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    Particle detector and method for producing such a detector
    32.
    发明授权
    Particle detector and method for producing such a detector 有权
    粒子检测器及其生产方法

    公开(公告)号：US09518909B2

    公开(公告)日：2016-12-13

    申请号：US14496072

    申请日：2014-09-25

    Applicant: Commissariat A l'Energie Atomique Et Aux Energies Alternatives

    Inventor： Sergio Nicoletti

    IPC: G01N21/00 ,  G01N15/02 ,  G01N15/14 ,  G01N21/53 ,  G01N15/06 ,  G01N15/00 ,  G01N21/47

    CPC classification number: G01N15/0211 ,  G01N15/06 ,  G01N15/1484 ,  G01N21/53 ,  G01N21/532 ,  G01N2015/0038 ,  G01N2021/4726 ,  G01N2201/06113 ,  G01N2201/0873

    Abstract: The invention relates to a particle detector including a substrate made of a semiconductor material, in which at least one through-cavity is formed, defined by an input section and an output section, wherein the input section thereof is to be connected to an airflow source, the substrate supporting: an optical means including at least one laser source, and at least one waveguide connected to the at least one laser source and leading into the vicinity of the output section of the cavity; and a photodetector located near the output section of the cavity and offset relative to the optical axis of the optical means.

    Abstract translation: 本发明涉及一种粒子检测器，其包括由半导体材料制成的衬底，其中形成有由输入部分和输出部分限定的至少一个通孔，其中输入部分将连接到气流源 所述基板支撑：包括至少一个激光源的光学装置和连接到所述至少一个激光源并且通向所述空腔的输出部分附近的至少一个波导; 以及位于腔的输出部分附近并相对于光学装置的光轴偏移的光电检测器。

    Reflective element for fiber optic sensor
    33.
    发明授权
    Reflective element for fiber optic sensor 有权
    光纤传感器的反射元件

    公开(公告)号：US08995798B1

    公开(公告)日：2015-03-31

    申请号：US14287361

    申请日：2014-05-27

    Applicant: Vibrosound Ltd

    Inventor： Alexander Paritsky ,  Alexander Kots ,  Yuvi Kahana

    IPC: G02B6/00 ,  G01D5/26 ,  G01K5/56

    CPC classification number: G02B5/09 ,  G01D5/268 ,  G01K5/56 ,  G01K5/62 ,  G01N21/47 ,  G01N2021/4709 ,  G01N2201/0873 ,  G01N2201/088 ,  G02B1/02 ,  G02B6/262

    Abstract: A reflective element for directing an optical signal into a fiber optic sensor having an optical fiber includes a plane containing a sharply defined straight line that separates between a first area of low reflectivity and a second area of high reflectivity. The plane is disposed parallel to a free end surface of the optical fiber so that the free end surface intersects the line of the reflective element, whereby relative movement between the free end surface of the optical fiber and the line in response to a physical change sensed by the fiber optic sensor induces variations in an optical signal reflected by the reflective element through the optical fiber, which variations allow measurement of the physical change.

    Abstract translation: 用于将光信号引导到具有光纤的光纤传感器中的反射元件包括包含在第一低反射率区域和高反射率的第二区域之间分离的明确限定的直线的平面。 平面平行于光纤的自由端面设置，使得自由端表面与反射元件的线相交，从而响应于感测到的物理变化而在光纤的自由端表面与线之间的相对运动 光纤传感器通过光纤引起反射元件反射的光信号的变化，这些变化允许测量物理变化。

    Broad band waveguide spectrometer
    35.
    发明授权
    Broad band waveguide spectrometer 失效
    宽带波导光谱仪

    公开(公告)号：US5446534A

    公开(公告)日：1995-08-29

    申请号：US27026

    申请日：1993-03-05

    Applicant: Don S. Goldman

    Inventor： Don S. Goldman

    IPC: G01J3/42 ,  G01N21/55 ,  G02B6/122 ,  G02B6/30 ,  G02B6/34 ,  G01N21/41

    CPC classification number: G01N21/31 ,  G01J3/0259 ,  G01J3/42 ,  G01N21/552 ,  G02B6/122 ,  G02B6/1228 ,  G02B6/30 ,  G02B6/34 ,  G01N2201/0873

    Abstract: A spectrometer for analyzing a sample of material utilizing a broad band source of electromagnetic radiation and a detector. The spectrometer employs a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source. The waveguide further includes a surface between the entry and exit portions which permits interaction between the electromagnetic radiation passing through the wave guide and a sample material. A tapered portion forms a part of the entry of the wave guide and couples the electromagnetic radiation emanating from the source to the waveguide. The electromagnetic radiation passing from the exit of the waveguide is captured and directed to a detector for analysis.

    Abstract translation: 用于使用宽带电磁辐射源和检测器分析材料样品的光谱仪。 光谱仪使用具有从源发出的电磁辐射的入口和出口的波导。 波导还包括入口部分和出口部分之间的表面，其允许穿过波导管的电磁辐射与样品材料之间的相互作用。 锥形部分形成波导入口的一部分，并将从源发出的电磁辐射耦合到波导。 从波导出口通过的电磁辐射被捕获并导向检测器进行分析。

    Optical spectrum analyzer
    36.
    发明授权
    Optical spectrum analyzer 失效
    光谱分析仪

    公开(公告)号：US5066126A

    公开(公告)日：1991-11-19

    申请号：US385746

    申请日：1989-07-18

    Applicant: Masami Hatori

    Inventor： Masami Hatori

    IPC: G01J1/42 ,  G01J3/00 ,  G01J3/12 ,  G02F1/11 ,  G02F1/125

    CPC classification number: G01J3/1256 ,  G01J3/0259 ,  G01J2001/4242 ,  G01N2201/0873

    Abstract: An optical spectrum analyzer includes a surface elastic wave generator for generating in an optical waveguide a surface elastic wave which has a continuously varying frequency and which diffracts and deflects a guided wave as it travels across the path of the guided wave, which guided wave is introduced as a measured light beam into and travels in the optical wave guide. The measured light beam which has been deflected is emitted from the optical waveguide and detected by a light detector. A modulator turns on and off or modulates the surface elastic wave by repeatedly energizing and de-energizing the surface elastic wave generator, the frequency of the modulation being lower than the continuously varying frequency. A filter receives a signal corresponding to the modulation frequency from the modulator and a signal corresponding to the measured light beam from the detector, and extracts a signal component having the same frequency as the modulation frequency from the signal received from the light detector. The frequency of the surface elastic wave is detected on the basis of the signal component extracted by the filler when the measured light beam is detected by the light detector.

    Abstract translation: 光谱分析仪包括：表面弹性波发生器，用于在光波导中产生具有连续变化频率的表面弹性波，并且当导波在导波的路径上行进时衍射和偏转导波，该引导波被引入 作为测量光束进入并在光波导中行进。 已经偏转的测量光束从光波导发射并由光检测器检测。 调制器通过反复激励和断开表面弹性波发生器，使调制频率低于连续变化的频率来打开和关闭或调制表面弹性波。 滤波器从调制器接收对应于调制频率的信号和对应于来自检测器的测量光束的信号，并从从光检测器接收的信号中提取具有与调制频率相同频率的信号分量。 当由光检测器检测到测量光束时，基于由填料提取的信号分量来检测表面弹性波的频率。

    SEMICONDUCTOR DEVICE FOR DETECTING FLUORESCENT PARTICLES
    40.
    发明公开
    SEMICONDUCTOR DEVICE FOR DETECTING FLUORESCENT PARTICLES 有权
    HALBLEITERBAUEMENTZUR DETEKTION FLUORESZIERENDER PARTIKEL

    公开(公告)号：EP3146312A1

    公开(公告)日：2017-03-29

    申请号：EP15724643.0

    申请日：2015-05-22

    Applicant: IMEC vzw

    Inventor： VAN DORPE, Pol ,  LAGAE, Liesbet ,  PEUMANS, Peter ,  STASSEN, Andim ,  HELIN, Philippe ,  DU BOIS, Bert ,  SEVERI, Simone

    IPC: G01N21/64

    CPC classification number: G01N21/6428 ,  G01N21/6454 ,  G01N21/648 ,  G01N21/7703 ,  G01N2201/0873

    Abstract: The present disclosure relates to semiconductor devices for detecting fluorescent particles. At least one embodiment relates to an integrated semiconductor device for detecting fluorescent tags. The device includes a first layer, a second layer, a third layer, a fourth layer, and a fifth layer. The first layer includes a detector element. The second layer includes a rejection filter. The third layer is fabricated from dielectric material. The fourth layer is an optical waveguide configured and positioned such that a top surface of the fourth layer is illuminated with an evanescent tail of excitation light guided by the optical waveguide when the fluorescent tags are present. The fifth layer includes a microfluidic channel. The optical waveguide is configured and positioned such that the microfluidic channel is illuminated with the evanescent tail. The detector element is positioned such that light from activated fluorescent tags can be received.

    Abstract translation: 本公开涉及用于检测荧光颗粒的半导体器件。 至少一个实施例涉及用于检测荧光标签的集成半导体器件。 该装置包括第一层，第二层，第三层，第四层和第五层。 第一层包括检测器元件。 第二层包括拒绝滤波器。 第三层由介电材料制成。 第四层是配置和定位的光波导，当存在荧光标签时，第四层的顶表面被由光波导引导的激发光的渐逝尾部照亮。 第五层包括微流体通道。 光波导被配置和定位成使得微流体通道被渐逝尾部照亮。 检测器元件被定位成使得能够接收来自激活的荧光标签的光。

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