CORRECTING METHOD
    21.
    发明专利

    公开(公告)号:JPH11243474A

    公开(公告)日:1999-09-07

    申请号:JP29089498

    申请日:1998-10-13

    Applicant: XEROX CORP

    Abstract: PROBLEM TO BE SOLVED: To provide a method for correcting the spatial relation of linear light source and linear sensor array. SOLUTION: Between a linear light source 700 and a linear sensor array 712, a correction tool 800 provided with a slot having two edges is inserted at the first height from the sensor array. The light segment of the linear light source is turned on, the respective edge positions generated by crossing an optical path between the turned-on light segment and the sensor array 71 by the slot of the correction tool are measured, and based on these positions, the respective positions of the edges at the slot of the correction tool are calculated. Next, the correction tool is moved to the second height, and a processing similar to that of the first height is performed. Based on the edge positions calculated at these two heights, the center of the lighted segment is calculated, and based on this center, the edge positions of the slot are determined by the sensor positions.

    EDGE DETERMINING METHOD FOR COPY SUBSTRATE

    公开(公告)号:JPH11194547A

    公开(公告)日:1999-07-21

    申请号:JP29089598

    申请日:1998-10-13

    Applicant: XEROX CORP

    Abstract: PROBLEM TO BE SOLVED: To provide an electronically edge-determining method for a copy substrate to be printed. SOLUTION: A copy substrate 710 is inserted between a linear light source array 700 and a linear sensor array 712, and a light segment 701 of the linear light source array 700 is lit on. An edge position Xco of a shadow generated by crossing a light path between the two arrays with the copy substrate 710 is measured, and an edge position Xp of the copy substrate 710 is calculated based on the position Xco. The second light segment of the linear light source in an opposite side of an estimated edge position of the copy substrate 710 is lit on, and the second edge position of a shadow generated by crossing a light path between the second light segment and the linear sensor array 712 with the copy substrate 710 is measured. The edge position of the copy substrate 710 is calculated using both the first measurement and the second measurement.

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