公开(公告)号：US11796579B2

公开(公告)日：2023-10-24

申请号：US16649884

申请日：2018-09-25

Applicant: UNIVERSIDAD DEL PAÍS VASCO/EUSKAL HERRIKO UNIBERTSITATEA ,  AGENCIA ESTATAL CONSEJO SUPERIOR DE INVESTIGACIONES CIENTÍFICAS ,  UNIVERSITY OF JYVÄSKYLÄ

Inventor： Fernando Sebastian Bergeret Sbarbaro ,  Francesco Giazotto ,  Tero Heikkilä ,  Ilari Maasilta

IPC: G01R29/08 ,  G01J5/20 ,  H10N60/10 ,  H01F1/00 ,  H01F1/147

CPC classification number: G01R29/0878 ,  G01J5/20 ,  H10N60/10 ,  G01J2005/208 ,  H01F1/0018 ,  H01F1/14708

Abstract: An electromagnetic sensor for use in a variety of applications requiring extremely high sensitivity, such as measuring power and characteristics of incident electromagnetic radiation includes a superconducting layer that carries an exchange field for providing a spin splitting effect of charge carriers in the superconducting layer, a metal electrode, and an insulating layer arranged between the superconducting layer and metal electrode to form a spin filter junction therebetween. The electromagnetic sensor provides an antenna including a wave collecting element, in contact with the superconducting layer to convey thereinto external electromagnetic waves that are generated by an external source. An electric measurement device provides an output signal responsive to the amplitude and frequency of the external electromagnetic waves, and contacts the metal electrode to measure an electric current or voltage caused by the spin splitted charge carrier flow from the superconducting layer through the spin filter junction into the metal electrode.

公开(公告)号：US09490112B2

公开(公告)日：2016-11-08

申请号：US14640257

申请日：2015-03-06

Applicant: Robert Francis McDermott, III ,  Joseph Robert Suttle

Inventor： Robert Francis McDermott, III ,  Joseph Robert Suttle

IPC: H01J49/02 ,  H01J49/40 ,  H01J49/00 ,  G01J5/20 ,  G01J1/44

CPC classification number: H01J49/025 ,  G01J2001/442 ,  G01J2005/208 ,  H01J49/0031 ,  H01J49/0036 ,  H01J49/022 ,  H01J49/40

Abstract: A system and method for characterizing incident ions are provided. The method includes positioning a transmission line detector to receive incident ions, the transmission line detector comprising a superconducting meandering wire defining a detection area for incident ions, and applying a bias current to the transmission line detector. The method also includes detecting a first signal produced in the transmission line detector due to an ion impacting the detection area, and detecting a second signal produced in the transmission line detector due to the ion impacting the detection area. The method further includes analyzing the first signal and the second signal to characterize the ion. In some aspects, the method further includes identifying a delay between the first signal and the second signal to determine, using the identified delay, a location of the ion on the detection area.

Abstract translation: 提供了表征入射离子的系统和方法。 该方法包括定位传输线检测器以接收入射离子，传输线检测器包括限定入射离子的检测区域的超导蜿蜒线，以及向传输线检测器施加偏置电流。 该方法还包括检测由于离子影响检测区域而在传输线检测器中产生的第一信号，以及检测由于离子影响检测区域而在传输线检测器中产生的第二信号。 该方法还包括分析第一信号和第二信号以表征离子。 在一些方面，所述方法还包括识别所述第一信号和所述第二信号之间的延迟，以使用所识别的延迟来确定所述检测区域上的所述离子的位置。

公开(公告)号：US20160290868A1

公开(公告)日：2016-10-06

申请号：US15035182

申请日：2014-11-04

Applicant: THE UNIVERSITY OF WARWICK ,  VTT TECHNICAL RESEARCH CENTRE OF FINLAND

Inventor： David Gunnarsson ,  Evan Parker ,  Martin Prest ,  Mika Prunnila ,  Terence Whall

IPC: G01J5/04 ,  G01J5/02 ,  G01J5/20 ,  H01L39/22 ,  H01L31/09

CPC classification number: G01J5/046 ,  G01J5/024 ,  G01J5/20 ,  G01J2005/106 ,  G01J2005/208 ,  H01L31/09 ,  H01L39/22 ,  H01L39/24

Abstract: A bolometer is described. A bolometer includes a superconductor-insulator-semiconductor-superconductor structure or a superconductor-insulator-semiconductor-insulator-superconductor structure. The semiconductor comprises an electron gas in a layer of silicon, germanium or silicon-germanium alloy in which valley degeneracy is at least partially lifted. The insulator or a one or both of the insulators may comprise a layer of dielectric material. The insulator or a one or both of the insulators may comprise a layer of non-degenerately doped semiconductor.

Abstract translation: 描述了测辐射热谱仪。 测辐射热计包括超导体 - 绝缘体 - 半导体 - 超导体结构或超导体 - 绝缘体 - 半导体 - 绝缘体 - 超导体结构。 半导体包括硅，锗或硅 - 锗合金层中的电子气，其中谷简并性至少部分地被提升。 绝缘体或一个或两个绝缘体可以包括电介质材料层。 绝缘体或一个或两个绝缘体可以包括非简并掺杂的半导体层。

公开(公告)号：US20130143744A1

公开(公告)日：2013-06-06

申请号：US13646439

申请日：2012-10-05

Applicant: Massachusetts Institue of Technology

Inventor： Francesco Marsili ,  Karl K. Berggren

IPC: H01L31/107 ,  G06F17/50 ,  H01L39/02

CPC classification number: H01L31/107 ,  G01J1/4228 ,  G01J5/20 ,  G01J2001/442 ,  G01J2001/4446 ,  G01J2005/208 ,  G06F17/5072 ,  H01L39/02 ,  H01L39/10

Abstract: A superconducting nanowire avalanche photodetector (SNAP) with improved high-speed performance. An inductive element may be coupled in series with at least two parallel-coupled nanowires. The nanowires may number 5 or fewer, and may be superconducting and responsive to even a single photon. The series inductor may ensure current diverted from a photon-absorbing nanowire propagates to other nanowires and become amplified. The series inductance may be less than 10 times the nominal inductance per nanowire, and may also be larger than a minimum inductance to avoid spurious outputs in response to a photon absorption. The series inductance may be configured to achieve a desired tradeoff between SNAP reset time and spurious outputs. For example, the series inductance may be configured achieve minimum reset time or maximum bias margin, subject to user-defined constraints. By appropriately configuring the series inductance, a systematic method of designing improved SNAPs may be provided.

Abstract translation: 超导纳米线雪崩光电探测器（SNAP）具有改进的高速性能。 电感元件可以与至少两个平行耦合的纳米线串联耦合。 纳米线可以是5或更少，并且可能是超导的并且甚至对单个光子有反应。 串联电感器可以确保从光子吸收纳米线转移的电流传播到其他纳米线并​​变得放大。 串联电感可以小于每纳米线的标称电感的10倍，并且还可以大于最小电感以避免响应于光子吸收的杂散输出。 串联电感可以被配置为实现SNAP复位时间和杂散输出之间的期望权衡。 例如，串联电感可以被配置为实现最小复位时间或最大偏置裕度，受用户定义的限制。 通过适当地配置串联电感，可以提供设计改进的SNAP的系统方法。

公开(公告)号：KR101424651B1

公开(公告)日：2014-08-01

申请号：KR1020130015824

申请日：2013-02-14

Applicant: 한국표준과학연구원

Inventor： 김봉학 ,  유용심 ,  박승남

IPC: G01J5/00 ,  G01J5/10 ,  G01K15/00 ,  D02J13/00

CPC classification number: G01J5/46 ,  D02J13/003 ,  G01J5/20 ,  G01J2005/208 ,  G01K15/002

Abstract: Provided is a non-contact type thermometer calibration device, comprising: an oven having a non-contact type thermometer to be calibrated therein to adjust an internal atmosphere temperature; a temperature reference plate mounted in the oven to adjust the temperature; a chiller to provide the temperature reference plate with a coolant; and a calibration processing unit to extract a characteristic curve of a thermoelectric element by radiant heat induced by a difference between the temperature (CT1) of a hot contact plate of the non-contact type thermometer and the temperature (CT3) of the temperature reference plate, wherein the non-contact type thermometer is mounted to face one surface of the temperature reference plate.

Abstract translation: 本发明提供一种非接触型温度计校准装置，其特征在于，包括：具有校准用于调节内部气氛温度的非接触式温度计的烘箱; 安装在烤箱中的温度参考板来调节温度; 冷却器，用于向温度参考板提供冷却剂; 以及校准处理单元，其通过由非接触式温度计的热接触板的温度（CT1）与温度参考板的温度（CT3）之间的差引起的辐射热来提取热电元件的特性曲线 其特征在于，所述非接触式温度计安装在所述温度基准板的一个面上。