , H05K1/02 , H05K3/10 , H05K3/32 , H05K3/34 , H01L21/768
Abstract: A stress relaxation type electronic component which is to be mounted on a circuit board, wherein a stress relaxation mechanism member is disposed on a surface of said electronic component, said surface being on a side of a connection portion where said electronic component is to be connected to said circuit board, and said stress relaxation mechanism member is electrically conductive.
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公开(公告)号:CA2310765C
公开(公告)日:2005-07-12
申请号:CA2310765
申请日:1998-11-13
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: TAKEZAWA HIROAKI , TSUKAMOTO MASAHIDE , BESSHO YOSHIHIRO , ITAGAKI MINEHIRO , FUKUMURA YASUSHI , HATANAKA HIDEO , ISHIDA TORU , EDA KAZUO
IPC: H01L23/12 , H01L21/60 , H01L23/32 , H01L23/498 , H05K1/02 , H05K3/10 , H05K3/32 , H05K3/34 , H01L21/768
Abstract: A stress relaxation type electronic component which is to be mounted on a circuit board, wherein a stress relaxation mechanism member is disposed on a surface of said electronic component, said surface being on a side of a connection portion where said electronic component is to be connected to said circuit board, and said stress relaxation mechanism member is electrically conductive.
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公开(公告)号:DE69628767T2
公开(公告)日:2004-02-12
申请号:DE69628767
申请日:1996-01-30
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: OMOYA KAZUNORI , OOBAYASHI TAKASHI , SAKURAI WATARU , HARADA MITSURU , BESSHO YOSHIHIRO
IPC: H01L21/56 , H01L21/60 , H01L23/29 , H01L23/485
Abstract: An improved semiconductor unit package method is disclosed. This method is implemented by a semiconductor device having an electrode pad, a substrate having a terminal electrode, a bump electrode formed on the electrode pad, a conductive adhesion layer with flexibility, and an encapsulating layer formed by curing a composition the viscosity and thixotropy index of which are below 100 Pa . s and below 1.1, respectively. Such a composition essentially consists of (A) a resin binder that contains, for example, a polyepoxide, an acid anhydride, and a rheology modifier and (B) a filler. The rheology modifier is one capable of impeding interaction between a free acid contained in the acid anhydride and a polar group at the surface of the filler. An encapsulant with improved flowability is used, so that the encapsulant readily flows and spreads to fill a gap between the semiconductor device and the substrate with no air bubbles. This achieves semiconductor unit packages with high reliability and productivity.
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公开(公告)号:DE69628767D1
公开(公告)日:2003-07-24
申请号:DE69628767
申请日:1996-01-30
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: OMOYA KAZUNORI , OOBAYASHI TAKASHI , SAKURAI WATARU , HARADA MITSURU , BESSHO YOSHIHIRO
IPC: H01L21/56 , H01L21/60 , H01L23/29 , H01L23/485
Abstract: An improved semiconductor unit package method is disclosed. This method is implemented by a semiconductor device having an electrode pad, a substrate having a terminal electrode, a bump electrode formed on the electrode pad, a conductive adhesion layer with flexibility, and an encapsulating layer formed by curing a composition the viscosity and thixotropy index of which are below 100 Pa . s and below 1.1, respectively. Such a composition essentially consists of (A) a resin binder that contains, for example, a polyepoxide, an acid anhydride, and a rheology modifier and (B) a filler. The rheology modifier is one capable of impeding interaction between a free acid contained in the acid anhydride and a polar group at the surface of the filler. An encapsulant with improved flowability is used, so that the encapsulant readily flows and spreads to fill a gap between the semiconductor device and the substrate with no air bubbles. This achieves semiconductor unit packages with high reliability and productivity.
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公开(公告)号:DE69430935D1
公开(公告)日:2002-08-14
申请号:DE69430935
申请日:1994-05-10
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: ITAGAKI MINEHIRO , BESSHO YOSHIHIRO , YUHAKU SATORU , HAKOTANI YASUHIKO , MIURA KAZUHIRO , OKANO KAZUYUKI
Abstract: A conductive paste includes inorganic material powders containing conductive powders and glass powders, an organic vehicle containing an organic binder and an organic solvent, and a metal organic compound.
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公开(公告)号:DE69329357T2
公开(公告)日:2001-04-26
申请号:DE69329357
申请日:1993-04-30
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: ITAGAKI MINEHIRO , OKANO KAZUYUKI , KIMURA SUZUSHI , NAKATANI SEIICHI , BESSHO YOSHIHIRO , YUHAKU SATORU , HAKOTANI YASUHIKO , MIURA KAZUHIRO
IPC: H01L23/498 , H01L21/48
Abstract: Conductive paste for via connection (6) of a multilayer ceramic substrate (K), comprising: an inorganic component which consists of 30.0 to 70.0 % by weight of powder of conductive material and the remainder being one of glass powder having a softening point higher than a starting point of sintering of insulating material and crystalline glass ceramic powder having a glass transition point higher than the starting point of sintering of the insulating material; and an organic vehicle component which consists of at least organic binder and solvent.
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公开(公告)号:DE69426347D1
公开(公告)日:2001-01-04
申请号:DE69426347
申请日:1994-09-27
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: BESSHO YOSHIHIRO , TOMURA YOSHIHIRO
IPC: H01L21/56 , H01L23/485 , H01L21/60 , H01L21/58 , H01L23/532
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公开(公告)号:CA2310765A1
公开(公告)日:1999-05-27
申请号:CA2310765
申请日:1998-11-13
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: HATANAKA HIDEO , FUKUMURA YASUSHI , TAKEZAWA HIROAKI , ISHIDA TORU , TSUKAMOTO MASAHIDE , BESSHO YOSHIHIRO , EDA KAZUO , ITAGAKI MINEHIRO
IPC: H01L23/12 , H01L21/60 , H01L23/32 , H01L23/498 , H05K1/02 , H05K3/10 , H05K3/32 , H05K3/34 , H01L21/768
Abstract: A stress relaxation electronic part to be mounted on a wiring board and having a conductive stress relaxing mechanism body on the side where the part is connected to the wiring board.
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公开(公告)号:DE69415371D1
公开(公告)日:1999-02-04
申请号:DE69415371
申请日:1994-01-28
Applicant: MATSUSHITA ELECTRIC IND CO LTD
Inventor: TOMURA YOSHIHIRO , BESSHO YOSHIHIRO
IPC: H01L21/60
Abstract: According to the present invention, a method for forming bumps for electrically connecting electrode pads of a semiconductor device to terminal electrodes formed on a surface of a circuit board respectively, the semiconductor device being mounted facedown on the surface of the circuit board, includes: step a of forming the bumps on the electrode pad of the semiconductor device; step b of placing facedown the semiconductor device on a flat foundation so that the bumps contact with a grind sheet which is fixed to the flat foundation and which has abrasive grind; and step c of conducting ultrasonic vibration on the flat foundation while pressing the semiconductor device against the flat foundation, thereby forming a rugged side in a front end portion of each of the bumps.
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