DC-DC CONVERTER WITH GALVANIC ISOLATION AND CORRESPONDING METHOD OF CONTROL OF A DC-DC CONVERTER

    公开(公告)号:US20240291387A1

    公开(公告)日:2024-08-29

    申请号:US18437919

    申请日:2024-02-09

    CPC classification number: H02M3/33523 H02M1/0054 H02M3/01 H02M3/3384

    Abstract: Provided is a DC-DC converter with galvanic isolation comprising a resonant oscillator coupled to a primary winding of a galvanic isolation transformer. A rectifier is coupled to a secondary winding of the transformer to provide an output voltage. The DC-DC converter comprises a regulation loop configured to regulate an output voltage with respect to a reference voltage by controlling a current flowing in the resonant oscillator as a function of a result of a signal indicative of the comparison between the output voltage and the reference voltage. The resonant oscillator is configured to operate at a frequency, in particular tuned at sub-resonant point, in particular sub-harmonic frequency, below a resonance frequency of the resonant oscillator which maximizes a quality factor of the resonant oscillator, in particular below a resonance frequency of a LC tank circuit comprised in the resonant oscillator which maximizes a quality factor of the LC tank circuit.

    Circuit for biasing an external resistive sensor

    公开(公告)号:US12073860B2

    公开(公告)日:2024-08-27

    申请号:US18191639

    申请日:2023-03-28

    CPC classification number: G11B5/6029 G11B5/607 H03F1/0261

    Abstract: According to an embodiment, a circuit includes a biasing and a low-frequency recovery circuit. The biasing circuit includes a voltage digital to analog converter (V-DAC), a differential difference amplifier coupled to the V-DAC, a common-mode feedback (CMFB) amplifier coupled to the differential difference amplifier, and a first pair of transistors arranged as a high-impedance structure and coupled to the differential difference amplifier and the CMFB amplifier. The low-frequency recovery circuit includes a current digital to analog converter (C-DAC), a second pair of transistors arranged as a high-impedance structure and coupled to the first pair of transistors, a pair of resistors having a resistance value equal to half a resistance of the resistive sensor, the pair of resistors arranged between the second pair of transistors and coupled to the C-DAC, and a gain circuit coupled to shared nodes between the second pair of transistors and the pair of resistors.

    System for testing an electronic circuit and corresponding method and computer program product

    公开(公告)号:US12072372B2

    公开(公告)日:2024-08-27

    申请号:US17903344

    申请日:2022-09-06

    CPC classification number: G01R31/2834

    Abstract: A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.

    Silicon carbide-based electronic device and method of manufacturing the same

    公开(公告)号:US12051731B2

    公开(公告)日:2024-07-30

    申请号:US17698986

    申请日:2022-03-18

    CPC classification number: H01L29/4234 H01L27/0629 H01L29/1608 H01L29/872

    Abstract: An electronic device comprising: a semiconductor body of silicon carbide, SiC, having a first and a second face, opposite to one another along a first direction, which presents positive-charge carriers at said first face that form a positive interface charge; a first conduction terminal, which extends at the first face of the semiconductor body; a second conduction terminal, which extends on the second face of the semiconductor body; a channel region in the semiconductor body, configured to house, in use, a flow of electrons between the first conduction terminal and the second conduction terminal; and a trapping layer, of insulating material, which extends in electrical contact with the semiconductor body at said channel region and is designed so as to present electron-trapping states that generate a negative charge such as to balance, at least in part, said positive interface charge.

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