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公开(公告)号:WO2006036717A3
公开(公告)日:2007-01-25
申请号:PCT/US2005033909
申请日:2005-09-20
Applicant: CORNING INC , DUNN THOMAS J , FARMIGA NESTOR O , KULAWIEC ANDREW W , MARRON JOSEPH C
Inventor: DUNN THOMAS J , FARMIGA NESTOR O , KULAWIEC ANDREW W , MARRON JOSEPH C
IPC: H01S3/098
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.
Abstract translation: 与分立光束可调谐激光器相结合使用的模式监测系统提供可用于调整激光器或与使用激光器相关的其他处理的光学反馈。 例如,可以监视用于频移干涉仪的频率可调谐源的输出,以支持获取或处理更准确的干扰数据。 用于取得测量光束的不同部分所行进的光程长差的期望测量的第一干涉仪可以连接到用于测量测量光束本身的第二干涉仪。 可以根据本发明解释附加的干扰数据,以提供射束频率和强度的测量。
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公开(公告)号:EP1794852B1
公开(公告)日:2018-09-05
申请号:EP05798916.2
申请日:2005-09-20
Applicant: Corning Incorporated
Inventor: DUNN, Thomas J , FARMIGA, Nestor O , KULAWIEC, Andrew W , MARRON, Joseph C
IPC: G01B9/02 , H01S5/00 , H01S5/0687 , H01S5/14 , G01J9/02
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.
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公开(公告)号:EP1794852A2
公开(公告)日:2007-06-13
申请号:EP05798916.2
申请日:2005-09-20
Applicant: Corning Incorporated
Inventor: DUNN, Thomas J , FARMIGA, Nestor O , KULAWIEC, Andrew W , MARRON, Joseph C
IPC: H01S3/098
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.
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公开(公告)号:EP1803004B1
公开(公告)日:2015-02-25
申请号:EP05784123.1
申请日:2005-09-02
Applicant: Opsens Inc.
Inventor: DUPLAIN, Gaétan
CPC classification number: G01B9/02023 , G01B9/02028 , G01B9/02032 , G01B9/02065 , G01B9/0209 , G01B2290/70 , G01D5/266 , G01J2009/0292 , G01K11/00 , G01K11/3206
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公开(公告)号:EP1794852A4
公开(公告)日:2010-05-05
申请号:EP05798916
申请日:2005-09-20
Applicant: CORNING INC
Inventor: DUNN THOMAS J , FARMIGA NESTOR O , KULAWIEC ANDREW W , MARRON JOSEPH C
IPC: H01S3/098
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.
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公开(公告)号:JP5264172B2
公开(公告)日:2013-08-14
申请号:JP2007531550
申请日:2005-09-02
Applicant: オプセンス インコーポレイテッド
Inventor: ガエタン デュプレン
CPC classification number: G01B9/02023 , G01B9/02028 , G01B9/02032 , G01B9/02065 , G01B9/0209 , G01B2290/70 , G01D5/266 , G01J2009/0292 , G01K11/00 , G01K11/3206
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公开(公告)号:JP2008513804A
公开(公告)日:2008-05-01
申请号:JP2007533614
申请日:2005-09-20
Applicant: コーニング インコーポレイテッド
Inventor: ダブリュ クラウィエック,アンドリュー , ジェイ ダン,トーマス , オー ファーミガ,ネスター , シー マロン,ジョーゼフ
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: 離散ビーム周波数可変レーザと関連して用いられるモードモニタリング装置は、レーザの調節のためまたはレーザの使用にともなうその他の処理のために用いることができる、光フィードバックを提供する。 例えば、一層正確な干渉データの収集または処理をサポートするために、周波数偏移干渉計のための周波数可変源の出力をモニタすることができる。 測定ビームの相異なる部分が進行する光路長差の所望の測定値をとるための第1の干渉計を測定ビーム自体の測定値をとるための第2の干渉計と連結することができる。 追加の干渉データをビームの周波数及び強度の尺度を与えるために発明にしたがって解釈することができる。
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公开(公告)号:WO2006080923A1
公开(公告)日:2006-08-03
申请号:PCT/US2005/002923
申请日:2005-01-27
Applicant: 4D TECHNOLOGY CORPORATION , MILLERD, James, E. , WYANT, James, C.
Inventor: MILLERD, James, E. , WYANT, James, C.
IPC: G01B9/02
CPC classification number: G01J9/02 , G01B9/02032 , G01B9/02057 , G01B9/02065 , G01B9/0209 , G01B2290/45 , G01B2290/70 , G01J2009/0292
Abstract: The tilted relationship between the reference and test mirrors (24,26) of a Fizeau interferometer is used to spatially separate the reflections (R,T) from the two surfaces. The separate beams (R, T) are filtered through a spatial polarization element (32) that provides different states of polarization to the beams. The beams (R,T) are subsequently recombined to form a substantially collinear beam that is processed using a spatial-phase-shift interferometer (44) that permits quantitative phase measurement in a single video frame. Alternatively, two beams (104,106) with orthogonal polarization are injected into the Fizeau cavity (20) at different angles, such that after reflection from the reference and test optics (24,26) they are substantially collinear. Unwanted reflections are blocked at the focal plane through the use of a circular aperture (112). Short coherence length light and a delay line (84) may be used to mitigate stray reflections, reduce measurement integration times, and implement temporal phase averaging.
Abstract translation: 使用Fizeau干涉仪的参考和测试镜(24,26)之间的倾斜关系在空间上分离两个表面的反射(R,T)。 单独的光束(R,T)通过空间偏振元件(32)被滤波,该空间偏振元件(32)向光束提供不同的偏振状态。 光束(R,T)随后重新组合以形成使用允许在单个视频帧中进行定量相位测量的空间相移干涉仪(44)来处理的基本上共线的光束。 或者,具有正交偏振的两个光束(104,106)以不同的角度注入到Fizeau腔(20)中,使得在来自参考和测试光学器件(24,26)的反射之后,它们基本上共线。 不需要的反射通过使用圆形孔径(112)在焦平面处被阻挡。 短相干长度光和延迟线(84)可用于减轻杂散反射,减少测量积分时间,并实现时间相位平均。
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公开(公告)号:WO2006036717A2
公开(公告)日:2006-04-06
申请号:PCT/US2005/033909
申请日:2005-09-20
Applicant: CORNING INCORPORATED , DUNN, Thomas J , FARMIGA, Nestor O , KULAWIEC, Andrew W , MARRON, Joseph C
Inventor: DUNN, Thomas J , FARMIGA, Nestor O , KULAWIEC, Andrew W , MARRON, Joseph C
IPC: H01S3/10
CPC classification number: H01S5/0687 , G01B9/02004 , G01B9/02057 , G01B9/02083 , G01B2290/60 , G01J9/02 , G01J2009/0292 , H01S5/0014 , H01S5/141 , H01S5/142
Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.
Abstract translation: 与分立光束可调谐激光器相结合使用的模式监测系统提供可用于调整激光器或与使用激光器相关的其他处理的光学反馈。 例如,可以监视用于频移干涉仪的频率可调谐源的输出,以支持获取或处理更准确的干扰数据。 用于取得测量光束的不同部分所行进的光程长差的期望测量的第一干涉仪可以连接到用于测量测量光束本身的第二干涉仪。 可以根据本发明解释附加的干扰数据,以提供射束频率和强度的测量。
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公开(公告)号:WO2006032128A1
公开(公告)日:2006-03-30
申请号:PCT/CA2005/001349
申请日:2005-09-02
Applicant: OPSENS INC , DUPLAIN, Gaétan
Inventor: DUPLAIN, Gaétan
IPC: G02B5/30
CPC classification number: G01B9/02023 , G01B9/02028 , G01B9/02032 , G01B9/02065 , G01B9/0209 , G01B2290/70 , G01D5/266 , G01J2009/0292 , G01K11/00 , G01K11/3206
Abstract: The invention provides a method and a system for measuring a physical quantity by means of a tandem interferometer optical sensor system based on low-coherence interferometry. The system comprises a light system, a sensing interferometer and a polarization readout interferometer. The invention provides a polarization interferometer comprising a single birefringent wedge. The invention also provides for a dispersion-compensated optical sensor system. The invention also provides an interferometer sensitive to temperature that comprises a trajectory in a L i B 3 O 5 crystal with an x-cut orientation.
Abstract translation: 本发明提供一种通过基于低相干干涉测量的串联干涉仪光学传感器系统来测量物理量的方法和系统。 该系统包括光系统,感测干涉仪和偏振读出干涉仪。 本发明提供一种包括单个双折射楔的偏振干涉仪。 本发明还提供一种色散补偿光学传感器系统。 本发明还提供一种对温度敏感的干涉仪,其包括L
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