Spektraler fotoelektrischer Messwandler mit optischem Ablenkelement

    公开(公告)号:EP1936338A1

    公开(公告)日:2008-06-25

    申请号:EP06126340.6

    申请日:2006-12-18

    Inventor: Ehbets, Peter

    Abstract: Ein spektraler fotoelektrischer Messwandler besteht aus einem Feld (10) von fotoelektrischen Wandlerelementen und diesen vorgeschalteten, auf einem gemeinsamen Filterträger (21) angeordneten dielektrischen Interferenz-Bandpassfiltern (22a, 22b) zur Sensibilisierung der Wandlerelemente auf unterschiedliche Wellenlängenbereiche des Messlichts. Die Bandpassfilter sind in eine Anzahl von Filtergruppen eingeteilt, die jeweils die gleichen, innerhalb der Filtergruppe unterschiedlichen Bandpassfilter enthalten. Ein optisches Ablenkelement (30) verschiebt die effektiven Durchlasskurven der Bandpassfilter aller Filtergruppen ausser einer spektral so, dass die effektiven Durchlasskurven aller Bandpassfilter verschiedene spektrale Lagen aufweisen. Dadurch wird mit wenigen unterschiedlichen Bandpassfiltern eine Vervielfachung der effektiv zur Verfügung gestellten Filterkanäle erreicht. Aufgrund der geringen Anzahl unterschiedlicher Bandpassfilter kann der Messwandler kostengünstig hergestellt werden.

    Abstract translation: 换能器具有光学偏转单元(30),用于光谱定位除了另一个滤光器组之外的所有滤光片组的带通滤光片的有效孔径曲线。 所有带通滤波器的有效孔径曲线包括不同的光谱层。 曲线的半宽度和光谱距离设计成使得传输间隙保留在曲线之间,并且该单元是光学透明的。 该单元包括平行平行部分(31)和棱柱形部分(32)或相应的棱柱形菲涅耳结构。

    Detektor mit Mikrolinsen-Anordnung
    362.
    发明公开
    Detektor mit Mikrolinsen-Anordnung 审中-公开
    探测器,带微透镜阵列

    公开(公告)号:EP1930706A1

    公开(公告)日:2008-06-11

    申请号:EP08004867.1

    申请日:2006-01-21

    Abstract: Ein Detektor, insbesondere zur spektralen Detektion von Licht in einem Mikroskop, mit einer photosensitiven Anordnung (1) mit mindestens einer photosensitiven Fläche, wobei in einem Strahlengang vor der photosensitiven Anordnung (1) ein Mittel zur Fokussierung eines spektral aufgespaltenen Lichts auf die photosensitive Anordnung (1) angeordnet ist, ist im Hinblick auf eine besonders hohe Detektionsgeschwindigkeit derart ausgestaltet und weitergebildet, dass das Mittel eine Mikrolinsen-Anordnung (2) mit mindestens einer Mikrolinse aufweist. Des Weiteren sind ein Spektrometer und ein Mikroskop mit einem derartigen Detektor angegeben,

    Abstract translation: 的检测器,特别是用于在显微镜光谱检测光的,具有光敏阵列(1)具有至少一个光敏面,其中,在光路中的光敏阵列的上游(1)一种光谱分裂光聚焦到光敏阵列的装置( 1)被设置成,被配置以特别高的检测速度和这种进一步改进,即装置包括(2),其具有至少一个微透镜的微透镜阵列。 还示出了光谱仪,并用这样的检测器的显微镜,

    Spectroscopic analyzing apparatus
    363.
    发明公开
    Spectroscopic analyzing apparatus 有权
    Vorrichtung zur spektroskopischen分析

    公开(公告)号:EP1916507A1

    公开(公告)日:2008-04-30

    申请号:EP06255492.8

    申请日:2006-10-25

    Inventor: Kato, Hisaki

    Abstract: The present invention relates to a spectroscopic analyzing apparatus having a structure for enabling detection of a continuous spectrum over an overall detecting region by sharing the overall detection wavelength range to a plurality of detectors. The spectroscopic analyzing apparatus has a spectroscope, a plurality of detectors, and direction changers provided in connection with one or more detectors among the plurality of detectors. The spectroscope separates incident light into one or more wavelength components. The respective detectors are arranged such that the optical path lengths from the spectroscope to the centers of the photodetecting faces thereof are made coincident with one another. The respective direction changers are arranged on the optical paths of the wavelength components that propagate from the spectroscope to the detectors, and changes the propagation directions of the wavelength components, whereby the direction changers function to adjust the optical path lengths of the wavelength components.

    Abstract translation: 本发明涉及一种光谱分析装置,其具有能够通过将整个检测波长范围共享到多个检测器来在整个检测区域上检测连续光谱的结构。 光谱分析装置具有与多个检测器中的一个或多个检测器相关联地设置的分光器,多个检测器和方向变换器。 分光镜将入射光分离成一个或多个波长分量。 各检测器被布置成使得从分光器到其受光面的中心的光路长度彼此一致。 相应的方向变换器被布置在从分光器传播到检测器的波长分量的光路上,并且改变波长分量的传播方向,由此方向变换器用于调节波长分量的光程长度。

    System, method and apparatus for a micromachined interferometer using optical splitting
    364.
    发明公开
    System, method and apparatus for a micromachined interferometer using optical splitting 有权
    系统,Verfahren und Vorrichtungfürein mikrogefertigtes干涉仪mit optischem Strahlteiler

    公开(公告)号:EP1906159A1

    公开(公告)日:2008-04-02

    申请号:EP07301406.0

    申请日:2007-09-28

    Abstract: A micromachined interferometer (10) is achieved using a half plane beam splitter. The beam splitter is optically coupled to receive an incident beam (I) and operates to split the incident beam into two interfering beams (L1 and L2), each propagating in a different medium. A fixed mirror (M2) embedded in one of the mediums reflects one of the interfering beams (L2) back towards the half plane beam splitter through such medium, while a moveable mirror (M1), which is controlled by an actuator (40), reflects the other interfering beam (L1) back towards said half plane beam splitter through the other medium. A detection plane (D1 or D2) detects an interference pattern produced as a result of interference between the reflected interfering beams (L3 and L4).

    Abstract translation: 使用半平面分束器实现微加工干涉仪(10)。 光束分离器被光学耦合以接收入射光束(I)并且操作以将入射光束分成两个干涉光束(L1和L2),每个干涉光束在不同的介质中传播。 嵌入其中一个介质中的固定镜(M2)通过这种介质将一个干涉光束(L2)反射回半平面分束器,而由致动器(40)控制的可移动反射镜(M1) 通过另一个介质将另一个干涉光束(L1)反射回所述半平面分束器。 检测平面(D1或D2)检测由反射的干涉光束(L3和L4)之间的干涉产生的干涉图案。

    System and method for applying correction factors related to ambient conditions
    366.
    发明公开
    System and method for applying correction factors related to ambient conditions 审中-公开
    系统与Verfahren zur Anwendung von Korrekturfaktoren在Bezug auf Umgebungsbedingungen

    公开(公告)号:EP1719989A2

    公开(公告)日:2006-11-08

    申请号:EP06003032.7

    申请日:2006-02-15

    Abstract: A method and system for effecting an appearance model correction for a display unit, e.g., a CRT, using a polynomial-based algorithm is described. The correction may be effected in real time and is based on gamma values associated with the display. Strong correlations with the CIECAM02 specification are achieved according to the present disclosure. The correction functionality may be implemented using a colorimeter that includes a plurality of sensors/filter systems with non overlappng spectral responses, adequate for providing data capable of translation into standard coordinates system such as, CIE XYZ, CIE L* a* b*, or CIE Luv, as well as non-standard operable coordinate systems. The field of view of the colorimeter is chosen to closely track the response of the human eye using an optical path configured to select and limit the field of view in a manner that is insensitive to placement of the colorimeter on the source image. The optical path from the source image to the sensor is configured to select preferred light rays while rejecting undesirable light rays to maximize the signal/noise ratio. A rearward facing sensor channel is included to simultaneously measure ambient light impinging on the source image and feedback means to provide status and/or change of information.

    Abstract translation: 描述了使用基于多项式的算法对诸如CRT的显示单元进行外观模型校正的方法和系统。 校正可以实时地实现,并且基于与显示相关联的伽马值。 根据本公开实现了与CIECAM02规范的强相关性。 校正功能可以使用包括具有非叠加光谱响应的多个传感器/滤波器系统的色度计来实现,该传感器/滤波器系统足以提供能够转换成标准坐标系统的数据,诸如CIE XYZ,CIE L * a * b *或 CIE Luv,以及非标准可操作的坐标系。 选择色度计的视野以使用配置成以对色度计放置在源图像上不敏感的方式选择和限制视场的光路来密切跟踪人眼的响应。 从源图像到传感器的光路被配置为选择优选的光线,同时抑制不期望的光线以使信号/噪声比最大化。 包括向后的传感器通道以同时测量照射在源图像上的环境光和反馈装置以提供信息的状态和/或变化。

    FILTEREINHEIT MIT EINSTELLBARER WELLENLÄNGE SOWIE EINE ANORDNUNG MIT DER FILTEREINHEIT
    368.
    发明公开
    FILTEREINHEIT MIT EINSTELLBARER WELLENLÄNGE SOWIE EINE ANORDNUNG MIT DER FILTEREINHEIT 审中-公开
    具有可调波长滤波器单元和过滤器单元的排列

    公开(公告)号:EP1714121A1

    公开(公告)日:2006-10-25

    申请号:EP05700360.0

    申请日:2005-02-09

    Inventor: LINDER, Patrick

    Abstract: The invention relates to a filter unit (10) for filtering light comprising a first mask (3) with first cavities, a prism unit (7) and a second mask (8) with second cavities. The prism unit (7) is located between the two masks (3, 8), the first (3) and the second mask (8) having corresponding first and second cavities, which form cavity pairs. At least one second cavity in the second mask (8) is provided for each first cavity in the first mask (3). In addition, one prism is provided in the prism unit (7) for at least one pair of cavities. This produces an accurate, narrow-band filter unit. The invention also relates to an assembly comprising the filter unit and to a device for capturing images.

    INTEGRATED SPECTROSCOPY SYSTEM
    369.
    发明公开
    INTEGRATED SPECTROSCOPY SYSTEM 有权
    INTEGRIERTES SPEKTROSKOPIESYSTEM

    公开(公告)号:EP1678470A2

    公开(公告)日:2006-07-12

    申请号:EP04809989.9

    申请日:2004-10-13

    CPC classification number: G01J3/36 G01J3/0256 G01J3/10 G01J3/26 G01N21/255

    Abstract: Integrated spectroscopy systems are disclosed. In some examples, integrated tunable detectors, using one or multiple Fabry-Perot tunable filters, are provided. Other examples use integrated tunable sources. The tunable source combines one or multiple diodes, such as superluminescent light emitting diodes (SLED), and a Fabry Perot tunable filter or etalon. The advantages associated with the use of the tunable etalon are that it can be small, relatively low power consumption device. For example, newer microelectrical mechanical system (MEMS) implementations of these devices make them the size of a chip. This increases their robustness and also their performance. In some examples, an isolator, amplifier, and/or reference system is further provided integrated.

    Abstract translation: 公开了集成光谱系统。 在一些示例中,提供使用一个或多个法布里 - 珀罗可调谐滤波器的集成可调谐检测器。 其他示例使用集成的可调源。 可调谐源组合了一个或多个二极管,例如超发光发光二极管(SLED)和法布里·珀罗可调滤波器或标准具。 与使用可调谐标准具相关的优点是它可以是小的,相对较低的功耗设备。 例如,这些器件的较新的微电机械系统(MEMS)实现使其成为芯片的尺寸。 这增加了它们的稳健性和性能。 在一些示例中,还集成了隔离器,放大器和/或参考系统。

    PHOTODETECTOR AND SPECTROMETER USING THE SAME
    370.
    发明公开
    PHOTODETECTOR AND SPECTROMETER USING THE SAME 审中-公开
    光检测器和它的用途光谱仪

    公开(公告)号:EP1627210A1

    公开(公告)日:2006-02-22

    申请号:EP04735352.9

    申请日:2004-05-28

    CPC classification number: G01J3/2803 G01J3/0256 G01J3/0262 G01J3/0291

    Abstract: A spectrometer is configured by using a photodetector 1B which comprises a semiconductor substrate 10 having an upper surface 10a, a photodiode array 11 having a plurality of photodiodes 12 aligned on the upper surface 10a of the substrate 10, and a light input section 13 including an opening formed in a predetermined positional relationship to the photodiode array 11; and a main body 2 having a plate portion 20 and support portions 21 and 22 mounted on the substrate 10 of the photodetector 1B. The spectrometer is provided with a lens 23 protruded from a lower face 20b of the plate portion 20 and a planar aberration-reduced blazed reflection diffraction grating 24 provided on an upper face 20a of the plate portion 20 for separating incident light having entered through the light input section 13 and passed through the lens 23 into its spectral components, and configured to detect the spectral components with the photodiode array 11. Thus, a photodetector capable of improving the positioning acuracy of components when it is applied to a spectrometer and the spectrometer using the same are realized.

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