公开(公告)号：US09551618B2

公开(公告)日：2017-01-24

申请号：US14417618

申请日：2013-07-25

Applicant: HORIBA JOBIN YVON SAS

Inventor： Olivier Acher ,  Simon Richard ,  Thanh-Liem Nguyen

IPC: G01J4/00 ,  G01J4/02 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J4/04

Abstract: An accurate and robust wavefront-division polarimetric analysis method and device, allows the quasi-instantaneous measurement of the polarization states of a luminous object. The device can be used to produce a plurality of light beams, all polarized according to different polarization states, from a single upstream light beam. The polarized light beams, which do not overlap and which carry information items that are complementary in terms of polarization, are analyzed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing elements digitally process the luminous intensity values obtained in order to determine the polarization state of the upstream light beam. The operations performed by the processing elements prevent luminous intensity variations in the split light beams during the division of the wavefront of the upstream light beam. Therefore, the wavefront-division polarimetric analysis device is robust and its accuracy is not hindered by the experimental conditions.

Abstract translation: 准确可靠的波前分割偏振分析方法和装置允许准瞬时测量发光物体的偏振状态。 该装置可用于从单个上游光束产生根据不同极化状态全部偏振的多个光束。 通过测量每个光束的发光强度的多个检测器同时分析不重叠并且携带在极化方面互补的信息项的偏振光束。 处理元件对获得的发光强度值进行数字处理，以确定上游光束的偏振状态。 由处理元件执行的操作防止在上游光束的波前划分期间分束光束的发光强度变化。 因此，波前分割极化分析装置是鲁棒的，其精度不受实验条件的影响。

公开(公告)号：US20150263303A1

公开(公告)日：2015-09-17

申请号：US14645882

申请日：2015-03-12

Applicant: North Carolina State University

Inventor： Michael Kudenov ,  Brendan O'Connor ,  Omar Awartani

IPC: H01L51/44 ,  H01L51/00

CPC classification number: H01L27/305 ,  G01J4/02 ,  G02B27/28 ,  H01L27/301

Abstract: Polarization sensitive devices utilizing stacked organic and inorganic photovoltaics and related methods are disclosed. According to an aspect, a polarization sensitive photovoltaic (PV) cell may include an anode, a cathode, and a photoactive layer and a polarizing structure between the anode and the cathode. The photoactive layer may be formed from inorganic or organic materials. The polarizing structure may be integrated with the photoactive layer. Two or more PV cells may be stacked along an axis to form a polarization sensitive device such as, for example, a polarimeter.

Abstract translation: 公开了利用堆叠有机和无机光伏的偏振敏感器件及相关方法。 根据一个方面，偏振敏感光伏（PV）电池可以包括在阳极和阴极之间的阳极，阴极和光敏层以及偏振结构。 光活性层可以由无机或有机材料形成。 偏振结构可以与光活性层一体化。 两个或更多个PV电池可以沿轴线堆叠以形成偏振敏感器件，例如偏振计。

公开(公告)号：US20130010295A1

公开(公告)日：2013-01-10

申请号：US13636983

申请日：2011-03-04

Applicant: Nir Davidson ,  Asher Friesem ,  Moti Fridman

Inventor： Nir Davidson ,  Asher Friesem ,  Moti Fridman

IPC: G01J4/00

CPC classification number: G01J4/04 ,  G01J4/02

Abstract: A system and method are presented for use in measuring polarization of an optical beam. The system is configured and operable for determining polarization profile along a cross section of the input optical beam, and comprises an optical system and a pixel matrix. The optical system comprises a polarization beam splitting assembly configured and operable for splitting said input optical beam into a predetermined number of beam components with a predetermined polarization relation between them, the polarization beam splitting assembly comprising a first polarization beam splitter in an optical path of the input optical beam splitting said input optical beam into a first plurality of beam components with a certain polarization relation between them and a birefringent element in an optical path of said first plurality of the beam components for splitting each of them into a pair of beams having ordinary and extraordinary polarizations, thereby producing said predetermined number of output beam components. The pixel matrix is located in substantially non intersecting optical paths of said output beam components and generates a corresponding number of output data pieces indicative of intensity distribution within said output beam components, respectively, data contained in said data pieces being indicative of the polarization profile along the cross section of the input optical beam.

Abstract translation: 提出了一种用于测量光束偏振的系统和方法。 该系统被配置和操作用于沿着输入光束的横截面确定偏振分布，并且包括光学系统和像素矩阵。 光学系统包括偏振分束组件，其被配置和可操作用于将所述输入光束分成具有预定偏振关系的预定数量的光束分量，所述偏振分束组件包括位于所述第一偏振分束器的光路中的第一偏振分束器 输入光束将所述输入光束分解成在它们之间具有一定偏振关系的第一多个光束分量和在所述第一多个光束分量的光路中的双折射元件，以将它们中的每一个分成具有普通的一对光束 和非常极化，从而产生所述预定数量的输出光束分量。 像素矩阵位于所述输出光束分量的基本上非相交的光路中，并且分别产生指示所述输出光束分量内的强度分布的相应数量的输出数据段，所述数据段中包含的数据表示沿着 输入光束的横截面。

公开(公告)号：US07064828B1

公开(公告)日：2006-06-20

申请号：US10027940

申请日：2001-12-19

Applicant: Pablo I. Rovira ,  Lars Markwort

Inventor： Pablo I. Rovira ,  Lars Markwort

IPC: G01J4/00

CPC classification number: G01N21/211 ,  G01J3/447 ,  G01J4/02 ,  G01N2021/213

Abstract: A metrology device, such as an ellipsometer, includes a light source that produces a pulsed electromagnetic beam, such as a flash bulb or pulsed laser, and a spatially dependent polarizing element that introduces a spatially dependent retardation in the light beam. The use of a pulsed light source is advantageous over a continuous light source, as a pulsed light source generates less heat, is stronger, lasts longer, and does not need the use of a mechanical shutter. The use of a spatially dependent polarizing element advantageously eliminates the use of temporally dependent moving polarization modulation elements, thereby allowing the use of a pulsed light source. Downstream of the spatially dependent polarizing element are the analyzer and a multi-element detector that may be synchronized with the pulsed electromagnetic beam to detect after one or several pulses of light have been emitted from the pulsed light source.

Abstract translation: 诸如椭圆计的计量装置包括产生诸如闪光灯泡或脉冲激光器的脉冲电磁波束的光源和在光束中引入空间上相关的延迟的空间依赖的偏振元件。 脉冲光源的使用优于连续光源，因为脉冲光源产生较少的热量，更强烈，持续更长时间，并且不需要使用机械快门。 使用空间依赖的偏振元件有利地消除了使用时间上依赖的移动偏振调制元件，从而允许使用脉冲光源。 空间依赖的偏振元件的下游是分析仪和多元素检测器，其可以与脉冲电磁波束同步，以在从脉冲光源发射一个或几个脉冲之后进行检测。

公开(公告)号：US06734968B1

公开(公告)日：2004-05-11

申请号：US09298007

申请日：1999-04-22

Applicant: Haiming Wang ,  Patrick M. Maxton ,  Kenneth C. Johnson ,  Mehrdad Nikoonahad

Inventor： Haiming Wang ,  Patrick M. Maxton ,  Kenneth C. Johnson ,  Mehrdad Nikoonahad

IPC: G01N2121

CPC classification number: G01J4/02 ,  G01J3/447 ,  G01N21/21

Abstract: Two phase modulators or polarizing elements are employed to modulate the polarization of an interrogating radiation beam before and after the beam has been modified by a sample to be measured. Radiation so modulated and modified by the sample is detected and up to 25 harmonics may be derived from the detected signal. The up to 25 harmonics may be used to derive ellipsometric and system parameters, such as parameters related to the angles of fixed polarizing elements, circular deattenuation, depolarization of the polarizing elements and retardances of phase modulators. A portion of the radiation may be diverted for detecting sample tilt or a change in sample height. A cylindrical objective may be used for focusing the beam onto the sample to illuminate a circular spot on the sample. The above-described self-calibrating ellipsometer may be combined with another optical measurement instrument such as a polarimeter, a spectroreflectometer or another ellipsometer to improve the accuracy of measurement and/or to provide calibration standards for the optical measurement instrument. The self-calibrating ellipsometer as well as the combined system may be used for measuring sample characteristics such as film thickness and depolarization of radiation caused by the sample.

公开(公告)号：US2880648A

公开(公告)日：1959-04-07

申请号：US70634157

申请日：1957-12-31

Applicant: AMERICAN OPTICAL CORP

Inventor： KOESTER CHARLES J

IPC: G01J4/02

CPC classification number: G01J4/02

公开(公告)号：US2829555A

公开(公告)日：1958-04-08

申请号：US24059851

申请日：1951-08-06

Applicant: KESTON ALBERT S

Inventor： KESTON ALBERT S

IPC: G01J4/02

CPC classification number: G01J4/02

公开(公告)号：WO2015002708A2

公开(公告)日：2015-01-08

申请号：PCT/US2014/039778

申请日：2014-05-28

Applicant: THE ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA

Inventor： PAU, Stanley ,  HSU, Wei-Liang

IPC: G02F1/1337

CPC classification number: H01L51/5281 ,  G01J4/02 ,  G02B5/3016 ,  G02F1/133528

Abstract: Exemplary thin-film optical devices have first and second layer groups disposed as a layer stack on a substrate. The first layer group comprises a first PPN layer, a first LCP layer, and a first barrier layer all superposed. The second layer group is superposed relative to the first layer group, and includes a second PPN layer, a second LCP layer, and a second barrier layer all superposed. The first and second layer groups cooperate to polarize multiple wavelengths of an incident light flux in a broadband and/or wide-angle manner. Each of the layer groups has an alignment layer, a respective liquid-crystal polymer layer, and a barrier layer.

Abstract translation: 示例性薄膜光学器件具有在衬底上作为层堆叠设置的第一和第二层组。 第一层组包括全部叠加的第一PPN层，第一LCP层和第一阻挡层。 第二层组相对于第一层组重叠，并且包括全部叠加的第二PPN层，第二LCP层和第二阻挡层。 第一和第二层组协作以宽带和/或广角方式偏振入射光通量的多个波长。 每个层组具有取向层，相应的液晶聚合物层和阻挡层。

公开(公告)号：WO2013034941A2

公开(公告)日：2013-03-14

申请号：PCT/HU2012000089

申请日：2012-09-05

Applicant: EOTVOS LORAND TUDOMANYEGYETEM ,  HORVATH GABOR ,  BARTA ANDRAS ,  SUHAI BENCE ,  HEGEDUES RAMON

Inventor： HORVATH GABOR ,  BARTA ANDRAS ,  SUHAI BENCE ,  HEGEDUES RAMON

IPC: G06T7/00 ,  G01N21/53 ,  G01W1/02

CPC classification number: G01J4/02 ,  G01W1/00 ,  G06T7/55 ,  G06T2207/10016 ,  G06T2207/10024 ,  G06T2207/30192

Abstract: The invention is a method for measuring cloud-base distance comprising the steps of taking linear polarization images of a sky-portion from essentially the same point of view and at essentially the same time by means of at least three linear polarizing filters with different transmission directions, selecting points equivalent to each other on the linear polarization images, determining a degree of linear polarization and a total intensity of an incident light beam arriving on the points equivalent to each other by means of the respective intensities of the points, and determining a relative cloud-base distance for the points equivalent to each other based on the degree of linear polarization and on the total intensity, as well as on a pre-determined degree of linear polarization and on a pre-determined total intensity belonging to a cloudless sky. Further, the invention is an apparatus for measuring polarization, comprising an optical device generating a light beam (34) from a sky-portion, an image recording device (24) capable of receiving the light beam (34) and taking an image thereof, at least three linear polarizing filters (26, 26', 26") with different transmission directions and the polarizing filters (26, 26', 26") are arranged affecting different parts of the light beam (34), which parts of the light beam are projected onto a common image recording device (24).

Abstract translation: 本发明是用于测量云基距离的方法，包括以下步骤：从基本上相同的观点和基本上相同的时间通过具有不同传输方向的至少三个线性偏振滤光片获取天空部分的线性偏振图像 选择在线性偏振图像上彼此相等的点，通过点的相应强度确定到达相当点的入射光束的线偏振程度和总强度，并确定相对值 基于线性极化程度和总强度以及预定的线性极化程度以及属于无云天空的预定总强度，彼此相当的点的云基距离。 此外，本发明是一种用于测量偏振的装置，包括从天空部分产生光束（34）的光学装置，能够接收光束（34）并拍摄其图像的图像记录装置（24） 具有不同透射方向的至少三个线性偏振滤光器（26,26'，26“）和偏振滤光器（26,26'，26”）被布置成影响光束（34）的不同部分，光的哪个部分 光束投射到公共图像记录装置（24）上。

公开(公告)号：WO01050100A2

公开(公告)日：2001-07-12

申请号：PCT/CA2001/000003

申请日：2001-01-04

IPC: G01J3/12 ,  G01J3/447 ,  G01J4/02 ,  G01J

CPC classification number: G01J3/12 ,  G01J3/447 ,  G01J4/02

Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG). Each of the linearly-polarized light beams is directed onto the diffraction grating with its linear state of polarization at any prescribed angle to a corresponding plane of diffraction of the diffraction grating. The arrangement is such that the state of polarization of the light beams, at any particular wavelength within an operating band of the analyzer remains substantially unchanged with respect to time. The analyzer also may have a reflector (RAM) for reflecting the light beams leaving the diffraction grating after diffraction a first time so as to return them to the diffraction grating for diffraction a second time.

Abstract translation: 光谱分析仪包括衍射光栅（DG），用于将输入光束分解成具有相互垂直的线偏振状态的第一和第二光束的偏振分解单元（PDM）和两个输出端口（FP2 / 1，FP2 / 2），每个用于在衍射光栅（DG）衍射之后从光栅接收基本上仅相应的一个偏振光束（LT，LR）。 每个线性偏振光束以与衍射光栅的相应衍射平面成任意规定角度的线性偏振态被引导到衍射光栅上。 该布置使得在分析仪的工作频带内的任何特定波长处的光束的偏振状态相对于时间保持基本上不变。 分析仪还可以具有用于在第一次衍射之后反射离开衍射光栅的光束的反射器（RAM），以便第二次将它们返回到衍射光栅以进行衍射。