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公开(公告)号：KR1020150036840A
公开(公告)日：2015-04-08
申请号：KR1020130115701
申请日：2013-09-27
Applicant: 삼성전자주식회사
CPC classification number: G01T1/24 , G01N23/04 , G01T7/00 , H01L27/14676 , H01L27/14696 , H01L31/085
Abstract: 엑스선검출기및 이를포함한엑스선촬영장치를제공한다. 본엑스선검출기는서로이격배치되는캐소드전극과에노드전극, 캐소드전극과에노드전극사이에배치되며엑스선을흡수하여전하를발생시키는광전도층을포함하는검출부, 검출부의제1 면과접하며캐소드전극의온도를제어하는제1 온도제어부및 검출부의면 중제1 면과대면하는제2 면에접하며, 에노드전극의온도를제어하는제2 온도제어부를포함한다.
Abstract translation: 提供了一种X射线检测器和包括该X射线检测器的X射线摄影设备。 x射线检测器包括阴极和阳极，被布置成分离; 布置在阴极和阳极之间的检测部分，并且包括吸收x射线并产生电荷的光导层; 第一温度控制部分，与检测部分的第一表面接触，并控制阴极的温度; 以及第二温度控制部分，其与所述检测部件的表面之中的面向所述第一表面的第二表面接触，并且控制所述阳极的温度。
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公开(公告)号：KR1020070013136A
公开(公告)日：2007-01-30
申请号：KR1020050067520
申请日：2005-07-25
Applicant: 삼성전자주식회사
CPC classification number: G02F1/1309 , G01N21/88 , G09G3/006
Abstract: A method and an apparatus for judging inferiority of a display panel are provided to accurately judge inferiority of a display panel by detecting a gray scale difference between a brightness inferior part and an adjacent part. A pattern for detecting brightness inferiority is applied to a display panel and a brightness inferior part is detected through video processing(S100-S300). Brightness patterns in various gray scales are applied to the display panel(S400). The brightness of the brightness inferior part is compared with the brightness of an adjacent part to calculate gray scale of the brightness inferior part(S500-S700).
Abstract translation: 提供一种用于判断显示面板的劣势的方法和装置，以通过检测亮度下部和相邻部分之间的灰度差来准确地判断显示面板的劣势。 用于检测亮度劣化的图案被施加到显示面板，并且通过视频处理检测亮度劣化部分（S100-S300）。 将各种灰度级的亮度图案应用于显示面板（S400）。 亮度下降部分的亮度与相邻部分的亮度进行比较，以计算亮度劣化部分的灰度值（S500-S700）。
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公开(公告)号：KR1020010011037A
公开(公告)日：2001-02-15
申请号：KR1019990030232
申请日：1999-07-24
Applicant: 삼성전자주식회사
IPC: H05K3/34
CPC classification number: H05K1/0269 , B23K1/0016 , B23K2201/42 , G01N21/8806 , H05K3/3421
Abstract: PURPOSE: A solder testing method and an apparatus are provided to test a component body and a solder of a mounting component having a lead which is fixed on a PCB. CONSTITUTION: A ring illuminating device has upper and lower illuminating lamps which have different incidence angles toward a solder with respect to a plate surface of a PCB. A camera controls the upper illuminating lamp to illuminate the solder and photographs an area having the solder in a direction perpendicular to the plate surface of a PCB to obtain an upper illuminating image. A camera controls the upper illuminating lamp to illuminate the solder and photographs an area having the solder in a direction perpendicular to the plate surface of a PCB to obtain a lower illuminating image. A vision processor sets a location of a lead testing window on a screen corresponding to a testing area of the solder based on an outline of a component body in the upper illuminating image and estimates a good part of the solder based on the lower illuminating image.
Abstract translation: 目的：提供焊料测试方法和装置，以测试固定在PCB上的具有引线的安装部件的部件主体和焊料。 构成：环形照明装置具有相对于PCB的板表面具有与焊料不同的入射角的上下照明灯。 照相机控制上部照明灯照亮焊料，并且在垂直于PCB的板表面的方向上拍摄具有焊料的区域以获得上部照明图像。 照相机控制上部照明灯照亮焊料并且在垂直于PCB的板表面的方向上拍摄具有焊料的区域以获得较低的照明图像。 视觉处理器基于上部照明图像中的组件主体的轮廓，在与焊料的测试区域相对应的屏幕上设置引线测试窗口的位置，并且基于较低的照明图像估计焊料的很大一部分。
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公开(公告)号：KR100255861B1
公开(公告)日：2000-05-01
申请号：KR1019970044875
申请日：1997-08-30
Applicant: 삼성전자주식회사
IPC: H04N5/262
Abstract: PURPOSE: A method and apparatus for processing an input and output image using a plurality of look-up tables is provided to perform a plurality of processes different thereto in real time with respect to various areas of an inputted image. CONSTITUTION: A plurality of look-up tables(23) process an inputted image by different data, respectively. The number of look-up tables(23) is 2n(n=1,2,...) which is total storing cell number of a frame memory(24). The look-up tables(23) have each inherent number, and the numbers are stored in an intermediate memory(25). The intermediate memory(25) has a two dimensions storing area the size thereof is the same as the size of the frame memory(24), and stores n-bit data per each storing cell. The intermediate memory(25) stores look-up table number information of total 2n number for selecting minimum one look-up table out of the plurality of look-up tables(23) in accordance with the inputted image by information with respect to a using of a look-up table to each pixel of inputted image. If an image obtained by photographing an object by a camera(21) is inputted, the image is converted into a digital image by an analogue/digital converter(22).
Abstract translation: 目的：提供使用多个查找表来处理输入和输出图像的方法和装置，用于相对于输入图像的各个区域实时执行与其不同的多个处理。 构成：多个查找表（23）分别通过不同的数据处理输入的图像。 查找表（23）的数目是2n（n = 1,2，...），它是帧存储器（24）的总存储单元号。 查找表（23）具有每个固有数字，并且数字被存储在中间存储器（25）中。 中间存储器（25）具有其大小与帧存储器（24）的大小相同的二维存储区域，并且存储每个存储单元的n位数据。 中间存储器（25）根据输入的图像，根据关于使用的信息的信息，存储从多个查找表（23）中选择最小一个查找表的2n个号码的查找表号信息 对于输入图像的每个像素的查找表。 如果通过照相机（21）拍摄对象而获得的图像被输入，则通过模拟/数字转换器（22）将图像转换成数字图像。
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Patent Agency Ranking
公开(公告)号：KR1019990021339A
公开(公告)日：1999-03-25
申请号：KR1019970044875
申请日：1997-08-30
Applicant: 삼성전자주식회사
IPC: H04N5/262
Abstract: 각종 화상처리에 이용될 수 있는 입력 및 출력화상의 처리방법과 장치에 관한 것으로, 피사체를 촬상하는 카메라(21), 입력되는 화상에 대해 각기 다른 데이터로 처리하여 출력하는 복수의 룩업테이블(23), 복수의 룩업테이블을 선택하기 위한 정보를 저장하는 중간메모리(25), 선택된 룩업테이블에 의한 출력값을 저장하는 프레임메모리(24)로 구성한 장치를 사용하여, 입력화상에 대하여 처리할 화상영역에 맞는 복수의 룩업테이블중 적어도 하나를 선택, 그 화상영역을 목적에 맞게 처리한다. 이것은 화상의 실시간 처리를 위해 사용되는 룩업테이블을 복수 이용함으로써 하나의 화상에 여러 가지 이질적인 데이터가 분포된 경우의 다중화상처리를 가능하게 한다.
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公开(公告)号：KR1020150076365A
公开(公告)日：2015-07-07
申请号：KR1020130164130
申请日：2013-12-26
Applicant: 삼성전자주식회사
CPC classification number: A61B6/563 , A61B6/4233 , A61B6/488 , A61B6/544 , A61B6/566
Abstract: 본발명은상호통신가능한복수개의 X선검출모듈들중 적어도하나로부터획득된대상체의 X선데이터의전부또는일부를상기복수개의 X선검출모듈들에저장하기위한방법및 장치에관한것으로, 복수개의 X선검출모듈들중 적어도하나의 X선검출모듈을활성화하고, 활성화된 X선검출모듈을통하여 X선데이터를획득하고, 획득된 X선데이터의전부또는일부를활성화된 X선검출모듈이외의적어도하나의다른 X선검출모듈로전송하는방법및 장치를포함한다.
Abstract translation: 本发明涉及一种用于存储从能够彼此通信的多个X射线检测模块中的至少一个获得的物体的X射线数据的全部或一部分的方法和装置， X射线检测模块。 激活X射线检测模块中的至少一个X射线检测模块，通过激活的X射线检测模块获得X射线数据，并且将所获得的X射线数据的全部或部分至少发送到 除了激活的X射线检测模块之外的一个X射线检测模块。
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公开(公告)号：KR1020150039272A
公开(公告)日：2015-04-10
申请号：KR1020130117587
申请日：2013-10-01
Applicant: 삼성전자주식회사
Abstract: X선검출기및 X선검출기를포함하는 CT 시스템이개시된다. 개시된 X선검출기는반도체층의양쪽에각각형성된애노드전극및 캐소드전극을포함할수 있으며, 캐소드전극이형성된반도체의제 1면은애노드전극이형성된반도체의제 2면에비해광 조사에따른표면포텐셜값의변화가큰 면일수 있다.
Abstract translation: 公开了包括x射线检测器的x射线检测器和CT系统。 所公开的X射线检测器包括分别形成在半导体层的两侧的阳极和阴极，并且其中形成阴极的半导体的第一表面是与光辐射相比表面电势变化大的表面 形成阳极的半导体的第二表面。
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