Abstract:
A method for forming an integrated circuit including the steps of: a) forming openings in a front surface of a first semiconductor wafer, the depth of the openings being smaller than 10 μm, and filling them with a conductive material; b) forming doped areas of components in active areas of the front surface, forming interconnection levels on the front surface and leveling the surface supporting the interconnection levels; c) covering with an insulating layer a front surface of a second semiconductor wafer, and leveling the surface coated with an insulator; d) applying the front surface of the second wafer coated with insulator on the front surface of the first wafer supporting interconnection levels, to obtain a bonding between the two wafers; e) forming vias from the rear surface of the second wafer, to reach the interconnection levels of the first wafer; and f) thinning the first wafer to reach the openings filled with conductive material.
Abstract:
A MOS transistor including a U-shaped channel-forming semiconductor region and source and drain regions having the same U shape located against the channel-forming region on either side thereof, the internal surface of the channel-forming semiconductor region being coated with a conductive gate, a gate insulator being interposed.
Abstract:
A volatile memory includes volatile memory cells in which data write and read operations are performed. The memory cells are arranged in rows and in columns and are distributed in first separate groups of memory cells for each column. The memory includes, for each column, a write bit line dedicated to write operations and connected to all the memory cells of the column and read bit lines dedicated to read operations. Each read bit line is connected to all the memory cells of one of the first groups of memory cells. Each memory cell in the column is connected to a single one of the read bit lines.
Abstract:
An SRAM memory cell includes first and second inverters (14, 16) interconnected between first and second data nodes. Each inverter is formed from complementary MOS transistors (18, 20, 18null, 20null) connected in series between a DC voltage supply source and a grounding circuit (22). A circuit (28, 30) programs the MOS transistors by causing an irreversible degradation of a gate oxide layer of at least some of the transistors (18, 18null).
Abstract:
A device comprising a resonator formed of a piezoelectric layer sandwiched between two metal electrodes, the resonator being laid on a suspended beam, the device comprising means for deforming said beam by the difference in thermal expansion coefficients.
Abstract:
A sense amplifier connected to first and second bit lines, comprising means for precharging said bit lines to a high voltage, means for connecting one or the other of the bit lines to a memory cell, said connection causing according to the state of the memory cell a maintaining of the bit line at the high voltage or a voltage reduction, first and second transistors respectively controlled by the first and second bit lines, and, in series with the first and second transistors, a controllable means for the current through the transistor controlled by the bit line connected to the memory cell to be greater than the current through the other transistor when the voltages of the two bit lines are at the high voltage.
Abstract:
A phase-locked loop comprising a comparator generating a control voltage depending on the phase-shift between a reference signal and a feedback signal, an oscillator controlled by the control voltage, generating several phase-shifted signals of same period, one of which forms the output signal of the phase-locked loop, a multiplexer capable of providing any of the phase-shifted signals to the input of a divider, the output of which forms the feedback signal, and a means controlling the multiplexer to successively provide fractions of the phase-shifted signals, so that the divider receives a signal having an average period equal to a real fraction of the period of the phase-shifted signals.
Abstract:
A resynchronization module for use in an electronic system comprising a system bus comprises pipeline means of for pipelining the transactions intended for and/or originating from the associated functional module. The pipeline means comprise a first buffer circuit and at least one second buffer circuit, which are connected in parallel, and are each, adapted for storing transaction data of a specific transaction.
Abstract:
An integrated circuit having a voltage generator supplying a determined voltage, a voltage-limiting circuit arranged at the output of the voltage generator, the voltage-limiting circuit having at least one PN junction formed by a diode-arranged MOS transistor, the PN junction having a breakdown voltage defining a threshold for triggering the voltage-limiting circuit as from which the PN junction is on by avalanche effect, at least one load in series with the PN junction for limiting an avalanche current passing through the PN junction when the PN junction is on, and at least one switch in parallel with the PN junction and the load, the switch arranged in the open state when the PN junction is off and to be in the closed state when the PN junction is on.
Abstract:
The switch mode power supply includes a switching cell SC controllable cyclically and including only one inductive element L and several individually selectable outputs. During each conduction cycle, a total power level corresponding to the sum of the individual power levels respectively required by all the outputs OUTi during this cycle is injected into the inductive element L, the outputs requiring a non-zero individual power level are selected successively and in a predetermined order that is identical for all the cycles, and, at each selected output, the corresponding individual power level is produced.