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公开(公告)号：US09442134B2
公开(公告)日：2016-09-13
申请号：US14332047
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： Wei-Cheng Ku , Jun-Liang Lai , Chun-Chung Huang , Wei Chen , Hsin-Hsiang Liu , Kuang-Chung Chou
CPC classification number: G01R1/07342 , G01R31/2889
Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected to the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second electrical lines respectively.
Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二电线分别电连接到第一电线。 电感元件分别电连接到第一电线和测试仪; 并且电容器具有分别连接到第二电线的相对端。
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公开(公告)号：US20150015295A1
公开(公告)日：2015-01-15
申请号：US14332047
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , Jun-Liang Lai , Chun-Chung HUANG , Wei Chen , Hsin-Hsiang Liu , Kuang-Chung Chou
CPC classification number: G01R1/07342 , G01R31/2889
Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.
Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二第一电线分别电连接到第一电线。 电感元件分别与第一电线和测试仪电连接; 并且电容器具有分别连接到第二第一电线的相对端。
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