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公开(公告)号：FR2006648A1
公开(公告)日：1970-01-02
申请号：FR6912180
申请日：1969-04-18
Applicant: APPLIED RES LAB
IPC: G01Q10/04 , H01J27/02 , H01J37/317 , H01J37/252 , H01J49/14 , H01L21/265 , G01N23/00 , H05H5/00
Abstract: 1,259,505. Ion beam apparatus; solid state devices. APPLIED RESEARCH LABORATORIES Inc. 22 April, 1969 [22 April, 1968], No. 20517/69. Headings H1D and H1K. A specimen of an electrically insulating material, including poorly conductive materials such as semi-conductors, is bombarded with negatively charged ions of such an energy that they drive secondary electrons out of the specimen to remove charges at a rate to compensate fully for the charges carried to the surface of the specimen by the ions. This technique may be used to implant particles of atomic dimension into the insulating material, for example for making solid state electronic devices, or to sputter the insulating material. Alternatively, the insulating material may be analysed by mass spectrometrically analysing the sputtered secondary ions from the material. Preferably, the negatively charged ions are oxygen ions which may be extracted from a duoplasmatron source. The energy of the ions may be in the range of 1000 to 20,000 electron volts.
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公开(公告)号：GB1145108A
公开(公告)日：1969-03-12
申请号：GB3441868
申请日：1966-10-04
Applicant: APPLIED RES LAB INC
Abstract: 1,145,108. Particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965], No. 34418/68. Divided out of 1,145,108. Heading H1D. A particle dispensing sector lens such as an electric, spherically curved, toroidal condenser 12, is associated with an electric unipotential lens 10 to reduce the distance between the object and image planes and so increase the acceptance angle at the aperture diaphragm 40. The unipotential lens 10 comprises electrodes 34, 36, 38 and a set of deflection plates 32 is provided to adjust the direction and position of the particle beam. In another system a magnetic sector lens is associated with a unipotential lens on each side of the sector lens along the particle beam axis.
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公开(公告)号：FR1508152A
公开(公告)日：1968-01-05
申请号：FR79474
申请日：1966-10-11
Applicant: APPLIED RES LAB INC
IPC: G01Q10/00 , G01Q30/06 , H01J29/58 , H01J37/05 , H01J37/252 , H01J37/256 , H01J49/02 , H01J49/14 , H01J49/20 , H01J49/28 , H01J49/30 , H01J49/32
Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.
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公开(公告)号：FR1288587A
公开(公告)日：1962-03-24
申请号：FR860931
申请日：1961-05-05
Applicant: APPLIED RES LAB
IPC: G01N23/225 , H01J37/20 , H01J37/22 , H01J37/252
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公开(公告)号：AU2006201513A1
公开(公告)日：2006-12-07
申请号：AU2006201513
申请日：2006-04-11
Applicant: NAT APPLIED RES LAB NCHC
Inventor： HUANG KUEN-YU , JUAN PAUL
Abstract: An underwater housing includes a housing body for containing an electronic device, a seal cap for sealing a rear end opening of the housing body, and a spacer member for dividing a space between the housing body and the seal cap into a cable chamber and an accommodating chamber. The seal cap includes an annular front cap element connected fixedly and sealingly to the housing body, and a rear cap element disposed fixedly and fittingly within the rear end of the front cap element. The rear cap element has a hole permitting an electrical cable to sealingly extend therethrough. The spacer member includes a spacer body disposed sealingly in said seal cap, and a plurality of conductive terminals extending sealingly through the spacer body and interconnecting electrically the electronic device and the electrical cable.
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Patent Agency Ranking
公开(公告)号：AU646072B2
公开(公告)日：1994-02-03
申请号：AU8325291
申请日：1991-08-07
Applicant: APPLIED RES LAB SA
Inventor： EASTGATE ALAN REUBEN , VOGEL WILFRIED
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公开(公告)号：FR2616932A1
公开(公告)日：1988-12-23
申请号：FR8708300
申请日：1987-06-16
Applicant: APPLIED RES LAB
Inventor： RUPP DANIEL
Abstract: Method of regulating the high-frequency electrical power delivered to a plasma torch in a spectroscopic analysis apparatus making it possible to produce a plasma flame with stable characteristics, characterised in that the high-frequency electrical power generator is slaved to the measurement of a light intensity emitted by this same plasma. According to requirements, this slaving is carried out on the basis of the total intensity of the plasma light, or of a discrete spectral line or of a line generated by a supporting gas or by a solvent or by a trace element.
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38.发明专利
公开(公告)号：FR2590979A1
公开(公告)日：1987-06-05
申请号：FR8517981
申请日：1985-12-02
Applicant: APPLIED RES LAB
Inventor： VOGEL WILFRIED
Abstract: The device comprises, opposite the secondary slit 5 and on the path of the signal coming from the dispersive element 4, means for deflecting this signal, which means may jump quasi-simultaneously from one state in which the signal is not deflected into a state in which the signal is deflected. The deflection means consist of a transparent plate 7 with parallel faces, made for example of quartz, this plate being movable and capable of tilting quasi-simultaneously between two extreme positions, one of these two positions corresponding to a deviation with respect to the normal by an angle theta chosen as a function of the deflection of the desired signal. The device may comprise several secondary slits 5 each fitted with their quartz plates 7. This then constitutes a polychromator.
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公开(公告)号：DE3244164A1
公开(公告)日：1984-05-30
申请号：DE3244164
申请日：1982-11-29
Applicant: APPLIED RES LAB SA
Inventor： SLICKERS KARL
IPC: G01N21/67
Abstract: Contents of elements in metals, e.g. aluminum in steel, which are present as a total quantity in an elemental/dissolved form and in a non-elemental or separated form, are determined by sparking the surface of the metal under an inert atmosphere. The spectral signal is simultaneously measured as a function of time, and a signal is obtained which initially exhibits an intensity peak, from which the non-elemental or separated element content can be concluded, and the signal then stabilizes at a stationary value from which the total content (Ct) of element can be concluded. The elemental/dissolved proportion (Cs) can be concluded from the total area (P1) below the peak, from the area (P2) under the stationary intensity measured over a time (t2-t1) and from the total content (Ct).
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公开(公告)号：DE2814058A1
公开(公告)日：1979-01-04
申请号：DE2814058
申请日：1978-03-31
Applicant: APPLIED RES LAB
Inventor： LINDBLOM PETER PROF
Abstract: To eliminate astigmatism and coma in a spectrograph the distance between the entrance slot and a first concave mirror, as well as the relative angular positions of the entrance slot, the plane grating, the two concave mirrors and the focal plane are selected so as to satisfy the following conditions. +TR
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