公开(公告)号：GB1261596A

公开(公告)日：1972-01-26

申请号：GB3039969

申请日：1969-06-16

Applicant: APPLIED RES LAB INC

IPC: G01N21/67 ,  G01N21/73 ,  H05H1/48

Abstract: 1,261,596. Discharge lamps. APPLIED RESEARCH LABORATORIES Inc. 16 June, 1969 [17 June, 1968], No. 30399/69. Heading H1D. Material to be analysed spectrochemically is injected through an inlet 24 into a gas flowing through a tube 26 along which an arc is maintained in a wall-stabilized state by dynamically cooling the tube. A working gas, e.g. argon is admitted through a port 16 to a chamber 10 having a window 14, e.g. of lithium fluoride and an outlet 12 cooled by liquid circulating in a passage 18 and serving as an anode between which and a cathode 30, e.g. a wire of 99% tungsten-1% thorium alloy, a wall-stabilized arc is maintained along the tube 26 which is cooled by liquid in a passage 27. The inlet 24 opens into a passage 22 in an insulating disc 20, e.g. of boron nitride. The material to be analysed may be a gas or submicron particles entrained in a carrier gas such as argon. An exhaust port 36 is provided. The arc may be struck by a high-voltage pulse or by a movable auxiliary electrode (not shown). In a modified arrangement (Fig. 2, not shown) for absorption analysis the passage 26 is extended to a second chamber similar to the chamber 10. A light source is mounted internally or externally of this second chamber.

公开(公告)号：CA864653A

公开(公告)日：1971-02-23

申请号：CA864653D

Applicant: APPLIED RES LAB

Inventor： NEUHAUS HERMANN

公开(公告)号：CA857404A

公开(公告)日：1970-12-01

申请号：CA857404D

Applicant: APPLIED RES LAB

Inventor： LIEBL HELMUT J

公开(公告)号：GB1213534A

公开(公告)日：1970-11-25

申请号：GB5106668

申请日：1968-10-28

Applicant: APPLIED RES LAB INC

IPC: G01N23/225 ,  G01N27/62 ,  H01J37/252 ,  H01J49/14

Abstract: 1,213,534. Ion beam apparatus. APPLIED RESEARCH LABORATORIES Inc. 28 Oct., 1968 [30 Oct., 1967; 12 July, 1968], No. 51066/68. Heading H1D. In a method of chemical analysis by bombarding a material to be analysed with a beam of primary ions to sputter atoms of the material from its surface as secondary ions and mass spectrometrically analysing the secondary ions, the primary ions are ions which are chemically reactive with the material to be analysed under the conditions of bombardment, e.g. ions of C, N, O, F, Cl or I in order to increase the availability and stability of yield of ions for analysis particularly in comparison with the use of primary ions of one of the inert gases, e.g. A or Xe. Graphs are given showing ion output against time in respect of the bombardment of aluminium, zinc and stainless steel targets with positive atomic or molecular oxygen ions to produce aluminium ions, zinc ions and chromium, iron, nickel or silicon ions respectively. Also mentioned are targets of Ti, Si, Mg, Fe, Ag, Mo, C, W, Zr, Mn, Cr, Sn, Pb, Bi, Ni and Cu. The analysing instrument may comprise an ion microscope or ion probe system coupled to a mass spectrometer. The ion source for the primary ions comprises a duoplasmatron in which the aperture 90 in intermediate electrode 86 is offset slightly from coaxial alignment with the cathode 80-a favourable arrangement for the production of negative ions. The tubular cathode 80 has electron emissive material on its inner wall. The source also includes an anode plate 94 having its aperture aligned with the axis of the cathode 80 and fixed upon an iron plate 94, a tubular acceleration tube 108 and a shielding tube 110 which supported on a bellows assembly 112 for axial adjustment. Dynamic air cooling is provided by a fan 104. A constricting magnetic field between intermediate electrode 86 and anode 92 is produced by annular ceramic permanent magnets 114 mounted between iron plate 94 and an iron plate 116. The reactive element used in the source is preferably diluted with an inert carrier gas e.g. A or N.

公开(公告)号：DE1919880A1

公开(公告)日：1970-11-05

申请号：DE1919880

申请日：1969-04-18

Applicant: APPLIED RES LAB INC

Inventor： J LIEBL HELMUT

IPC: H01J37/22 ,  H01J37/252 ,  H01J37/256 ,  H01J49/14

公开(公告)号：FR2006648A1

公开(公告)日：1970-01-02

申请号：FR6912180

申请日：1969-04-18

Applicant: APPLIED RES LAB

IPC: G01Q10/04 ,  H01J27/02 ,  H01J37/317 ,  H01J37/252 ,  H01J49/14 ,  H01L21/265 ,  G01N23/00 ,  H05H5/00

Abstract: 1,259,505. Ion beam apparatus; solid state devices. APPLIED RESEARCH LABORATORIES Inc. 22 April, 1969 [22 April, 1968], No. 20517/69. Headings H1D and H1K. A specimen of an electrically insulating material, including poorly conductive materials such as semi-conductors, is bombarded with negatively charged ions of such an energy that they drive secondary electrons out of the specimen to remove charges at a rate to compensate fully for the charges carried to the surface of the specimen by the ions. This technique may be used to implant particles of atomic dimension into the insulating material, for example for making solid state electronic devices, or to sputter the insulating material. Alternatively, the insulating material may be analysed by mass spectrometrically analysing the sputtered secondary ions from the material. Preferably, the negatively charged ions are oxygen ions which may be extracted from a duoplasmatron source. The energy of the ions may be in the range of 1000 to 20,000 electron volts.

公开(公告)号：GB1145108A

公开(公告)日：1969-03-12

申请号：GB3441868

申请日：1966-10-04

Applicant: APPLIED RES LAB INC

IPC: H01J29/84 ,  H01J49/28

Abstract: 1,145,108. Particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965], No. 34418/68. Divided out of 1,145,108. Heading H1D. A particle dispensing sector lens such as an electric, spherically curved, toroidal condenser 12, is associated with an electric unipotential lens 10 to reduce the distance between the object and image planes and so increase the acceptance angle at the aperture diaphragm 40. The unipotential lens 10 comprises electrodes 34, 36, 38 and a set of deflection plates 32 is provided to adjust the direction and position of the particle beam. In another system a magnetic sector lens is associated with a unipotential lens on each side of the sector lens along the particle beam axis.

公开(公告)号：FR1508152A

公开(公告)日：1968-01-05

申请号：FR79474

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：FR1288587A

公开(公告)日：1962-03-24

申请号：FR860931

申请日：1961-05-05

Applicant: APPLIED RES LAB

IPC: G01N23/225 ,  H01J37/20 ,  H01J37/22 ,  H01J37/252

公开(公告)号：AU2006201513A1

公开(公告)日：2006-12-07

申请号：AU2006201513

申请日：2006-04-11

Applicant: NAT APPLIED RES LAB NCHC

Inventor： HUANG KUEN-YU ,  JUAN PAUL

IPC: H05K5/06 ,  G03B17/08

Abstract: An underwater housing includes a housing body for containing an electronic device, a seal cap for sealing a rear end opening of the housing body, and a spacer member for dividing a space between the housing body and the seal cap into a cable chamber and an accommodating chamber. The seal cap includes an annular front cap element connected fixedly and sealingly to the housing body, and a rear cap element disposed fixedly and fittingly within the rear end of the front cap element. The rear cap element has a hole permitting an electrical cable to sealingly extend therethrough. The spacer member includes a spacer body disposed sealingly in said seal cap, and a plurality of conductive terminals extending sealingly through the spacer body and interconnecting electrically the electronic device and the electrical cable.