公开(公告)号：US09217714B2

公开(公告)日：2015-12-22

申请号：US14029700

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

IPC: G01N21/95

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

Abstract: Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到制品的表面上的光子发射器; 第一反射表面和第二反射表面，被配置为将光子反射到制品的表面上; 以及处理装置，被配置为处理来自对应于从物品的表面特征散射的光子的光子检测器阵列的信号。

公开(公告)号：US20150015991A1

公开(公告)日：2015-01-15

申请号：US14055802

申请日：2013-10-16

Applicant: Seagate Technology LLC

Inventor： Stephen Keith McLaurin ,  Weilu Xu

IPC: G11B5/596

CPC classification number: G11B5/746 ,  G11B5/855 ,  G11B17/028

Abstract: The embodiments disclose an orientation control bias point coupled to a magnetic index mark and having a bias point offset set at predetermined coordinates configured to substantially prevent concentricity run-out.

Abstract translation: 实施例公开了一种耦合到磁性指示标记并且具有设置在预定的坐标上的偏置点偏移的取向控制偏置点，其被配置为基本上防止同心度跳动。

公开(公告)号：US20140160481A1

公开(公告)日：2014-06-12

申请号：US14029700

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

IPC: G01N21/95

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

Abstract: Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到制品的表面上的光子发射器; 第一反射表面和第二反射表面，被配置为将光子反射到制品的表面上; 以及处理装置，被配置为处理来自对应于从物品的表面特征散射的光子的光子检测器阵列的信号。

公开(公告)号：US20140152804A1

公开(公告)日：2014-06-05

申请号：US14029725

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Travis William Grodt ,  Florin Zavaliche ,  Maissarath Nassirou ,  David M. Tung ,  Tchernio T. Boytchev ,  Stephen Keith McLaurin ,  Henry Luis Lott

IPC: G06K9/20

CPC classification number: G06T3/4069 ,  G06T7/0004 ,  G06T2207/10016 ,  G06T2207/30164

Abstract: Provided herein is an apparatus comprising a photon detecting array configured to take images of an article, and a mount configured to mount and translate the article in a direction by a sub-pixel distance. In some embodiments, the sub-pixel distance is based on a pixel size of the photon detecting array.

Abstract translation: 本文提供了一种装置，其包括被配置为拍摄物品的图像的光子检测阵列和被配置成沿着子像素距离的方向安装和平移物品的安装件。 在一些实施例中，子像素距离基于光子检测阵列的像素大小。

公开(公告)号：US20140098368A1

公开(公告)日：2014-04-10

申请号：US14032192

申请日：2013-09-19

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  David M. Tung ,  Florin Zavaliche ,  Stephen Keith McLaurin

IPC: G01N21/47

CPC classification number: G01N21/4738 ,  G01N21/95 ,  G01N2021/4764 ,  G01N2021/4792 ,  G01N2201/0635 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

公开(公告)号：US20140098364A1

公开(公告)日：2014-04-10

申请号：US14032187

申请日：2013-09-19

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  David M. Tung ,  Samuel Kah Hean Wong ,  Henry Luis Lott ,  Stephen Keith McLaurin ,  Maissarath Nassirou ,  Florin Zavaliche

IPC: G01N21/95

CPC classification number: G01N21/6456 ,  G01N21/47 ,  G01N21/63 ,  G01N21/64 ,  G01N21/8851 ,  G01N21/94 ,  G01N21/95 ,  G01N21/9501 ,  G01N21/9506 ,  G01N2021/8864 ,  G01N2201/06153 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。