Abstract:
PROBLEM TO BE SOLVED: To provide a quantum efficiency measuring method which can reduce the error resulting from re-excitation (secondary excitation) during measurement of quantum efficiency, a quantum efficiency measuring apparatus, and an integrator made to face the apparatus.SOLUTION: The optical measurement apparatus includes a spectroscopic measurement device 50, an incidence-side fiber 20 for propagating light to be measured, a hemispherical part 1 having a light diffuse reflection layer 1a on its inner wall, and a plane part 2 disposed to close an opening of the hemispherical part 1 and having a mirror reflection layer 2a located to face the inner wall of the hemispherical part 1. The plane part 2 includes an incidence window 5 for directing the light emitted thorough the incidence-side fiber 20 into an integrating space formed by the hemispherical part 1 and the plane part 2, and an emission-side fiber 30 for propagating the light in the integrating space to the spectroscopic measurement device 50 through an emission window 6.
Abstract:
PURPOSE:To enable to appropriately obtain a total spectro RF even if a fluorescent color is contained, by a method wherein a spectro reflection refelectance factor (RF) of a sample is measured in a reflection measuring manner, and a spectro fluorescence RF is measured in an radiation measuring manner. CONSTITUTION:A mirror 6 reflects a light from a light source 1 through a lens 2, a slit 4, and a concave diffraction grating 5, and the light enters into an integrating sphere 8 through the diffraction trating 5, the slit 4, and a half mirror 3 again. The light, which disperses in the integrating sphere 8 and is reflected in a stream line direction of a sample 9, disperses at a concave diffraction grating 12 through a half mirror 10 and a slit 11, and is inputted to a light-receiving element group 13. After the relative spectro sensitivity of the light-receiving element group 13 is found, a standard white plate, containing no fluorescent color, is placed at a sample surface 9 of the integrating sphere 8 to find a spectro distribution. Then, after the spectro distribution is measured on the sample surface 9, a light-shielding plate 7 is placed in front of the mirror 6, and a measurement takes place as the light is shielded in order from a short wavelength side of a spectrum. Processing of the data by means of a signal processing part 35 permits obtaining of a total spectro RF of the sample.
Abstract:
PURPOSE:To detect fluorescence surely by subtracting fluorescence intensity from the apparent reflected light intensity in the wavelength of lighting light of reflected light spectra and calculating a spectral reflected radiance factor and a spectral fluorescence radiance factor. CONSTITUTION:The device consits of a lighting spectroscope M1 and a reflection spectroscope M2. In the spectroscope M2, a multichannel photometric element D is disposed along the spectral image plane, and the operation of interpolating the fluorescence intensity at the wavelength of lighting light from the reflected light spectra of a sample Sm is accomplished at every wavelength in the wavelength scanning of the spectroscope M1. The interpolated fluorescence intensity is subtracted from the apparent reflected light intensity at the lighting light wavelength of the reflected light spectra in an arithmetic circuit. The fluorescence intensity is divided by the ratio of the wavelength width of the spectroscope M2 to the wave- length width of the spectroscope M1. An arithmetic circuit calculating a spectral reflection radiance factor and a spectral fluorescence radiance factor from these two is provided.
Abstract:
PURPOSE:To provide data for enable more accurate color reproduction to a field of color printing, by measuring optical density having a clear colorimetric definition. CONSTITUTION:The reflected light of a specimen is incident to a spectroscope 18 through a pervious specimen chamber 16 by the light from a light source 14. The spectroscope 18 divides the reflected light into lights classified by wavelength component through a diffraction lattice 19 to allow said lights to irradiate a photodiode array 20. The reflectivity at every wavelength received by the photodiode array 20 is inputted to an operation circuit 21 and three stimulation values X, Y, Z are calculated according to JISZ8722. Further, the operation circuit 21 calculates the density value of each color from three stimulation values X, Y, Z according to a specific formula.
Abstract:
In one embodiment, an apparatus for measuring a color of a non-solid colored sample includes an integrating sphere having a sensor port, a sample port, and a plurality of registration marks affixed to an interior surface of the integrating sphere, outside a periphery of the sample port, a camera positioned near the sensor port, and a plurality of filters positioned between the integrating sphere and camera. An optical axis of the camera extends from the camera, through at least one of the plurality of filters, through the sensor port, to the sample port.