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公开(公告)号:DE60033882D1
公开(公告)日:2007-04-26
申请号:DE60033882
申请日:2000-04-06
Applicant: ST MICROELECTRONICS SA
Inventor: WUIDART LUC , BARDOUILLET MICHEL , ENGUENT JEAN-PIERRE
Abstract: The terminal (1) uses inductive coupling to read from and write to a transponder, and includes a resonant circuit (Li,Ci) tuned to receive an AC HF excitation voltage. The resonant frequency may be altered so as to detune the LC in the event that a transponder is very close to the terminal. A capacitor (24) may be controlled by a control circuit (21) and with impedance (Li) to detect a gap of phase in relation to the signal of REF reference and to modify the capacity Ci of the capacitor (24). An Independent claim is included for a contactless system of data transmission.
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公开(公告)号:DE69931423T2
公开(公告)日:2006-11-16
申请号:DE69931423
申请日:1999-05-05
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE , LEGOU THIERRY
Abstract: The BPSK coder circuit (10) includes a first circuit (20) which produces, from a carrier signal (CK1) and from a binary signal to code (Sin), a binary output signal (Sout) having synchronous phase jumps (PS1,PS2) which represent a value change (Cva, Cvb) of the signal to code. The circuit includes a system (30) which furnishes the first circuit (20) with a sampling signal (CK2). This system includes a delay circuit (11,12) which produces a shifted carrier signal (SCK1) having a shift ( DELTA t), relative to the carrier signal (CK1), and less than the half period of the carrier signal. There are also logic circuits (13,14) for combining the carrier signal (CK1) and the shifted carrier signal (SCK1), to deliver a binary sampling signal (CK2) having at least two ascending or descending fronts for each period of the carrier signal (CK1).
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公开(公告)号:DE60040113D1
公开(公告)日:2008-10-16
申请号:DE60040113
申请日:2000-04-06
Applicant: ST MICROELECTRONICS SA
Inventor: WUIDART LUC , BARDOUILLET MICHEL , ENGUENT JEAN-PIERRE
Abstract: The coupling between transponder and terminal is reduced by altering the resonant frequency of either the terminal or transponder coupling circuits when the two are in close proximity. When the coupling is reduced, the data rate for the communication between terminal and transponder is automatically increased, which can be achieved because the coupling is effectively a transformer coupling.
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公开(公告)号:DE602005003236T2
公开(公告)日:2008-08-21
申请号:DE602005003236
申请日:2005-06-03
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE
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公开(公告)号:DE60033882T2
公开(公告)日:2008-01-17
申请号:DE60033882
申请日:2000-04-06
Applicant: ST MICROELECTRONICS SA
Inventor: WUIDART LUC , BARDOUILLET MICHEL , ENGUENT JEAN-PIERRE
Abstract: The terminal (1) uses inductive coupling to read from and write to a transponder, and includes a resonant circuit (Li,Ci) tuned to receive an AC HF excitation voltage. The resonant frequency may be altered so as to detune the LC in the event that a transponder is very close to the terminal. A capacitor (24) may be controlled by a control circuit (21) and with impedance (Li) to detect a gap of phase in relation to the signal of REF reference and to modify the capacity Ci of the capacitor (24). An Independent claim is included for a contactless system of data transmission.
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公开(公告)号:DE69931423D1
公开(公告)日:2006-06-29
申请号:DE69931423
申请日:1999-05-05
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE , LEGOU THIERRY
Abstract: The BPSK coder circuit (10) includes a first circuit (20) which produces, from a carrier signal (CK1) and from a binary signal to code (Sin), a binary output signal (Sout) having synchronous phase jumps (PS1,PS2) which represent a value change (Cva, Cvb) of the signal to code. The circuit includes a system (30) which furnishes the first circuit (20) with a sampling signal (CK2). This system includes a delay circuit (11,12) which produces a shifted carrier signal (SCK1) having a shift ( DELTA t), relative to the carrier signal (CK1), and less than the half period of the carrier signal. There are also logic circuits (13,14) for combining the carrier signal (CK1) and the shifted carrier signal (SCK1), to deliver a binary sampling signal (CK2) having at least two ascending or descending fronts for each period of the carrier signal (CK1).
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公开(公告)号:DE69823776T2
公开(公告)日:2005-04-28
申请号:DE69823776
申请日:1998-11-17
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE
IPC: H01Q1/38 , G06K7/08 , G06K19/077 , H01Q7/00
Abstract: Both antenna coil and screen are fitted to opposite sides of an insulating sheet. The coil (30) includes a flat winding (31) of a set shape. A conducting screen (35), of a similar shape to the winding, is arranged with respect to it. The screen has a cut zone (36) so that the screen forms an open loop circuit. Both the screen and the winding may be of rectangular or annular shape. The winding is contained on one face of an insulating sheet and the screen is on the other face of the sheet within its thickness.
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公开(公告)号:DE69801800T2
公开(公告)日:2002-06-13
申请号:DE69801800
申请日:1998-11-17
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE
IPC: G01R31/04 , G01R31/315
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公开(公告)号:DE69805039D1
公开(公告)日:2002-05-29
申请号:DE69805039
申请日:1998-11-17
Applicant: ST MICROELECTRONICS SA
Inventor: ENGUENT JEAN-PIERRE
IPC: G01R31/28 , G01R31/315 , G01R31/316
Abstract: The input capacitance is connected to one of the test inductances (Lf, Lf2, Lf3, Lf4), chosen to form together a resonance test circuit (45,47), having a resonance frequency sensitive to the proper frequency of the resonance receiver circuit (10). Method of testing an integrated circuit (1) including an input capacity (Cin) provided so as to form with an antenna coil (11) a resonant receiving circuit (10) with its own ore-determined frequency (Fp). The method is applicable to a an integrated circuit before its connection to an antenna coil. The method has the following stages: - connect the input capacity (Cin) of the integrated circuit to a test inductance (Lt) chosen so as to form with the input capacitance (Cin) a resonant test circuit (45) having a frequency sensibly equal to the frequency (Fp) of the resonant receiver, and - excite the resonant test circuit (45) by means of an alternating signal (It), through a transformer (41). The transformer (41) has on its secondary winding (40) an inductive loss forming all or part of the test inductance (Lt). The transformer (41) is of the toroidal type whose primary (42) and secondary (40) windings do not overlap.
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