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31.发明公开SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROPERTIES IN SINGLE AND MULTILAYER OBJECTS 审中-公开系统和方法检测和INTERFASZIALEN单层和多层对象的属性测量
公开(公告)号：EP2488849A4
公开(公告)日：2014-04-23
申请号：EP10823999
申请日：2010-10-13
Applicant: PICOMETRIX LLC
Inventor： WHITE JEFFREY S , FICHTER GREGORY D , DULING IRL , ZIMDARS DAVID
CPC classification number: G01N21/3586 , G01N19/04 , G01N21/3581 , G01N29/04 , G01N29/11 , G01N29/48
Abstract: A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device digitizes the electromagnetic radiation to yield waveform data. The waveform data represents the radiation reflected by or transmitted though the sample. The material property to be determined is generally the adhesive strength between the first and second layers.
Abstract translation: 一种用于确定性的采矿系统中在材料特性的第一层和第二层之间接口包括发射器输出婷电磁辐射到样品中，一个接收器接收电磁辐射做了什么反射由式或反式mitted虽然样品，和数据采集装置。 该数据获取装置数字化的电磁辐射，以产生波形数据。 darstellt辐射的波形数据由反射式或反式mitted虽然样品。 材料特性是决定性开采是基因反弹第一层和第二层之间的粘合强度。
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32.发明公开SYSTEM AND METHOD REDUCING FIBER STRETCH INDUCED TIMING ERRORS IN FIBER OPTIC COUPLED TIME DOMAIN TERAHERTZ SYSTEMS 审中-公开系统和方法减轻压力通过太赫兹系统光纤提请定时误差与光纤耦合时域
公开(公告)号：EP2425218A4
公开(公告)日：2013-03-20
申请号：EP10770198
申请日：2010-04-27
Applicant: PICOMETRIX LLC
Inventor： ZIMDARS DAVID
CPC classification number: G01J3/02 , G01J3/0218 , G01J3/0297 , G01J3/42 , G01N21/3581 , G01N21/3586 , G02B6/4206
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