测量非金属掺杂物的方法和装置

    公开(公告)号:CN100575925C

    公开(公告)日:2009-12-30

    申请号:CN200480016204.9

    申请日:2004-06-14

    Abstract: 一种非金属掺杂物测量装置,包括:在其上放置着断裂表面(h)朝上的样品(S)的工作台(T);照明装置(7),其从多个方向用光(L)照射断裂表面(h);用来检测断裂表面(h)的图像的图像检测装置;用来将所检测图像处理成连续色调图像的连续色调图像处理装置;和用来通过连续色调图像处理结果与阈值之间的比较将连续色调图像二进制化的二进制化装置。由于从多个方向照射断裂表面(h),通过检测断裂表面(h)的图像所获得的图像没有由断裂表面(h)上的微小不规则性导致的阴影或光学不规则性。因而,所述图像经过连续色调图像处理和二进制化后,样品(S)中的非金属掺杂物就能被从断裂表面(h)中精确地检测到。

    Gehäuse für eine UV-Lichtquelle
    22.
    发明公开
    Gehäuse für eine UV-Lichtquelle 审中-公开
    一种用于UV光源壳体

    公开(公告)号:EP2808672A1

    公开(公告)日:2014-12-03

    申请号:EP14176570.1

    申请日:2010-02-26

    Applicant: Binder + Co AG

    Abstract: Gezeigt wird ein Gehäuse (1) für eine UV-Lichtquelle zur Verwendung in einem Verfahren zum Detektieren von bleihältigen Glasstücken in einem einschichtigen Materialstrom von Objekten aus vorwiegend Altglas.
    Um unerwünschte Wellenlängen, insbesondere jene des sichtbaren Lichts, aus dem Spektrum der UV-Lichtquelle zu eliminieren, wird vorgesehen, dass die UV-Lichtquelle (3) so in das Gehäuse mit zumindest einem Spiegelfilter (16) eingebaut werden kann, dass das Licht aus der UV-Lichtquelle (3) über zumindest einen Spiegelfilter (16) umgelenkt und gefiltert wird, nämlich durch zwei normal zueinander angeordnete Spiegelfilter (16) um 180° umgelenkt wird.

    Abstract translation: 示出了用于UV光源用于从主要废玻璃检测对象的单层流含铅玻璃件的方法的壳体(1)。 不需要的波长,特别是可见光的,从UV光源的光谱消除被提供,该UV光源(3)可以被这样安装在壳体中与至少一个反射镜滤波器(16),即从光 UV光源(3)通过至少一个反射镜滤波器(16)偏转并过滤,即通过两个反射镜设置相互垂直滤波器(16)180°偏转。

    Impurity measuring method and device
    27.
    发明申请
    Impurity measuring method and device 审中-公开
    杂质测量方法及装置

    公开(公告)号:US20060228017A1

    公开(公告)日:2006-10-12

    申请号:US10560270

    申请日:2004-06-14

    Abstract: An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.

    Abstract translation: 一种杂质测量装置,包括:台面(T),其表面(S)的断面(h)面朝上放置在所述台面(T)上;照射装置(7),用光(L)照射断裂面 从多个方向观察用于感测用光(L)照射的断裂面(h)的图像的图像感测装置,用于将感测图像处理成连续色调图像的连续色调图像处理装置,以及二值化 用于通过连续色调图像处理的结果与阈值之间的比较对连续色彩图像进行二值化的装置。 当从多个方向对光(L)照射断裂面(h)时,通过感测断裂面(h)的图像而获得的图像没有由断裂面上的微细凹凸引起的阴影或光学不规则 (H)。 因此,通过对图像进行连续色调图像处理和二值化处理,可以从断裂面(h)精确地检测样品(S)中的杂质。

    Machine vision light source with improved optical efficiency
    28.
    发明授权
    Machine vision light source with improved optical efficiency 失效
    机器视觉光源,提高光学效率

    公开(公告)号:US5822053A

    公开(公告)日:1998-10-13

    申请号:US796876

    申请日:1997-02-07

    CPC classification number: G01N21/8806 G01N2201/06153 Y10S362/80

    Abstract: The present invention relates to an LED light source for a machine vision system. The light source includes a plurality of LEDs each arranged in a base plate in predetermined manner during manufacturing. Each LED is then securely mounted to the base plate with an ultravioletly curable adhesive to remain pointed in the predetermined manner. The light source also includes an optically efficient non-lambertain diffuser which receives light from each of the LEDs and breaks the light up to provide a uniform light field to illuminate an object under inspection.

    Abstract translation: 本发明涉及一种用于机器视觉系统的LED光源。 光源包括在制造期间以预定方式布置在基板中的多个LED。 然后将每个LED用可紫外固化的粘合剂牢固地安装到基板上,以预定的方式保持指向。 光源还包括光学有效的非层状扩散器,其接收来自每个LED的光并且将光打破以提供均匀的光场以照亮被检查物体。

    Inspection lighting system
    29.
    发明授权
    Inspection lighting system 失效
    检验照明系统

    公开(公告)号:US4972093A

    公开(公告)日:1990-11-20

    申请号:US439553

    申请日:1989-11-20

    Abstract: An engineered lighting system for use in an inspection system is comprised of an array of light emitting diodes. A specimen is brought into the viewing area, and a current pulse is provided to the diodes of the array to selectively flash all or a portion of the diodes of the array. Reflected light from the specimen is sensed and a digitized image is generated therefrom. An illumination level of the digitized image is adjustable, in whole or in part, by varying the effective lighting intensity of one or more of the diodes of the array during a flash period. The digitized image of the specimen is compared to data indicative of acceptability of the specimen, and acceptance or rejection of the specimen is decided on a basis of a comparison therebetween.

    Abstract translation: 用于检查系统的工程照明系统由发光二极管阵列组成。 将样本带入观察区域,并且向阵列的二极管提供电流脉冲以选择性地闪烁阵列的二极管的全部或一部分。 检测到来自样本的反射光并从其中产生数字化图像。 通过在闪光期间改变阵列的一个或多个二极管的有效照明强度,数字化图像的照明水平可以全部或部分地调整。 将样本的数字化图像与指示样品可接受性的数据进行比较,并且基于它们之间的比较来确定样品的接受或排除。

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