Abstract:
Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.
Abstract:
Provided herein is an apparatus, including a reflective surface configured to reflect photons onto a surface of an article, a stage configured to support the article, and an assembly. In some embodiments, the assembly configured to radiate photons through the article to the reflective surface. The assembly is further configured to image the article with irradiance of the photons.
Abstract:
A stack includes a heatsink layer, a magnetic recording layer disposed over the heatsink layer, and a Si-based overcoat layer disposed over the magnetic recording layer. The Si-based overcoat layer is substantially devoid of carbon.
Abstract:
Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
Abstract:
An apparatus is disclosed. The apparatus includes a storage layer, a thermal exchange control layer disposed over the storage layer, and a write layer disposed over the thermal exchange control layer. A Curie temperature of the thermal exchange control layer is lower than a Curie temperature of the storage layer. The Curie temperature of the thermal exchange control layer is lower than a Curie temperature of the write layer.
Abstract:
A stack includes a heatsink layer, a magnetic recording layer disposed over the heatsink layer, and a Si-based overcoat layer disposed over the magnetic recording layer. The Si-based overcoat layer is substantially devoid of carbon.
Abstract:
Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract:
Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
Abstract:
Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Abstract:
Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.