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    Systems and methods for measuring resistive sensors
    41.
    发明授权
    Systems and methods for measuring resistive sensors 有权

    公开(公告)号：US10006828B2

    公开(公告)日：2018-06-26

    申请号：US14749571

    申请日：2015-06-24

    Applicant: Apple Inc.

    Inventor： Manu Agarwal ,  John Stephen Smith ,  Sumant Ranganathan

    IPC: G01L25/00 ,  G01L1/22 ,  G06F3/041

    CPC classification number: G01L25/00 ,  G01L1/2281 ,  G06F3/0414 ,  G06F3/0418

    Abstract: Systems and methods for accurately and precisely measuring the resistance of a resistive sensor of a matched resistive sensor pair disposed on opposite surfaces of a substrate. Certain embodiments include coupled each sensor of the matched resistive sensors to a thermally-isolated pair of reference resistors contained within an integrated circuit so as to form a Wheatstone bridge. A controller associated with the integrated circuit can adjust the resistance of the thermally-isolated pair of reference resistors until the ratio of resistances matches to the ratio of resistances between the sensors of the matched pair.

    Strain Sensors in an Electronic Device
    44.
    发明申请
    Strain Sensors in an Electronic Device 审中-公开

    公开(公告)号：US20170191884A1

    公开(公告)日：2017-07-06

    申请号：US15457992

    申请日：2017-03-13

    Applicant: Apple Inc.

    Inventor： Michael Vosgueritchian ,  John Stephen Smith ,  Sinan Filiz ,  James E. Pedder ,  Tingjun Xu ,  Xiaonan Wen

    IPC: G01L1/22 ,  G06F3/041 ,  G06F3/045

    CPC classification number: G01L1/225 ,  G01L1/22 ,  G01L1/2287 ,  G06F3/0414 ,  G06F3/045 ,  G06F3/0488

    Abstract: One or more strain sensors can be included in an electronic device. Each strain sensor includes a strain sensitive element and one or more strain signal lines connected directly to the strain sensitive element. The strain sensor(s) are used to detect a force that is applied to the electronic device, to a component in the electronic device, and/or to an input region or surface of the electronic device. A strain sensitive element is formed or processed to have a first gauge factor and the strain signal line(s) is formed or processed to have a different second gauge factor. Additionally or alternatively, a strain sensitive element is formed or processed to have a first conductance and the strain signal line(s) is formed or processed to have a different second conductance.

    Systems and Methods for Measuring Resistive Sensors
    48.
    发明申请
    Systems and Methods for Measuring Resistive Sensors 有权
    用于测量电阻式传感器的系统和方法

    公开(公告)号：US20160377501A1

    公开(公告)日：2016-12-29

    申请号：US14749571

    申请日：2015-06-24

    Applicant: Apple Inc.

    Inventor： Manu Agarwal ,  John Stephen Smith ,  Sumant Ranganathan

    IPC: G01L25/00 ,  G01L1/18

    CPC classification number: G01L25/00 ,  G01L1/2281 ,  G06F3/0414 ,  G06F3/0418

    Abstract: Systems and methods for accurately and precisely measuring the resistance of a resistive sensor of a matched resistive sensor pair disposed on opposite surfaces of a substrate. Certain embodiments include coupled each sensor of the matched resistive sensors to a thermally-isolated pair of reference resistors contained within an integrated circuit so as to form a Wheatstone bridge. A controller associated with the integrated circuit can adjust the resistance of the thermally-isolated pair of reference resistors until the ratio of resistances matches to the ratio of resistances between the sensors of the matched pair.

    Abstract translation: 用于准确和精确地测量布置在基板的相对表面上的匹配电阻传感器对的电阻传感器的电阻的系统和方法。 某些实施例包括将匹配的电阻式传感器的每个传感器耦合到集成电路中包含的热隔离的一对参考电阻器，以便形成惠斯通电桥。 与集成电路相关联的控制器可以调节热隔离的一对参考电阻器的电阻，直到电阻比与匹配对的传感器之间的电阻比匹配。

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