Equipment for producing electrolytic water
    41.
    发明专利
    Equipment for producing electrolytic water 审中-公开
    电解水设备

    公开(公告)号:JP2003080253A

    公开(公告)日:2003-03-18

    申请号:JP2001271789

    申请日:2001-09-07

    Inventor: AKIYAMA OSAMU

    Abstract: PROBLEM TO BE SOLVED: To provide equipment for producing electrolytic water of which the lowering of the output of the deuterium lamp of a light source is prevented and which always displays available chlorine concentration, and can be used at ease.
    SOLUTION: A timer 41 is provided in a measuring part 30a, and the intermittent lighting of the light source 32 is carried out by the switching of the switches 40b and 40c of a power source 40a for the light source 32. While the light source 32 is on, a data processing part 38 collects data and measures absorbancy at regular time intervals according to a signal from photocells 36 and 37, and an output part 39a of a concentration display 39a displays effective chlorine concentration. While the light source 32 is turned off, the concentration display 39a displays the effective chlorine concentration measured value held just before lighting out.
    COPYRIGHT: (C)2003,JPO

    Abstract translation: 要解决的问题:提供防止光源的氘灯的输出降低并且总是显示可用的氯浓度的电解水的制造设备,并且可以容易地使用。 解决方案:在测量部分30a中设置有定时器41,并且通过切换用于光源32的电源40a的开关40b和40c来执行光源32的间歇点亮。当光源32 数据处理部分38根据来自光电管36和37的信号以规则的时间间隔收集数据并测量吸收,并且浓度显示器39a的输出部分39a显示有效的氯浓度。 在关闭光源32的同时,浓度显示部39a显示出熄灭前保持的有效氯浓度测定值。

    SPECTROPHOTOMETER
    42.
    发明专利

    公开(公告)号:JPS63115020A

    公开(公告)日:1988-05-19

    申请号:JP26135986

    申请日:1986-10-31

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To eliminate problems caused by the hysteresis of sensitivity characteristics of a photodetector at the time of photodetector switching by making light incident on the photodetector which is not used for measurement in measuring operation all the time. CONSTITUTION:A half-mirror Mh is used as a means which switches the 1st and the 2nd photodetectors P1 and P2 of a photometer. The half-mirror Mh is fixed slantingly by 45 deg. to the incident light, which is split to the 1st and the 2nd photodetectors P1 and P2 all the time. In this constitution, the light is incident on the photodetectors P1 and P2, specially, the photoelectron multiplier tube P1 throughout the measurement, so even when an in-use detector is switched from P2 to P1 on the side of a measuring circuit, the photodetection state is unchanged before and after the switching and there is no temporary variation of a 100% transmissivity line due to the hysteresis of the sensitivity characteristics. Consequently, an increase in measured value and drift before and after the photodetector switching are compressed and result with good reproducibility are obtained by the repetitive measurement.

    DOUBLE-BEAM SPECTROMETRY
    43.
    发明专利

    公开(公告)号:JPS62103530A

    公开(公告)日:1987-05-14

    申请号:JP24490185

    申请日:1985-10-31

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To shorten a measuring time and to enhance measuring efficiency, by making it possible to use the data of a base line in two kinds of different measurements in common. CONSTITUTION:A specimen holder Ht for arranging a specimen for transmissivity measurement and a specimen holder Hm for arranging a specimen for reflection measurement are provided on a base plate B. At first, standard specimens for A-measurement and B-measurement are respectively set to beams F1, F2 and respective photometric values f1, f2 are collected as base line correcting data. Next, when A-measurement is performed, a specimen to be measured is set to the beam F1 and the standard specimen for B-measurement is set to the beam F2 as it is to collect the photometric values f1', f2' of two beams and, if A=(f1'/f2')/(f1/f2) is calculated at every wavelength, a characteristic value A is calculated. At the time of B-measurement, a specimen to be measured for B-measurement is set to the beam F1 and the standard specimen for A-measurement is set to the beam F1 and, if B=(f2''/f1'')/(f2/f1) is calculated according to same calculation formula, a characteristic value B is calculated. By this method, because correction data can be used in common, it is unnecessary not only to replace an attachment but also to again take a base line.

    AUTOMATIC ANALYZER
    44.
    发明专利

    公开(公告)号:JPS6275268A

    公开(公告)日:1987-04-07

    申请号:JP21585785

    申请日:1985-09-27

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To prevent a squeeze tube from being damaged by stopping the operation of a squeeze pump by a sample detecting means when a sample is sucked to nearby the end of a tube on the side of the squeeze pump and storing a sample which is discharged from a nozzle in a waste liquid part during the discharging operation of the squeeze pump. CONSTITUTION:A sampler 1 is provided with sample containers 11 in odd columns and waste liquid containers 12 in even columns and a sample sucked by the operation of the squeeze pump 4 through a nozzle 2 is analyzed 6 through a light emitting part 17 and a detector 18 installed in opposition to each other across a flow cell 5 and then displayed 8. When the sample is sucked to nearby the end part of the side of the pump 4, a sample detecting means 9 detects the presence of the sample and outputs a squeeze pump operation stop signal to an operation control part 7 to stop the operation of the pump 4. The nozzle 2 is operated during the discharging operation of the pump 4 to discharge the sample to the respective waste liquid containers 12. Therefore, none of the sample enters the squeeze tube 13 of the pump 4 and the tube 13 is prevented from being damaged.

    GONIOPHOTOMETER
    45.
    发明专利

    公开(公告)号:JPS6270735A

    公开(公告)日:1987-04-01

    申请号:JP21082685

    申请日:1985-09-24

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To prevent the appearance of the effect of local sensitivity on the light receiving surface of a light detector, by making it possible to selectively change-over a direct light receiving mode and an indirect light receiving mode. CONSTITUTION:A measuring apparatus is constituted of a spectrometer R, a rotary disc R, a speciment stand B to which a specimen S is set and the concave mirror M, luminous flux iris MS and replaceable lighr detector provided on the rotary disc R. At the time of a direct light receiving mode, a photomultiplier D is mounted on the rotary disc R as the light detector through a holder H and the light receiving surface thereof is positioned immediately behind the iris MS so that the reflected light from the specimen S is directly incident to the light receiving surface of the head end of the photomultiplier D. In the case of an indirect light receiving mode measuring mirror surface reflectivity, if an integrating sphere IS is mounted on the rotary disc R and the light incident window with the integrating sphere IS is positioned immediately behind the iris MS, diffusion reflection is repeated on the inner surface of the integrating sphere IS and uniform luminous intensity is imparted to the light detection window W of the integrating sphere IS and, therefore, the reflected light from the specimen can be received by the light detector without receiving the effect of the sensitivity irregularity of the light receiving surface.

    INTEGRATING SPHERE APPARATUS FOR MEASURING SPECTRAL REFLECTANCE

    公开(公告)号:JPS6252438A

    公开(公告)日:1987-03-07

    申请号:JP19244485

    申请日:1985-08-30

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To make it possible to perform the mounting, detachment and adjustment of a luminous flux converging jig independently of an optical system, by arranging the luminous flux converting jig to the outside of the specimen window of an integrating sphere. CONSTITUTION:A luminous flux converging jig 9 is mounted on the outside surface of the specimen window 4 of an integrating sphere 2 and a specimen S is mounted on the luminous flux converging jig 9 so as to be closely contacted with the outside surface thereof. The luminous flux converging jig is formed by providing a through-hole 11 in a thin phosphor bronz plate 10 to which black matter surface treatment was applied and fixing said plate 10 to a fixing metal fitting 12 with rivets as shown by the drawing and fixed to the screw hole 15 provided on the upper surface of an integrating sphere with a fixing screws 13. If many kinds of thin phosphor bronz plates 10 provided with through-holes 11 having different shapes and dimensions are prepared, the thin phosphor bronz plate 10 can be selected tailored to the contour of a surface region desired to be measured of the specimen. The through-hole 11 having an arbitrary shape and dimension is easily processed in matching relation to the specimen.

    MONOCHROMETER
    47.
    发明专利

    公开(公告)号:JPS60207018A

    公开(公告)日:1985-10-18

    申请号:JP6477184

    申请日:1984-03-30

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To use a monochrometer at the optimum mode in correspondence with measuring purposes, by arranging mirrors at the equivalent positions as dispersing elements in one or both of spectroscopes, and switching the mirrors and dispersing elements. CONSTITUTION:A first spectroscope 1 and a second spectroscope 2 are arranged along a light path in series. The first spectroscope 1 has a concave diffraction grating G1 and a curved surface mirror M1, which are arranged on the equivalent positions on a rotary table 3. The second spectroscope 2 has concave diffraction gratings G2 and G3 having the different intervals of gratings, which are arranged at the equivalent positions on a rotary table 4. The curved surface mirror M1 and the diffraction gratings G1-G3 are switched and used. Thus the device is used as a single monochrometer or a double monochrometer in correspondence with the measuring purposes.

    Apparatus for measuring absolute reflectivity
    48.
    发明专利
    Apparatus for measuring absolute reflectivity 失效
    测量绝对反射率的装置

    公开(公告)号:JPS5979841A

    公开(公告)日:1984-05-09

    申请号:JP19130682

    申请日:1982-10-29

    Applicant: Shimadzu Corp

    Inventor: AKIYAMA OSAMU

    CPC classification number: G01N21/474 G01N2201/065

    Abstract: PURPOSE: To make it possible to miniaturize the structure of the titled apparatus and to simplify measuring operation, by a method wherein a light source and a light measuring system is fixedly arranged and an integration sphere is rotated 180°C around one center line thereof.
    CONSTITUTION: A light measuring system consisting of a light source, a light receiving element D and an iris F is arranged so as to fix the position thereof with respect to an integration sphere I having a specimen window W
    s , a specimen light outlet window W
    os and a reference light outlet window W
    or and said integration sphere I is provided so as to be made rotatable 180° around an axis A
    x . In performing measurement, the entire amount I
    r of light taken out from the window W
    or is measured and, after the integration sphere I is rotated 180°, the amount I
    s of light is measured in the window W
    os while the absolute reflectivity of a specimen is calculated from the ratio of both measured values. As a result, because it is unnecessary to move the light measuring system, measuring operation becomes simple and a setting area is also reduced and small construction is enabled.
    COPYRIGHT: (C)1984,JPO&Japio

    Abstract translation: 目的:为了使标题装置的结构小型化并简化测量操作,通过一种方法,其中光源和光测量系统被固定地布置,并且整体球绕其一条中心线旋转180度 。 构成:由光源,受光元件D和光圈F组成的光测量系统被布置成相对于具有标本窗口Ws,样本灯出口窗口Wos和 参考灯出口窗口和所述积分球体I被设置成可旋转180度。 绕轴Ax。 在进行测量时,测量从窗口Wor中取出的光的整体量Ir,并且在积分球体I旋转180度后,在窗口Wos中测量光量Is,而样品的绝对反射率为 由两个测量值的比值计算。 结果,由于不需要移动光测量系统,所以测量操作变得简单并且设定区域也减少,构造小。

    MULTIPLE LIGHT FLUXES MIXER
    49.
    发明专利

    公开(公告)号:JPS57179646A

    公开(公告)日:1982-11-05

    申请号:JP6480781

    申请日:1981-04-28

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To mix multiple light fluxes with a simple construction in a small size by receiving light on a light receiving surface at the rear end thereof after incident light from a symmetrical roof section having the tip thereof roughly orthogonal is reflected on the inner surface of a cylindrical section. CONSTITUTION:Multiple light fluxes divided into two parts or so from the same monochrome light source separately transmit a sample and control cells S and R and are reflected on a reflective inner surface of a cylinder via transmitting light diffusion plate 2 and 2' in which tips of a cylinder 1 cross roughly at the right angle to form a symmetrical roof section. Then, the lights are mixed and enter a light receiving surface of a photomultiplier P provided at the rear end of the cylinder 1. This symmetry allows the multiple light fluxes to be mixed at a high utilization efficiency with a simple construction in a small size.

    Optical gas analysis system and gas flow cell
    50.
    发明专利
    Optical gas analysis system and gas flow cell 审中-公开
    光学气体分析系统和气体流量池

    公开(公告)号:JP2010217031A

    公开(公告)日:2010-09-30

    申请号:JP2009064920

    申请日:2009-03-17

    Abstract: PROBLEM TO BE SOLVED: To provide a gas flow cell allowing accurate consecutive high-sensitivity gas analysis without contamination of a surface of a mirror, an optical window or the like present in each of both ends of the gas flow cell caused by particles occurring inside a process chamber.
    SOLUTION: This optical gas analysis system includes: the T-shaped gas flow cell 1a formed with one sample gas introduction port 18 in an approximate center of a long axis direction along a direction orthogonal to the long axis direction; and a photoelectric conversion chamber 75 converting optical information from the gas flow cell 1a into an electric signal.
    COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种气体流通池,其允许精确的连续的高灵敏度气体分析,而不会污染由气体流通池的两端中的每一端形成的反射镜,光学窗口等的表面 发生在处理室内的颗粒。 解决方案:该光学气体分析系统包括:沿与长轴方向正交的方向在长轴方向的大致中心处形成有一个样品气体引入口18的T形气体流通池1a; 以及将来自气体流通池1a的光学信息转换为电信号的光电转换室75。 版权所有(C)2010,JPO&INPIT

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