公开(公告)号：WO1995027994A2

公开(公告)日：1995-10-19

申请号：PCT/IB1995000232

申请日：1995-04-04

Applicant: PHILIPS ELECTRONICS N.V. ,  PHILIPS NORDEN AB

Inventor： PHILIPS ELECTRONICS N.V. ,  PHILIPS NORDEN AB ,  VAN DER MAST, Karel, Diederick ,  KRUIT, Pieter ,  TROOST, Kars, Zeger ,  HENSTRA, Alexander

IPC: H01J00/00

CPC classification number: H01J37/28 ,  H01J2237/04922 ,  H01J2237/2448

Abstract: The focusing device 8 for the primary beam in a scanning electron microscope (SEM) consists in known manner of a combination of a magnetic gap lens (34) and a monopole lens (38). The secondary electrons released from the specimen are detected in accordance with the invention by a detector whose deflection unit 52 , or the actual detector (64, 66), is arranged in a field-free space between the gap lens and the monopole lens. This space is rendered field-free by a screening plate (44) arranged underneath the gap lens. In order to achieve a high detector efficiency and a large field of vision, the pole tip of the focusing device 8 is provided with an attraction electrode (42) whose potential is higher than that of the specimen.

Abstract translation: 用于扫描电子显微镜（SEM）中的一次束的聚焦装置8以由磁隙透镜（34）和单极透镜（38）的组合的已知方式组成。 根据本发明，通过其偏转单元52或实际检测器（64,66）的检测器检测从样品释放的二次电子，该检测器设置在间隙 镜头和单极镜头。 该空间通过布置在间隙透镜下方的筛板（44）而变得无现场。 为了实现高检测器效率和大的视野，聚焦装置8的极尖设置有电位高于样品的吸引电极（42）。

公开(公告)号：WO1995015001A2

公开(公告)日：1995-06-01

申请号：PCT/US1994012963

申请日：1994-11-09

Applicant: WATERS CORPORATION ,  JARRELL, Joseph, A. ,  TOMANY, Michael, J. ,  DORSCHEL, Craig, A.

Inventor： WATERS CORPORATION

IPC: H01J00/00

CPC classification number: H01J49/0418 ,  G01N1/2813

Abstract: A thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, comprising a matrix material in a supported dispersion wherein the support is a solid or is formed from a solid. The invention is also directed to a method of making a thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, the layer comprising a matrix-solid composition disposed upon a substrate, comprising the step of depositing a solution containing matrix, solid and solvent upon a spinning substrate at a deposition rate sufficient to allow evaporation of the solvent, thereby interspersing the matrix and support on the substrate in a thin layer. Enhanced mass resolution is described.

Abstract translation: 用于通过基质辅助激光解吸质谱进行样品分析的薄层，其包括在支持的分散体中的基质材料，其中载体是固体或由固体形成。 本发明还涉及通过基质辅助激光解吸质谱法制备用于样品分析的薄层的方法，所述层包含置于基材上的基质 - 固体组合物，该方法包括以下步骤：沉积含有基质，固体和 溶剂在旋转衬底上，以足以允许溶剂蒸发的沉积速率，从而将基体和支撑物分散在薄层上的衬底上。 描述了增强的质量分辨率。