Optical System and Method for Optically Analyzing Light from a Sample
    301.
    发明申请
    Optical System and Method for Optically Analyzing Light from a Sample 失效
    用于光学分析样品光的光学系统和方法

    公开(公告)号:US20070127023A1

    公开(公告)日:2007-06-07

    申请号:US11548210

    申请日:2006-10-10

    Applicant: Richard Reel

    Inventor: Richard Reel

    Abstract: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the samples. The transmission grating is configured to spectrally disperse the substantially collimated light from the collection lens. The reimaging lens is configured to receive the light from the light dispersing element and direct the light onto a light detection device. A method of optically analyzing at least one sample is also provided.

    Abstract translation: 提供了一种用于分析来自多个样品的光的光学系统。 光学系统包括多个保持器,其适于使样本位于其中,收集透镜,透射光栅和再成像透镜。 收集透镜被配置为接收并基本上准直来自样品的光。 透射光栅被配置为光谱地分散来自收集透镜的基本上准直的光。 该成像透镜被配置为接收来自光分散元件的光并将光引导到光检测装置上。 还提供了一种光学分析至少一个样品的方法。

    Ultrasensitive spectrophotometer
    304.
    发明申请
    Ultrasensitive spectrophotometer 有权
    超声分光光度计

    公开(公告)号:US20060152726A1

    公开(公告)日:2006-07-13

    申请号:US11035034

    申请日:2005-01-13

    Inventor: David Larsen Zhi Xu

    Abstract: The invention concerns measurements in which light interacts with matter giving rise to changes in light intensity, and preferred embodiment spectrophotometer devices of the invention provide for ultrasensitive measurements through a reflection interaction with matter. The level of light source noise in these measurements can be reduced in accordance with the invention. Preferred embodiments of the invention use sealed housings lacking an internal light source, and reflection based sample and reference cells. In some embodiments a substantially solid thermally conductive housing is used. Other features of preferred embodiments include particular reflection based sample and reference cells. A total internal reflection embodiment includes, for example, a prism including an interaction surface, a detector, a lens that focuses a beam output from the prism onto the detector, and a closed interaction volume having an inlet and an outlet for delivering gas or liquid to the interaction surface. In a specular reflection embodiment, a reflective surface is used instead of a prism. In a diffuse reflection embodiment a matte surface is used instead of a prism and the matte surface produces scattering. Aspects of the invention include identification of noise-contributing components in spectrophotometry and the select set of preferred features in a given embodiment, and noise levels very near the shot noise limit may be realized with application of preferred embodiment devices.

    Abstract translation: 本发明涉及测量光,其中光与引起光强变化的物质相互作用,并且本发明的优选实施方式的分光光度计装置通过与物质的反射相互作用来提供超灵敏测量。 根据本发明,可以减少这些测量中的光源噪声的水平。 本发明的优选实施例使用缺少内部光源的密封壳体,以及基于反射的样品和参考单元。 在一些实施例中,使用基本上固体的导热壳体。 优选实施方案的其它特征包括特定的基于反射的样品和参考细胞。 全内反射实施例包括例如包括相互作用表面的棱镜,检测器,将从棱镜输出的光束聚焦到检测器上的透镜以及具有用于输送气体或液体的入口和出口的封闭相互作用体积 到相互作用的表面。 在镜面反射实施例中,使用反射表面代替棱镜。 在漫反射实施例中,使用无光泽表面代替棱镜,并且无光泽表面产生散射。 本发明的方面包括在给定实施例中识别分光光度法中的噪声贡献成分以及在一特定实施例中选择的一组优选特征,并且通过应用优选实施例装置可以实现非常接近散粒噪声极限的噪声水平。

    Refractive-diffractive spectrometer
    306.
    发明申请
    Refractive-diffractive spectrometer 失效
    折射衍射光谱仪

    公开(公告)号:US20050219525A1

    公开(公告)日:2005-10-06

    申请号:US11083895

    申请日:2005-03-17

    Applicant: Edward Granger

    Inventor: Edward Granger

    Abstract: A diffraction grating and a prism with the appropriate characteristics are employed to provide a combined dispersive characteristic that is substantially linear over the visible spectrum. Radiation from the grating and prism is collimated by a lens towards a detector array. The grating or a telecentric stop between the grating and prism is placed at a focal point of the lens in a telecentric arrangement so that equal magnification is achieved at the detector array. If the detector array is replaced by a plurality of optical channels, a multiplexer/demultiplexer is obtained.

    Abstract translation: 使用衍射光栅和具有适当特性的棱镜来提供在可见光谱上基本上线性的组合色散特性。 来自光栅和棱镜的辐射由透镜朝向检测器阵列准直。 光栅或光栅和棱镜之间的远心光阑以远心布置放置在透镜的焦点处,使得在检测器阵列处实现相等的放大倍率。 如果检测器阵列被多个光通道替代,则获得多路复用器/解复用器。

    Optical system and method for optically analyzing light from a sample
    307.
    发明授权
    Optical system and method for optically analyzing light from a sample 失效
    用于光学分析来自样品的光的光学系统和方法

    公开(公告)号:US06927852B2

    公开(公告)日:2005-08-09

    申请号:US10773712

    申请日:2004-02-05

    Inventor: Richard T. Reel

    Abstract: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the samples. The transmission grating is configured to spectrally disperse the substantially collimated light from the collection lens. The reimaging lens is configured to receive the light from the light dispersing element and direct the light onto a light detection device. A method of optically analyzing at least one sample is also provided.

    Abstract translation: 提供了一种用于分析来自多个样品的光的光学系统。 光学系统包括多个保持器,其适于使样本位于其中,收集透镜,透射光栅和再成像透镜。 收集透镜被配置为接收并基本上准直来自样品的光。 透射光栅被配置为光谱地分散来自收集透镜的基本上准直的光。 该成像透镜被配置为接收来自光分散元件的光并将光引导到光检测装置上。 还提供了一种光学分析至少一个样品的方法。

    Light spectrum detecting apparatus
    308.
    发明授权
    Light spectrum detecting apparatus 失效
    光谱检测装置

    公开(公告)号:US06859274B2

    公开(公告)日:2005-02-22

    申请号:US10333991

    申请日:2001-07-05

    Applicant: Naoki Inamoto

    Inventor: Naoki Inamoto

    CPC classification number: G01J3/02 G01J3/0262 G01J3/2803

    Abstract: A light spectrum detecting apparatus according to the present invention comprises a photodetector (13) and a light transmitting plate (13b) covering a light receiving surface (13a) of the photodetector (13), and in the apparatus, a front surface S of the light transmitting plate 13b is inclined and, among incidents lights, any light once reflected by a back surface T of the light transmitting plate (13b) travels thereafter, with being totally reflected by the front surface S and the back surface T of the light transmitting plate (13b), to a side surface 13d of the light transmitting plate (13b). Any stray light can be prevented from entering the photodetector (13).

    Abstract translation: 根据本发明的光谱检测装置包括光电检测器(13)和覆盖光电检测器(13)的光接收表面(13a)的透光板(13b),并且在该装置中, 透光板13b是倾斜的,并且在事件发光中,一旦透光板(13b)的背面T反射的任何光在其之后行进,被透光板的前表面S和背面T完全反射 (13b)连接到透光板(13b)的侧表面13d。 可以防止任何杂散光进入光电检测器(13)。

    Photodetector and spectrometer using the same
    309.
    发明申请
    Photodetector and spectrometer using the same 有权
    光电检测器和光谱仪使用相同

    公开(公告)号:US20040239931A1

    公开(公告)日:2004-12-02

    申请号:US10854628

    申请日:2004-05-27

    CPC classification number: G01J3/2803 G01J3/0256 G01J3/0262 G01J3/0291

    Abstract: A spectrometer is configured by using a photodetector 1B which comprises a semiconductor substrate 10 having an upper surface 10a, a photodiode array 11 having a plurality of photodiodes 12 aligned on the upper surface 10a of the substrate 10, and a light input section 13 including an opening formed in a predetermined positional relationship to the photodiode array 11; and a main body 2 having a plate portion 20 and support portions 21 and 22 mounted on the substrate 10 of the photodetector 1B. The spectrometer is provided with a lens 23 protruded from a lower face 20b of the plate portion 20 and a planar aberration-reduced blazed reflection diffraction grating 24 provided on an upper face 20a of the plate portion 20 for separating incident light having entered through the light input section 13 and passed through the lens 23 into its spectral components, and configured to detect the spectral components with the photodiode array 11. Thus, a photodetector capable of improving the positioning accuracy of components when it is applied to a spectrometer and the spectrometer using the same are realized.

    Abstract translation: 通过使用光电检测器1B构成光谱仪,该光电检测器1B包括具有上表面10a的半导体衬底10,具有在衬底10的上表面10a上排列的多个光电二极管12的光电二极管阵列11和光输入部13, 开口以与光电二极管阵列11的预定位置关系形成; 以及主体2,其具有安装在光电检测器1B的基板10上的板部20和支撑部21和22。 光谱仪设置有从板部20的下表面20b突出的透镜23和设置在板部20的上表面20a上的平面像差减少的闪光反射衍射光栅24,用于分离通过光入射的入射光 输入部分13并通过透镜23进入其光谱分量,并且被配置为用光电二极管阵列11检测光谱分量。因此,一种光电检测器能够在将其应用于光谱仪时提高部件的定位精度,而光谱仪使用 同样实现。

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