公开(公告)号：WO2006071569A3

公开(公告)日：2007-02-08

申请号：PCT/US2005045617

申请日：2005-12-14

Applicant: CORNING INC ,  KULAWIEC ANDREW W ,  TRONOLONE MARK J ,  MARRON JOSEPH C ,  DUNN THOMAS J

Inventor： KULAWIEC ANDREW W ,  TRONOLONE MARK J ,  MARRON JOSEPH C ,  DUNN THOMAS J

IPC: G01B11/02

CPC classification number: G01B11/2441 ,  G01B9/02021 ,  G01B9/02027 ,  G01B9/02028 ,  G01B11/06 ,  G01B11/306 ,  G01B2290/45

Abstract: Two common-path interferometers share a measuring cavity for measuring opposite sides of opaque test parts. Interference patterns are formed between one side of the test parts and the reference surface of a first of the two interferometers, between the other side of the test parts and the reference surface of a second of the two interferometers, and between the first and second reference surfaces. The latter measurement between the reference surfaces of the two interferometers enables the measurements of the opposite sides of the test parts to be related to each other.

Abstract translation: 两个共通干涉仪共用测量腔，用于测量不透明测试部件的相对侧面。 在测试部件的一侧和两个干涉仪中的第一个干涉仪的参考表面之间，在测试部件的另一侧和两个干涉仪中的第二个干涉仪的参考表面之间以及在第一和第二参考点之间形成干涉图案 表面。 在两个干涉仪的参考表面之间的后一测量使得测试部件的相对侧的测量彼此相关。

公开(公告)号：WO2006036717A3

公开(公告)日：2007-01-25

申请号：PCT/US2005033909

申请日：2005-09-20

Applicant: CORNING INC ,  DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

Inventor： DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

IPC: H01S3/098

CPC classification number: H01S5/0687 ,  G01B9/02004 ,  G01B9/02057 ,  G01B9/02083 ,  G01B2290/60 ,  G01J9/02 ,  G01J2009/0292 ,  H01S5/0014 ,  H01S5/141 ,  H01S5/142

Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.

Abstract translation: 与分立光束可调谐激光器相结合使用的模式监测系统提供可用于调整激光器或与使用激光器相关的其他处理的光学反馈。 例如，可以监视用于频移干涉仪的频率可调谐源的输出，以支持获取或处理更准确的干扰数据。 用于取得测量光束的不同部分所行进的光程长差的期望测量的第一干涉仪可以连接到用于测量测量光束本身的第二干涉仪。 可以根据本发明解释附加的干扰数据，以提供射束频率和强度的测量。

公开(公告)号：WO2006036576A2

公开(公告)日：2006-04-06

申请号：PCT/US2005032989

申请日：2005-09-15

Applicant: CORNING INC ,  DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

Inventor： DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

IPC: H01S3/10

CPC classification number: H01S5/141 ,  H01S5/0687 ,  H01S5/142

Abstract: A frequency tuning system for a laser includes mode-matched lasing and feedback cavities. A reflective facet of the feedback cavity is adjustable for retroreflecting different feedback frequencies to the lasing cavity without changing a fixed length of the feedback cavity. A selection among resonant frequencies of the feedback cavity provides for tuning the laser through discrete resonant frequencies of the lasing cavity.

Abstract translation: 用于激光器的频率调谐系统包括模式匹配激光和反馈腔。 反馈腔的反射面是可调的，用于向激光腔反射不同的反馈频率而不改变反馈腔的固定长度。 反馈腔的谐振频率中的选择提供了通过激光谐振腔的离散谐振频率来调谐激光器。

公开(公告)号：DE102011076458A1

公开(公告)日：2011-12-01

申请号：DE102011076458

申请日：2011-05-25

Applicant: CORNING INC

Inventor： DUNN THOMAS J ,  LEE CHRISTOPHER ,  TRONOLONE MARK J

IPC: G01B9/02

Abstract: Ein Frequenzschiebe-Interferometer wird angeordnet, um ein optisches Profil eines Testobjektes mit einer durchstimmbaren Lichtquelle zu messen. Eine Folge von Interferenzbildern des Testobjektes wird zusammen mit einem Messwert der Strahlfrequenzen erfasst, bei welchen die Interferenzbilder gebildet sind. Eine begrenzte Anzahl von erfassten Interferenzbildern des Testobjektes wird ausgewählt, so dass die überwachten Strahlfrequenzen mit einem vorher festgelegten Strahlfrequenz-Abstandsmuster ungefähr übereinstimmen. Eine weitere Bearbeitung folgt, basierend auf den ausgewählten Interferenzbildern.

公开(公告)号：DE112005002283T5

公开(公告)日：2007-08-23

申请号：DE112005002283

申请日：2005-09-15

Applicant: CORNING INC

Inventor： DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

IPC: H01S3/10

公开(公告)号：EP1831639A4

公开(公告)日：2009-05-27

申请号：EP05854356

申请日：2005-12-14

Applicant: CORNING INC

Inventor： KULAWIEC ANDREW W ,  TRONOLONE MARK J ,  MARRON JOSEPH C ,  DUNN THOMAS J

IPC: G01B11/02 ,  G01B11/24

CPC classification number: G01B11/2441 ,  G01B9/02021 ,  G01B9/02027 ,  G01B9/02028 ,  G01B11/06 ,  G01B11/306 ,  G01B2290/45

Abstract: Two common-path interferometers share a measuring cavity for measuring opposite sides of opaque test parts. Interference patterns are formed between one side of the test parts and the reference surface of a first of the two interferometers, between the other side of the test parts and the reference surface of a second of the two interferometers, and between the first and second reference surfaces. The latter measurement between the reference surfaces of the two interferometers enables the measurements of the opposite sides of the test parts to be related to each other.

公开(公告)号：EP1794852A4

公开(公告)日：2010-05-05

申请号：EP05798916

申请日：2005-09-20

Applicant: CORNING INC

Inventor： DUNN THOMAS J ,  FARMIGA NESTOR O ,  KULAWIEC ANDREW W ,  MARRON JOSEPH C

IPC: H01S3/098

CPC classification number: H01S5/0687 ,  G01B9/02004 ,  G01B9/02057 ,  G01B9/02083 ,  G01B2290/60 ,  G01J9/02 ,  G01J2009/0292 ,  H01S5/0014 ,  H01S5/141 ,  H01S5/142

Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.