ILLUMINATION DEVICE AND REFLECTION-CHARACTERISTICS MEASUREMENT DEVICE
    362.
    发明公开
    ILLUMINATION DEVICE AND REFLECTION-CHARACTERISTICS MEASUREMENT DEVICE 审中-公开
    奥地利维也纳国际电力公司(VORRICHTUNG ZUR MESSUNG VON BELEUCHTUNGSEIGENSCHAFTEN)

    公开(公告)号:EP3006910A1

    公开(公告)日:2016-04-13

    申请号:EP14803475.4

    申请日:2014-05-15

    Abstract: There is provided an illumination device from which an index can be obtained, the index appropriately reflecting intensity of a light beam guided to an object to be illuminated. A light source, a photodetector, and a support structure are provided in the illumination device. The light source emits light. The light source has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam included in the light is guided to the object to be illuminated. A second light beam included in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam makes a first angle with the reference axis. A traveling direction of the second light beam makes a second angle with the reference axis. The second angle is the same as the first angle.

    Abstract translation: 提供了一种能够获得指标的照明装置,该指标适当地反映被引导到被照明物体的光束的强度。 在照明装置中设置有光源,光电检测器和支撑结构。 光源发光。 光源具有光分布,其中参考轴用作对称轴或光分布,其中包括基准轴的平面用作对称平面。 包含在光中的第一光束被引导到被照明的物体。 包括在光中的第二光束被引导到光电检测器。 光检测器检测第二光束的强度。 光源和光电检测器由支撑结构支撑在允许以上述方式引导第一光束和第二光束的位置和姿势。 第一光束的行进方向与基准轴成一定角度。 第二光束的行进方向与基准轴成为第二角度。 第二个角度与第一个角度相同。

    SPECTROMETER
    363.
    发明公开
    SPECTROMETER 审中-公开
    光谱仪

    公开(公告)号:EP2881718A4

    公开(公告)日:2016-04-06

    申请号:EP13827557

    申请日:2013-07-29

    CPC classification number: G01J3/18 G01J3/0202 G01J3/0256 G01J3/0291 G01J3/04

    Abstract: A spectrometer 1A comprises a package 2 having a stem 4 and a cap 5, an optical unit 10A arranged on the stem 4, and a lead pin 3 penetrating through the stem 4. The optical unit 10A has a dispersive part 21 for dispersing and reflecting light entering from a light entrance part 6 of the cap 5, a light detection element 30 for detecting the light dispersed and reflected by the dispersive part 21, a support 40 for supporting the light detection element 30 such as to form a space between the dispersive part 21 and the light detection element 30, a projection 11 projecting from the support 40, and a wiring electrically connected to the light detection element 30. The projection 11 is arranged at such a position as to be separated from the stem 4. The lead pin 3 is electrically connected to the second terminal part while being disposed to the projection 11.

    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
    364.
    发明公开
    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT 审中-公开
    用于成像远程物体的超光谱成像系统和方法

    公开(公告)号:EP2972149A1

    公开(公告)日:2016-01-20

    申请号:EP13812287.4

    申请日:2013-12-03

    Abstract: A hyperspectral imaging system (100b) and a method are disclosed herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest 104). In one aspect, the hyperspectral imaging system includes at least one optic (106), a rotatable disk (302) which has multiple straight slits (304) formed therein, a spectrometer (110), a two-dimensional image sensor (112), and a controller (114). In another aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has at least one spiral slit formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In yet another aspect, the hyperspectral imaging system includes at least one optic, a rotatable drum (which has a plurality of slits formed on the outer surface thereof and a fold mirror located therein), a spectrometer, a two-dimensional image sensor, and a controller.

    Abstract translation: 本文公开了用于提供远程对象(例如,感兴趣的场景104)的区域的高光谱图像的高光谱成像系统(100b)和方法。 在一个方面,高光谱成像系统包括至少一个光学器件(106),其中形成有多个直缝(304)的旋转盘(302),光谱仪(110),二维图像传感器(112) 和控制器(114)。 另一方面,高光谱成像系统包括至少一个光学元件,旋转盘(其中形成有至少一个螺旋狭缝),分光计,二维图像传感器和控制器。 在又一方面,高光谱成像系统包括至少一个光学器件,可旋转的鼓(其具有在其外表面上形成的多个狭缝和位于其中的折叠镜),光谱仪,二维图像传感器,以及 一个控制器。

    SPECTROMETER
    365.
    发明公开
    SPECTROMETER 审中-公开
    光谱仪

    公开(公告)号:EP2881718A1

    公开(公告)日:2015-06-10

    申请号:EP13827557.3

    申请日:2013-07-29

    CPC classification number: G01J3/18 G01J3/0202 G01J3/0256 G01J3/0291 G01J3/04

    Abstract: A spectrometer 1A comprises a package 2 having a stem 4 and a cap 5, an optical unit 10A arranged on the stem 4, and a lead pin 3 penetrating through the stem 4. The optical unit 10A has a dispersive part 21 for dispersing and reflecting light entering from a light entrance part 6 of the cap 5, a light detection element 30 for detecting the light dispersed and reflected by the dispersive part 21, a support 40 for supporting the light detection element 30 such as to form a space between the dispersive part 21 and the light detection element 30, a projection 11 projecting from the support 40, and a wiring electrically connected to the light detection element 30. The projection 11 is arranged at such a position as to be separated from the stem 4. The lead pin 3 is electrically connected to the second terminal part while being disposed to the projection 11.

    Abstract translation: 光谱仪1A包括具有杆4和盖5的封装2,布置在杆4上的光学单元10A和穿过杆4的引脚3.光学单元10A具有用于分散和反射的分散部分21 从灯头5的光入射部分6进入的光,用于检测由分散部分21分散和反射的光的光检测元件30,用于支撑光检测元件30的支撑件40,以在分散部分之间形成空间 部分21和光检测元件30,从支撑件40突出的突起11和电连接到光检测元件30的布线。突起11布置在与杆4分离的位置。引线 销3在设置到突起11的同时电连接到第二端子部。

    SPECTROSCOPIC MODULE
    368.
    发明公开
    SPECTROSCOPIC MODULE 审中-公开
    SPEKTROSKOPISCHES MODUL

    公开(公告)号:EP2157414A4

    公开(公告)日:2013-12-18

    申请号:EP08765197

    申请日:2008-06-05

    Abstract: In the spectroscopy module 1, a light detecting element 4 is provided with a light passing opening 4b through which light made incident into a body portion 2 passes. Therefore, it is possible to prevent deviation of the relative positional relationship between the light passing opening 4b and a light detection portion 4a of the light detecting element 4. Further, an optical element 7, which guides light made incident into the body portion 2, is arranged at the light passing opening 4b. Therefore, light, which is to be made incident into the body portion 2, is not partially blocked at a light incident edge portion of the light passing opening 4b, but light, which is to be made incident into the body portion 2, can be guided securely. Therefore, according to the spectroscopy module 1, it is possible to improve the reliability.

    Abstract translation: 在光谱学模块1中,光检测元件4设置有光入射口4b,入射到主体部分2中的光穿过光入射口4b。 因此,可以防止光通过开口4b与光检测元件4的光检测部分4a之间的相对位置关系的偏差。此外,引导入射到本体部分2中的光的光学元件7, 布置在光通过口4b处。 因此,要入射到主体部分2中的光在光通过开口4b的光入射边缘部分处没有被部分地阻挡,但是将要入射到主体部分2中的光可以是 安全引导。 因此,根据分光模块1,可以提高可靠性。

    Monolithic Offner Spectrometer
    369.
    发明公开
    Monolithic Offner Spectrometer 审中-公开
    单片欧浮纳分光计

    公开(公告)号:EP2407761A3

    公开(公告)日:2012-12-05

    申请号:EP11175172.3

    申请日:2007-04-23

    Inventor: Comstock, Lovell

    Abstract: A monolithic Offner spectrometer is described herein as are various components like a diffraction grating and a slit all of which are manufactured by using a state-of-the-art diamond machining process. In one embodiment, a monolithic Offner spectrometer is directly manufactured by using a diamond machining process. In another embodiment, a monolithic Offner spectrometer is manufactured by using molds which are made by a diamond machining process. In yet another embodiment, a diffraction grating is directly manufactured by using a diamond machining process. In still yet another embodiment, a diffraction grating is manufactured by using a mold which is made by a diamond machining process. In yet another embodiment, a slit is directly manufactured by using a diamond machining process.

    Vorrichtung zur Erfassung des Spektrums elektromagnetischer Strahlung innerhalb eines vorgegebenen Wellenlängenbereichs
    370.
    发明公开
    Vorrichtung zur Erfassung des Spektrums elektromagnetischer Strahlung innerhalb eines vorgegebenen Wellenlängenbereichs 有权
    装置,用于在预定波长范围内的检测电磁辐射的光谱

    公开(公告)号:EP2521179A1

    公开(公告)日:2012-11-07

    申请号:EP11167479.2

    申请日:2011-05-25

    Abstract: Die Vorrichtung zur Erfassung des Spektrums elektromagnetischer Strahlung innerhalb eines vorgegebenen Wellenlängenbereichs ist versehen mit einem Substrat (12), einer oberhalb des Substrats (12) angeordneten ersten Lochmaske (20) aus einem für Strahlung innerhalb des vorgegebenen Wellenlängenbereichs undurchlässigen Material, wobei die erste Lochmaske (20) eine Vielzahl von ersten Fenstern (22) aufweist, einer Vielzahl von in dem Substrat (12) angeordneten, für Strahlung innerhalb des vorgegebenen Wellenlängenbereichs empfindlichen Sensorelementen, und einer oberhalb der ersten Lochmaske (20) angeordneten, zweite Fenster (36) aufweisenden zweiten Lochmaske (32) aus einem für die Strahlung innerhalb des vorgegebenen Wellenlängenbereichs undurchlässigen Material. Die zweiten Fenster (36) der zweiten Lochmaske (32) sind überlappend mit den Fenstern der ersten Lochmaske (20) angeordnet und gegenüberliegende Ränder der jeweils zwei sich überlappenden Fenster der beiden Lochmasken (20,32) definieren die Größe einer jeweils einem Sensorelement zugeordneten Strahlungsdurchlassöffnung (42) zum Durchlassen von Strahlung innerhalb des vorgegebenen Wellenlängenbereichs zu dem unterhalb der Strahlungsdurchlassöffnung (42) angeordneten Sensorelement. Für die Erfassung der Intensität von elektromagnetischer Strahlung bei jeder interessierenden Wellenlänge innerhalb des vorgegebenen Wellenlängenbereichs ist mindestens eine Strahlungsdurchlassöffnung (42) mit einer der interessierenden Wellenlängen zugeordnete Größe vorgesehen.

    Abstract translation: 该光谱仪(10)具有穿孔掩模(32)包括窗口(36),其被重叠地与另一穿孔掩模(20)的其他窗口(22)地布置。 的交叠窗口的相对放置的边缘限定的尺寸用于传递电磁辐射具有预定波长范围内的光电二极管(30)的放射线排出开口(42)的E.G. 红外发光二极管,所有这一切都被布置在开口的下方。 提供了一种用于与范围内的每个感兴趣的波长的辐射的强度的记录相关联的给感兴趣的波长的尺寸的排出开口。

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