SPECTROPHOTOMETER
    31.
    发明专利

    公开(公告)号:JPH04301527A

    公开(公告)日:1992-10-26

    申请号:JP6514391

    申请日:1991-03-29

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To detect an operating origin of each of a light source switching mechanism, a high-degree light cutting filter switching mechanism and a diffraction grating rotating mechanism with high accuracy, by detecting the maximal value of the light projected from a spectroscope through interlocking control of the mechanisms. CONSTITUTION:When a stepping motor of a high-degree light, cutting filter switching mechanism 19 is fully rotated and held in this state, the position is set, as an operating origin of the mechanism 19. Subsequently, the mechanism 19 is driven and stopped at a position where a luminous flux passes through an opening of a filter part 6, so that a rough origin of a diffraction grating mechanism 18 is detected. A driving power source of the mechanism 18 is rotated up to the wavelength where two source lamps have sufficiently high energy, and one light source is turned ON. Then, a two source switching mechanism 20 is driven enough to swing a condenser mirror thereof once in the up-and-down direction and an angle when the output of a spectrophotometer becomes maximum is detected, thereby to obtain one operating origin of the two source switching mechanism 20. The other operating origin is determined in the same manner. Thereafter, each light source is turned ON, and the position in the vicinity of the wavelength where the 0-degree or line spectrum of the light source is projected is scanned, and the position where the output of the spectrophotometer becomes maximum is determined as an operating origin of the mechanism 18.

    REFLECTIVITY MEASURING APPARATUS
    32.
    发明专利

    公开(公告)号:JPH04130247A

    公开(公告)日:1992-05-01

    申请号:JP25306390

    申请日:1990-09-21

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To make it possible to condense incident light on a minute spot and to receive reflected light in excellent efficiency by combining the end parts of optical fiber bundles for projecting and receiving light into one bundle, and commonly using a condenser lens for projecting and receiving the light. CONSTITUTION:Both end parts of the bundle of a light projecting fiber B1 and the bundle of a light receiving fiber B2 on the side of a sample S are combined as one bundle. At this time, in the inner region H having the constant radius at the central part, the optical fibers of both fiber bundles for projecting and receiving light are uniformly mixed and arranged. The outer surface part J is surrounded by only the fiber B2 on the light receiving side. The fibers are made to face the sample S through a condenser lens L which is commonly used for projecting and receiving the light. Thus, the edge of the light projecting optical fiber bundle on the side of the sample S is concentrated in the region H, and the minute spot can be formed. The reflected light form the sample is irradiated into the region H. The light caused by the aberration of the condenser lens L is received with the outer surface part J. Therefore, the light can be condensed in the minute region, and the light receiving efficiency becomes excellent.

    INTEGRATING SPHERE DEVICE
    33.
    发明专利

    公开(公告)号:JPH03202750A

    公开(公告)日:1991-09-04

    申请号:JP34197989

    申请日:1989-12-29

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To facilitate adjustment of the size of luminous flux by providing the conjugate point of the outlet window of an integrating sphere in the longitudinal direction caused by a concave mirror in a sample chamber, and providing a luminous flux stop at the conjugate position. CONSTITUTION:The image of the output slit of a spectroscope in the lateral direction which is focused at the approximately central point of a sample chamber 1 is formed again at output windows 4 and 6 of an integrated sphere with concave mirrors M1 and M3. When the image of the output slit of the spectroscope in the lateral direction is formed at the center of the sample chamber 1, the image formed at the center of the sample chamber is long because the output slit of the spectroscope is long in general. The width of the image in the lateral direction is changed in proportion to the width of the slit by changing the width of the output slit. Since a luminous flux diaphragm 7 is located at the conjugate point of a mirror M1 of the R-side outlet window 4 of the integrating sphere in the longitudinal direction, the size of the luminous flux in the longitudinal direction at the outlet window 4 can be adjusted by diaphragm 7. Therefore, the lateral and longitudinal sizes of the cross section of the luminous flux can be changed readily in correspondence with the measuring purpose by adjusting the width of the output slit and the stopping size of the diaphragm 7.

    LONG-SIZED FILM CHECKING DEVICE
    34.
    发明专利

    公开(公告)号:JPH02115748A

    公开(公告)日:1990-04-27

    申请号:JP26880688

    申请日:1988-10-25

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To perform automatic measurement throughout in the lengthwise direction by providing a control means which drives a film winding means to sample the measured output of transmitted light or reflected light from a film at intervals of a prescribed winding length of the film. CONSTITUTION:A sample tape T led out from a roll core R is wound around a take-up shaft 3 having a revolving shaft parallel with a holding body 1 and is illuminated through the window of a film guide 4 by a light source. The light transmitted through the tape T passes the aperture of an aperture plate 5 and is made incident on the inside of an integrating sphere 6 through a light incident window Wi and is made incident on a measuring element from a light exit window Wo and is measured. When the end of the film T is detected, a film retaining plate 7 is operated to clip the end of the film T between this plate 7 and a receiver 8, and the film wound around a roll core R' is prevented from being rewound by its own elasticity and being loosened.

    WAVELENGTH SCANNING MECHANISM OF SPECTROSCOPE

    公开(公告)号:JPS61265538A

    公开(公告)日:1986-11-25

    申请号:JP10884285

    申请日:1985-05-20

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To simplify a wavelength scanning mechanism by enabling the continuation of a wavelength only by single change-over operation, by selecting either one of two sign bar mechanisms to connect the same to the drive shaft of a diffraction lattice. CONSTITUTION:Feed screws 1a, 1b are parallelly arranged to be driven by a common motor and the feed nuts 2a, 2b threaded with the screws 1a, 1b are driven mutually to opposite directions. Sign bars 4a, 4b are fixed to the drive shaft 3 of a diffraction lattice and an energizing means capable of energizing both righthand and lefthand rotations of the drive shaft 3 by selection is connected to said drive shaft 3. When the energizing means was set to lefthand rotation, one bar 4a is contacted with the corresponding nut 2a and revolved so as to follow the retraction thereof and, when said energizing means was set to righthand rotation, the bar 4b is contacted with the corresponding nut 2b and revolved so as to follow the retraction thereof. By this constitution, a scanning mechanism constituted so as to select the righthand and lefthand rotations of the energizing means in connection with the change-over of the diffraction lattices G1, G2 positioned on the drive shaft 3 is obtained.

    SWITCHING MECHANISM FOR DIFFRACTION GRATING OF SPECTROSCOPE

    公开(公告)号:JPS61251722A

    公开(公告)日:1986-11-08

    申请号:JP9405985

    申请日:1985-04-30

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To switch >=3 diffraction gratings easily with high accuracy by energiz ing a cam and a lever for locking in press-contacting directions and securing the engagement between the cam and lever. CONSTITUTION:A turntable 1 where diffraction gratings G1-G4 are fitted has a rotating part united with it as a cam and engages the lever 9 for locking. The turntable rotates in one direction, but the cam and locking lever 9 engages each other at specific positions of the respective diffraction gratings G1-G4 and the turntable is stopped from rotating in the opposite direction, so the diffraction gratings G1-G4 are positioned by the locking lever 9 and held there. At this time, a driving motor 6 couples elastically with the turntable 1 and is reversed where the lever 9 engages one of recesses N1-N4 to charge its driving force in an elastic coupling means. Consequently, there is no play in positioning, the positioning accuracy is high, and the precision required to switch the diffraction gratings G1-G4 is easily obtained.

    SPECTROPHOTOMETER
    37.
    发明专利

    公开(公告)号:JPS61148328A

    公开(公告)日:1986-07-07

    申请号:JP27133784

    申请日:1984-12-21

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To eliminate the need for a position detecting means for a microswitch, photoelectric switch and the like and an associated wiring, by detecting the position of a rotary disc equipped with filters for cutting high-order diffraction light utilizing a mark provided on the rotary disc and a photometer of a spectrophotometer. CONSTITUTION:A slit SL is provided on a projection 8 of a rotary disc 3 equipped with filters F1, F2... to cut high-order diffraction light. The wavelength from adiffraction grating G is fixed at a proper value and the light of a light source 1 passing through the diffraction grating G, a slit S2, the rotary disc 3 and a reference cell REF is detected with a photometer 1 driving the rotary disc 3 with a pulse motor M2 while a reference side voltage is read into a CPU 4 to be memorized into an RAM 6. The point of making slits SL and S2 coincide is detected to define the positions of filters F1, F2... with the point as origin.

    COLOR MEASURING DEVICE
    38.
    发明专利

    公开(公告)号:JPH10160573A

    公开(公告)日:1998-06-19

    申请号:JP33499796

    申请日:1996-11-29

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PROBLEM TO BE SOLVED: To obtain color distribution on a sample surface with irregularity. SOLUTION: By intermittently moving a sample table 21 in X-axis direction and simultaneously repeating spectrometry of the range in Y-axis direction with a light measuring component 10, color distribution on two-dimensional region on the upper surface of a sample 20 is provided. Next, by moving the sample table 21 under a distance measuring component 30, and by intermittently moving it in the X-axis or Y-axis direction during measuring distance, Z- coordinate of the surface of the sample 20 is provided. By comparing position data of the (X, Y, Z) coordinates with color distribution data, three-dimensional color distribution is calculated.

    SAMPLE PRETREATMENT METHOD
    39.
    发明专利

    公开(公告)号:JPH10132717A

    公开(公告)日:1998-05-22

    申请号:JP30705396

    申请日:1996-10-31

    Applicant: SHIMADZU CORP

    Abstract: PROBLEM TO BE SOLVED: To sufficiently agitate a sample with an agitator and, at the same time, to accurately preparatively isolate an extracted liquid phase only. SOLUTION: A reagent is dispensed to a specimen contained in a large- diameter container 38, and the specimen is agitated and kept to stand still. The agitation is performed by putting a nozzle 32 in the container 4 together with an agitator 34. After extraction is completed, a nozzle head 30 for preparative isolation of sample 30 is inserted into the sample in the container 38 and a sample is collected so that the sample can be collected as much as possible from the bottom layer and transferred to a small-diameter container 40. After the sample is kept in a standing still state, the nozzle 32 is put in the container 40 and a sample is collected only from the bottom layer 58 of the sample and sent to a spectrophotometer.

    40.
    发明专利
    失效

    公开(公告)号:JPH05240783A

    公开(公告)日:1993-09-17

    申请号:JP4177592

    申请日:1992-02-28

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To measure the spectral reflection factor even for small incident and reflection angles by splitting a measurement light flux into reflecting/ transmitting directions by means of a translucent mirror, again splitting the reflected light from a sample caused by one light flux by means of the translucent mirror, and measuring one light flux among them. CONSTITUTION:An integrating sphere 1 is installed in an A position, and a measurement light flux 2 is split into the reflected light 11 and the transmitted light by means of a translucent mirror 6 arranged at an angle of 45 degrees to the optical axis on an optical path. To the reflected light 11, a sample 4 or a reflection standard sample 5 is held perpendicularly to the light flux. The light flux incident perpendicularly on the sample 4 is reflected, again split into the reflected light and the transmitted light by means of the translucent mirror 6, the transmitted light among them is refracted by means of a reflecting mirror 7, and is introduced to the integrating sphere 1 to be measured. In this constitution, a spectral reflection factor of the light flux incident perpendicularly on the surface of the sample can be measured.

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