公开(公告)号：US20160069815A1

公开(公告)日：2016-03-10

申请号：US14935081

申请日：2015-11-06

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  David M. Tung ,  Stephen Keith McLaurin

IPC: G01N21/88 ,  G01N21/95 ,  G01N21/47

CPC classification number: G01N21/8806 ,  G01N21/4738 ,  G01N21/95

Abstract: Provided herein is an apparatus including a photon emitter configured to emit photons onto a surface of an article. In addition, the apparatus includes a photon detector array configured to receive photons scattered from surface features and magnetic features of the article. The photon detector array is configured to provide information for mapping the magnetic features.

Abstract translation: 本文提供的装置包括被配置为将光子发射到制品的表面上的光子发射器。 此外，该装置包括光子检测器阵列，其构造成接收从物体的表面特征和磁性特征散射的光子。 光子检测器阵列被配置为提供用于映射磁性特征的信息。

公开(公告)号：US20160069814A1

公开(公告)日：2016-03-10

申请号：US14927291

申请日：2015-10-29

Applicant: Seagate Technology LLC

Inventor： David M. Tung ,  Joachim W. Ahner

IPC: G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/88 ,  G01N21/9503 ,  G01N21/9506 ,  G01N2201/061

Abstract: Provided herein is an apparatus, including a photon emitter and a photon detector array. The photon emitter is configured to emit photons onto an entire surface edge of an article. The photon detector array is configured to receive scattered photons from the entire surface edge of the article, and includes a number of photon detectors. The scattered photons are photons emitted from the photon emitter that are scattered from features of the surface edge of the article.

Abstract translation: 本文提供了一种包括光子发射器和光子检测器阵列的装置。 光子发射器被配置为将光子发射到物品的整个表面边缘上。 光子检测器阵列被配置为从物品的整个表面边缘接收散射的光子，并且包括多个光子检测器。 散射的光子是从光子发射器发射的从物体的表面边缘的特征散射的光子。

公开(公告)号：US20160069799A1

公开(公告)日：2016-03-10

申请号：US14935097

申请日：2015-11-06

Applicant: Seagate Technology LLC

Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

IPC: G01N21/47 ,  G01N21/88

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

Abstract: Provided herein is an apparatus including a photon emitter configured for reflecting photons from a surface of an article onto a first reflective surface. In addition, a second reflective surface is configured for reflecting photons from the surface of the article back onto the surface of the article. The apparatus also includes a detector configured to provide information corresponding to photons scattered from features of the article.

Abstract translation: 本文提供了一种包括光子发射器的设备，其被配置用于将光子从物体的表面反射到第一反射表面上。 此外，第二反射表面被配置为将来自物品表面的光子反射回到物品的表面上。 该装置还包括检测器，其被配置为提供对应于从物品的特征分散的光子的信息。

公开(公告)号：US09274064B2

公开(公告)日：2016-03-01

申请号：US14194417

申请日：2014-02-28

Applicant: SEAGATE TECHNOLOGY LLC

Inventor： Joachim Walter Ahner ,  David M. Tung

IPC: G01N21/00 ,  G01N21/95

CPC classification number: G01N21/95 ,  G01N23/20

Abstract: Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature.

Abstract translation: 本文提供了一种装置，其包括用于基于对应于从物品的表面特征散射的光子的光子检测器信号和表面特征管理器来生成物品的表面特征的位置的映射的映射装置。 表面管理器被配置为至少部分地基于表面特征位置的图来定位物品的表面特征的预定表面特征，将第一功率的光子照射到预定表面特征的位置上以分析 预定的表面特征，并且将第二功率的光子照射到预定表面特征的位置上以去除预定的表面特征。

公开(公告)号：US20140354981A1

公开(公告)日：2014-12-04

申请号：US14194417

申请日：2014-02-28

Applicant: SEAGATE TECHNOLOGY LLC

Inventor： Joachim Walter Ahner ,  David M. Tung

IPC: G01N21/47

CPC classification number: G01N21/95 ,  G01N23/20

Abstract: Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature.

Abstract translation: 本文提供了一种装置，其包括用于基于对应于从物品的表面特征散射的光子的光子检测器信号和表面特征管理器来生成物品的表面特征的位置的映射的映射装置。 表面管理器被配置为至少部分地基于表面特征位置的图来定位物品的表面特征的预定表面特征，将第一功率的光子照射到预定表面特征的位置上以分析 预定的表面特征，并且将第二功率的光子照射到预定表面特征的位置上以去除预定的表面特征。

公开(公告)号：US20140104603A1

公开(公告)日：2014-04-17

申请号：US14053493

申请日：2013-10-14

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Florin Zavaliche ,  David M. Tung ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  Stephen Keith McLaurin

IPC: G01N21/95

CPC classification number: G01N21/95 ,  G01B11/24 ,  G01N21/47

Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.

Abstract translation: 公开了一种用于检测表面特征的装置。 该装置可以包括被配置为容纳光并且进一步被配置为将光从光源透射到物品的表面的多个股线。 该装置还可以包括检测器，其被配置为经由多个股线接收从物品的表面反射的光，其中该检测器还被配置为检测与该物品相关联的特征。

公开(公告)号：US10384306B1

公开(公告)日：2019-08-20

申请号：US15171697

申请日：2016-06-02

Applicant: Seagate Technology LLC

Inventor： Ian J. Beresford ,  Joachim Walter Ahner ,  David M. Tung ,  Weilu H. Xu ,  Kuo-Hsing Hwang

IPC: B23K26/08 ,  B23K26/06 ,  B29D17/00 ,  C03B33/10 ,  C03C23/00 ,  B23K26/38 ,  B23K26/402 ,  B29K105/00 ,  B23K103/00

Abstract: Provided herein is an apparatus that includes a first and second laser source. The first and second laser sources are each operable to cut a substrate and are each independently movable with respect to one another. Further, the first and second laser sources are included within a multitude of laser sources that are arranged in a circular array.

公开(公告)号：US10234400B2

公开(公告)日：2019-03-19

申请号：US14053493

申请日：2013-10-14

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Florin Zavaliche ,  David M. Tung ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  Stephen Keith McLaurin

IPC: G01N21/95 ,  G01B11/24 ,  G01N21/47

Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.

公开(公告)号：US09297751B2

公开(公告)日：2016-03-29

申请号：US14032192

申请日：2013-09-19

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  David M. Tung ,  Florin Zavaliche ,  Stephen Keith McLaurin

IPC: G01N21/00 ,  G01N21/47 ,  G01N21/95

CPC classification number: G01N21/4738 ,  G01N21/95 ,  G01N2021/4764 ,  G01N2021/4792 ,  G01N2201/0635 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

公开(公告)号：US20160077009A1

公开(公告)日：2016-03-17

申请号：US14834418

申请日：2015-08-24

Applicant: Seagate Technology LLC

Inventor： Daniel J. Gargas ,  David M. Tung ,  Travis W. Grodt ,  Joachim W. Ahner

IPC: G01N21/65 ,  G01N21/95 ,  G01N21/84

CPC classification number: G01N21/65 ,  G01N21/8422 ,  G01N21/95 ,  G01N2201/0833

Abstract: Provided herein is an apparatus, including an excitation arm including excitation optics; a collection arm including collection optics, wherein the excitation arm and the collection arm are geometrically off-axis from one another for independent control of the excitation optics or the collection optics; and a full-surface spectroscopic analyzer to analyze a thin-film over an article from Raman-scattered light collected by the collection optics.

Abstract translation: 本文提供的装置包括包括激发光学元件的激励臂; 收集臂，其包括收集光学元件，其中所述激励臂和所述收集臂在几何上彼此偏离轴，用于独立控制所述激发光学器件或所述收集光学器件; 和全表面光谱分析仪，用于分析由收集光学器件收集的拉曼散射光的物品上的薄膜。