Abstract:
PROBLEM TO BE SOLVED: To provide a time sequence conversion pulse spectrum measuring device capable of measuring time sequence conversion pulse spectrum of various sample and its state, etc. easily and in a short time. SOLUTION: The time sequence conversion pulse spectrum measuring device comprises a pulse laser source, a split means for splitting pulse laser light from the pulse laser source, into pulse laser light for exciting and pulse laser light for detecting, a pulse light irradiation means, a detection means, a sample holder holding a sample and a sample part incidence/emission optical system. Furthermore, the time sequence conversion pulse spectrum measuring device comprises a light path length changing means for setting at least one light measuring zone which is arranged in one of incidence side light path from the splitting means to the pulse light irradiation means and/or detection side light path from the splitting means to the detection means, and an optical delay means for measuring at least one time sequence signal which is arranged in one of incidence side light path from the splitting means to the pulse light irradiation means and/or detection side light path from the splitting means to the detection means. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PURPOSE: To enhance the reliability of spectrophotometer, by such a simple constitution that a first sector and a second sector each having a pervious part and a reflective part are respectively used as a beam splitting one and a beam coupling one while spectral diffraction is performed by a frequency component detecting system. CONSTITUTION: The light from a light source 1 for an infrared region is reflected by a concave mirror 2 and the reflected light is split into two light beams by a first rotary sector 3. The first sector has a reflective part and a pervious part each having a specific pattern and the reflected light is converted to a reference light beam 14 while the pervious light to a sample light beam 15 by both parts. A second sector 9 has a pervious part and a reflective part each having a specific pattern and the reference light beam 14 permeated through the second sector 9 and the sample light beam 15 reflected by the second sector 9 mutually passes a monochromator 12 to be incident to a detector 13. The first sector 3 and the second sector 9 are synchronously rotated at a rotation ratio of 1:4 and the ratio of sample beam/reference beam is directly calculated from the output of the detector 13 by a frequency component detecting system. COPYRIGHT: (C)1984,JPO&Japio
Abstract:
A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follow a beam path (16B) from the sample (10) to the image sensor (28). The refractive, optical element (24A) is spaced apart a separation distance (42) from the sample (10) along the beam path (16B). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), controls the mover assembly (29) (24C) to modulate the separation distance (42), and controls the image sensor (28) to capture the data.
Abstract:
Technologies are described for monitoring characteristics of layers of integrated computational elements (ICEs) during fabrication using an in-situ spectrometer operated in step-scan mode in combination with lock-in or time-gated detection. As part of the step-scan mode, a wavelength selecting element of the spectrometer is discretely scanned to provide spectrally different instances of probe-light, such that each of the spectrally different instances of the probe-light is provided for a finite time interval. Additionally, an instance of the probe-light interacted during the finite time interval with the ICE layers includes a modulation that is being detected by the lock-in or time-gated detection over the finite time interval.
Abstract:
A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follow a beam path (16B) from the sample (10) to the image sensor (28). The refractive, optical element (24A) is spaced apart a separation distance (42) from the sample (10) along the beam path (16B). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), controls the mover assembly (29) (24C) to modulate the separation distance (42), and controls the image sensor (28) to capture the data.
Abstract:
A multi-channel infrared spectrometer for detecting an infrared spectrum of light received from an object. The spectrometer comprises a wavelength converter system comprising a nonlinear material and having an input side and an output side. The wavelength converter system comprises at least a first up-conversion channel and a second up-conversion channel, and is arranged such that light traversing the wavelength converter system at different angles in the nonlinear material is imaged into different positions in an image plane. The first up-conversion channel is configurable for phase-matching infrared light in a first input wavelength range incident on the first side and light in a first output wavelength range output on the second side, and correspondingly, the second up-conversion channel is configurable for phase-matching infrared light in a second input wavelength range incident on the first side into light in a second output wavelength range output on the second side. The spectrometer further comprises a demultiplexer configured for demultiplexing light in the first up-conversion channel and light in the second up-conversion channel. The demultiplexer is located on the first side or the second side of the wavelength converter system. Finally, the spectrometer comprises a spatially resolved detector arranged in the image plane to detect light in the first output wavelength range and second output wavelength range output of the wavelength converter system.
Abstract:
A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.