公开(公告)号：US20150241544A1

公开(公告)日：2015-08-27

申请号：US14553153

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

公开(公告)号：US20150212186A1

公开(公告)日：2015-07-30

申请号：US14558450

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  SHOU-JEN TSAI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/02

CPC classification number: G01R35/005 ,  G01R31/025 ,  G01R31/043 ,  G01R31/2808 ,  G01R31/2851

Abstract: A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.

Abstract translation: 提供了一种校准和操作测试系统的方法，其中测试系统具有测试机，导线组，校准模块和探针模块。 该方法包括以下步骤：将测试机与导线组电连接; 电连接导线组和校准模块; 在短路测试，开路测试和阻抗测试中，将测试机器的电信号发送到校准模块进行至少一次测试，然后通过相应地根据测试结果进行补偿来校准测试系统 这些测试; 电气断开导线组和校准模块，并电连接导线组和探针模块; 将探针模块抵靠DUT; 从测试机发送电信号到探头模块，对DUT进行电气测试。

公开(公告)号：US20150168453A1

公开(公告)日：2015-06-18

申请号：US14553590

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  HAO WEI ,  YANG-HUNG CHENG ,  CHIH-HAO HO

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/28 ,  G01R1/04

CPC classification number: G01R1/06772

Abstract: A probe module, which is provided between a tester and a DUT for transmitting electrical signals therebetween, includes a signal transmitting member, a plurality of probes, a positioning member, and a signal connector. The signal transmitting member has a circuit and two grounding. The probes are electrical connected to the circuit and the groundings of the signal transmitting member. The positioning member is made of an insulating material, and provided on the probes. The signal connector is adapted to be electrically connected to the tester, wherein the signal connector has a signal transmission portion and a grounding portion; the signal transmission portion is electrically connected to the circuit of the signal transmitting member, and the grounding portion is electrically connected to the at least one grounding of the signal transmitting member.

Abstract translation: 在测试器和DUT之间设置用于在其间传输电信号的探针模块包括信号传输部件，多个探针，定位部件和信号连接器。 信号传输部件具有电路和两个接地。 探头电连接到电路和信号传输构件的基础。 定位构件由绝缘材料制成，并设置在探针上。 信号连接器适于电连接到测试器，其中信号连接器具有信号传输部分和接地部分; 信号传输部分电连接到信号传输部件的电路，并且接地部分电连接到信号传输部件的至少一个接地。

公开(公告)号：US20150168447A1

公开(公告)日：2015-06-18

申请号：US14558558

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  HAO WEI ,  SHIN-LAN KAO

IPC: G01R1/04 ,  G01R1/073 ,  G01R1/18

CPC classification number: G01R3/00 ,  G01R1/06772 ,  G01R1/18

Abstract: A probe module, which is provided between a tester and a DUT for transmitting electrical signals therebetween, includes a signal transmitting member, a plurality of probes, a positioning member, and a signal connector. The signal transmitting member has a circuit and two grounding. The probes are electrical connected to the circuit and the groundings of the signal transmitting member. The positioning member is made of an insulating material, and provided on the probes. The signal connector is adapted to be electrically connected to the tester, wherein the signal connector has a signal transmission portion and a grounding portion; the signal transmission portion is electrically connected to the circuit of the signal transmitting member, and the grounding portion is electrically connected to the at least one grounding of the signal transmitting member.

公开(公告)号：US20150015295A1

公开(公告)日：2015-01-15

申请号：US14332047

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  Jun-Liang Lai ,  Chun-Chung HUANG ,  Wei Chen ,  Hsin-Hsiang Liu ,  Kuang-Chung Chou

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07342 ,  G01R31/2889

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.

Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二第一电线分别电连接到第一电线。 电感元件分别与第一电线和测试仪电连接; 并且电容器具有分别连接到第二第一电线的相对端。

公开(公告)号：US20150015291A1

公开(公告)日：2015-01-15

申请号：US14332200

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  Jun-Liang Lai ,  Chun-Chung HUANG ,  Jing-Zhi Hung ,  Yung Nan Wu ,  CHIH-HAO HO

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06772 ,  G01R1/06727 ,  G01R1/07342

Abstract: A cantilever probe card, which is provided between a device under test (DUT) and a tester, includes a carrier board, a probe base, two probes, and a transmission device. The carrier board is provided with through holes. The probe base is provided on the carrier board, and the probes are mounted to the probe base. Each probe has a tip to contact a test pad of the DUT. The transmission device is flexible, and has signal circuits. The transmission device passes through the through hole on the carrier board, and the signal circuits connect the probes to the tester respectively.

Abstract translation: 设置在被测设备（DUT）和测试仪之间的悬臂探针卡包括载板，探针基座，两个探针和传输装置。 载板上设有通孔。 探针底座设置在载板上，探头安装在探针底座上。 每个探头都有一个提示，用于接触DUT的测试焊盘。 传输设备灵活，并具有信号电路。 传输装置通过载板上的通孔，信号电路将探头分别连接到测试仪。

公开(公告)号：US20150015290A1

公开(公告)日：2015-01-15

申请号：US14331610

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  JUN-LIANG LAI ,  WEI CHEN ,  HSIN HSIANG LIU ,  KUANG CHUNG CHOU ,  CHAN HUNG HUANG

IPC: G01R1/073

CPC classification number: G01R1/07385 ,  G01R1/07378 ,  G01R31/31716 ,  G01R31/31905

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Abstract translation: 支持环回测试并且在PCB和DUT之间提供的探针模块包括衬底，探针基座，两个探针，两个信号路径切换器和电容器。 基板具有两个第一连接电路和两个第二连接电路，其中每个第一连接电路的一端连接到PCB。 探针基座设置在基板和DUT之间，其上设置有探针，其中每个探针的端部暴露并电连接到一个第二连接电路，而另一端也暴露于与DUT接触。 每个信号路径切换器设置在探针基座上，并且分别电连接到一个第一和第二连接电路的另一端。 电容器设置在探针基座上，两端电连接到两个信号路径切换器。