公开(公告)号：AU646072B2

公开(公告)日：1994-02-03

申请号：AU8325291

申请日：1991-08-07

Applicant: APPLIED RES LAB SA

Inventor： EASTGATE ALAN REUBEN ,  VOGEL WILFRIED

IPC: B01D1/00 ,  B01D1/16 ,  G01N1/00 ,  G01N1/44 ,  G01N21/01 ,  G01N21/31 ,  G01N21/73 ,  G01N21/71

公开(公告)号：FR2616932A1

公开(公告)日：1988-12-23

申请号：FR8708300

申请日：1987-06-16

Applicant: APPLIED RES LAB

Inventor： RUPP DANIEL

IPC: G01N21/73 ,  G05F1/66 ,  G01J3/40

Abstract: Method of regulating the high-frequency electrical power delivered to a plasma torch in a spectroscopic analysis apparatus making it possible to produce a plasma flame with stable characteristics, characterised in that the high-frequency electrical power generator is slaved to the measurement of a light intensity emitted by this same plasma. According to requirements, this slaving is carried out on the basis of the total intensity of the plasma light, or of a discrete spectral line or of a line generated by a supporting gas or by a solvent or by a trace element.

公开(公告)号：FR2590979A1

公开(公告)日：1987-06-05

申请号：FR8517981

申请日：1985-12-02

Applicant: APPLIED RES LAB

Inventor： VOGEL WILFRIED

IPC: G01J3/06 ,  G01J3/20 ,  G01J3/32 ,  G01J3/36 ,  G01J3/427

Abstract: The device comprises, opposite the secondary slit 5 and on the path of the signal coming from the dispersive element 4, means for deflecting this signal, which means may jump quasi-simultaneously from one state in which the signal is not deflected into a state in which the signal is deflected. The deflection means consist of a transparent plate 7 with parallel faces, made for example of quartz, this plate being movable and capable of tilting quasi-simultaneously between two extreme positions, one of these two positions corresponding to a deviation with respect to the normal by an angle theta chosen as a function of the deflection of the desired signal. The device may comprise several secondary slits 5 each fitted with their quartz plates 7. This then constitutes a polychromator.

公开(公告)号：DE3244164A1

公开(公告)日：1984-05-30

申请号：DE3244164

申请日：1982-11-29

Applicant: APPLIED RES LAB SA

Inventor： SLICKERS KARL

IPC: G01N21/67

Abstract: Contents of elements in metals, e.g. aluminum in steel, which are present as a total quantity in an elemental/dissolved form and in a non-elemental or separated form, are determined by sparking the surface of the metal under an inert atmosphere. The spectral signal is simultaneously measured as a function of time, and a signal is obtained which initially exhibits an intensity peak, from which the non-elemental or separated element content can be concluded, and the signal then stabilizes at a stationary value from which the total content (Ct) of element can be concluded. The elemental/dissolved proportion (Cs) can be concluded from the total area (P1) below the peak, from the area (P2) under the stationary intensity measured over a time (t2-t1) and from the total content (Ct).

公开(公告)号：DE2814058A1

公开(公告)日：1979-01-04

申请号：DE2814058

申请日：1978-03-31

Applicant: APPLIED RES LAB

Inventor： LINDBLOM PETER PROF

IPC: G01J3/18 ,  G01J3/00

Abstract: To eliminate astigmatism and coma in a spectrograph the distance between the entrance slot and a first concave mirror, as well as the relative angular positions of the entrance slot, the plane grating, the two concave mirrors and the focal plane are selected so as to satisfy the following conditions. +TR

公开(公告)号：SE7703880A

公开(公告)日：1978-10-05

申请号：SE7703880

申请日：1977-04-04

Applicant: APPLIED RES LAB

Inventor： LINDBLOM K P

IPC: G01J3/18

CPC classification number: G01J3/1804

公开(公告)号：GB1400678A

公开(公告)日：1975-07-23

申请号：GB3650473

申请日：1973-08-01

Applicant: APPLIED RES LAB

IPC: G01N21/74 ,  G01N1/28 ,  G01N21/67 ,  G01N1/34

Abstract: 1400678 Determining water content APPLIED RESEARCH LABORATORIES Inc 1 Aug 1973 [ 10 Aug 1972] 36504/73 Heading GIB A material is prepared for spectrochemical analysis by (a) depositing it on a yarn of high purity graphite carbon fibres, (b) heating the yarn to a temperature at which the material evaporates and (c) passing gas over the heated yarn to carry away the vapour. In a particular embodiment, yarn 10 runs from reel 12 through compartments 16, 26 and 36. In compartment 16, electric current is passed through the yarn, through terminal 19 to evaporate impurities. The impurities are carried away by nitrogen, gas from inlet 20. In compartment 26, a solution of the material to be analyzed is applied at 27 and the solvent removed by heat from radiant source 28. In compartment 36, the material to be analyzed is evaporated by heat from induction coil 40 and carried away by nitrogen gas from inlet 30. In alternative procedures, (1) impurities may be removed by induction heating, (2) the material to be analyzed may be applied by applying an electrical charge to the yarn and exposing it to an atmosphere of the material and (3) the material to be analyzed may be evaporated by passing an electrical current through the yarn.

公开(公告)号：CA957085A

公开(公告)日：1974-10-29

申请号：CA142014

申请日：1972-05-12

Applicant: APPLIED RES LAB

Inventor： SMALLBONE ALLAN H

IPC: G01N23/22 ,  G01N23/223

Abstract: Solids in a slurry batch or batch mixtures of liquids of different densities the upper surfaces of which are presented in a liquid cell for X-ray analysis are prevented from separating by an impeller causing rotary movement of the slurry or liquid mixture within the cell; the liquid surface being maintained substantially planar by baffles which inhibit the creation of a vortical cavity.

公开(公告)号：DE1920183A1

公开(公告)日：1970-08-27

申请号：DE1920183

申请日：1969-04-21

Applicant: APPLIED RES LAB INC

Inventor： A ANDERSEN CHRISTIAN ,  J RODEN HENRY

IPC: H01J37/317 ,  G01Q10/04 ,  H01J27/02 ,  H01J37/252 ,  H01J49/14 ,  H01L21/265 ,  G01N23/00

Abstract: 1,259,505. Ion beam apparatus; solid state devices. APPLIED RESEARCH LABORATORIES Inc. 22 April, 1969 [22 April, 1968], No. 20517/69. Headings H1D and H1K. A specimen of an electrically insulating material, including poorly conductive materials such as semi-conductors, is bombarded with negatively charged ions of such an energy that they drive secondary electrons out of the specimen to remove charges at a rate to compensate fully for the charges carried to the surface of the specimen by the ions. This technique may be used to implant particles of atomic dimension into the insulating material, for example for making solid state electronic devices, or to sputter the insulating material. Alternatively, the insulating material may be analysed by mass spectrometrically analysing the sputtered secondary ions from the material. Preferably, the negatively charged ions are oxygen ions which may be extracted from a duoplasmatron source. The energy of the ions may be in the range of 1000 to 20,000 electron volts.

公开(公告)号：FR2013091A1

公开(公告)日：1970-03-27

申请号：FR6923186

申请日：1969-07-08

Applicant: APPLIED RES LAB

IPC: H01J37/141 ,  H01J37/252 ,  G01N23/00

Abstract: 1,225,579. Electron - beam apparatus. APPLIED RESEARCH LABORATORIES Inc. 17 July, 1969 [17 July, 1968], No. 36119/69. Heading HID. In order to remove contaminants from an electron microprobe of the kind having a lens positioned closely adjacent to the specimen, the lens structure is cooled to a temperature below about - 20‹ C. In the microprobe shown, an election beam impinges on a small area of the specimen 14 to cause emission of X-rays which are subjected to analysis. Contaminants are caused to condense on the surface 10 of a lens 12 which is cooled by means of a refrigerant circulated in a coil 24 surrounding the winding 16. A conventional refrigerant is used for temperatures down to- 40‹ C. and below this, liquid nitrogen is used. The coil 24 may be included in the cooling circuit of a diffusion pump for the apparatus and the temperature of the lens may be regulated by means of an adjustable valve in a by-pass circuit. The specimen 14 may be heated by means of a coil 27. Temperature sensors 26, 28 may be used in automatic regulating circuits for both cooling and heating.