Abstract:
PURPOSE:To provide a compd. semiconductor element having a high-reliability interconnection structure made on the basis of the elective epitaxial growth technology. CONSTITUTION:A compd. semiconductor element is composed of a compd. semiconductor substrate 10, compd. semiconductor crystal layer 20 formed on the (111) B face of the substrate, mask layer 12 formed the substrate and contact parts 44 formed on the layer 12. The top face 22A of the layer 20 is composed of the (-1, -1, -1) face and electrodes 40 are formed this face. The layer 20 has at least, one slant face 22B composed of the (0, -1, -1) face. The contact parts 44 are electrically connected to the electrodes 40 through an interconnecting layer 42 extending on the face 22B.
Abstract:
PROBLEM TO BE SOLVED: To provide an unevenness inspection apparatus etc. that enable a more appropriate unevenness inspection than existing techniques.SOLUTION: An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance.
Abstract:
PROBLEM TO BE SOLVED: To provide a color-unevenness inspection device and a color-unevenness inspection method, capable of performing more appropriate color-unevenness inspection than ever before. SOLUTION: An image processing part 21 specifies a color-unevenness region, classifies display pixels in the color-unevenness region into a plurality of color groups, and generates a color-unevenness image, in a pickup image (pickup data Din) to be inspected of a display screen of a display device 4. The image processing part 21 also calculates an evaluation parameter (surface ratio S and the maximum chroma Cmax) during color-unevenness inspection, regarding to the color-unevenness region of the color-unevenness image. A correction part 22 making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups. An inspection part 23 performs a color-unevenness inspection based on a resultant evaluation parameter (color-unevenness area ratio S' and the maximum chroma Cmax'). An objective color-unevenness inspection more matching feelings of human being than ever before is realized. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To prevent foreign matters on the surface of a workpiece from being held in a space with a laser light irradiation part in a laser beam machining device, which is provided with a local working part locally evacuating the irradiation part of laser light and floats the locally worked part onto a workpiece by differential evacuating. SOLUTION: When a local working part 40 by laser irradiation is floated up from a workpiece (substrate 11) by differential evacuation, the floating height D is changed by controlling the balance between the gas feed by a compressed gas feed part 63 and the gas exhaust by a compressed gas exhaust part 65, and, in a state where the gas exhaust is reduced and the floating height D is made high, the movement between working positions is performed. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To realize improvement in cooling efficiency without causing invasion of dust or the like. SOLUTION: A cabinet 5 having an arrangement face part 6 at which a plurality of light sources 13a are arranged, and a blasting means 15 of sending cooling air to suppress a temperature rise of the light sources are installed. An air flow passage 16b communicating with a face at which the light sources are arranged and an inner space of the cabinet on the opposite side by pinching the arrangement face part of the cabinet is formed, a sealed space 19 isolated from the outside by the inner space and by the air flow passage of the cabinet is formed, and the cooling air is made to be circulated by being sent in a prescribed direction in the sealed space by the blasting means. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a backlight device of which the dispersion in brightness and color due to the unevenness of light sources are restrained. SOLUTION: A light transmissive base body 30 is arranged between the light sources, for example, light-emitting diodes 21, and a diffusion plate 141 facing the light source, and a diffusion material 32, corresponding to the distribution of the amount of light emitted from respective light-emitting diodes 21 irradiated on the light transmissive base body 30 is formed on a surface of the light transmissive base body 30 that faces the light-emitting diodes 21. The dispersion material 32 is contained and adhered, for example, in a photosensitive material 31. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a light emitting diode device for radiating the light in the desired distribution of angle through adjustment in amount of light emitted along the center axis of the lens from an LED chip, and to also provide a back-light apparatus and a liquid crystal display apparatus for suppressing uneven luminance and color by using the same light emitting diode device. SOLUTION: The light emitting diode device is formed by covering a lens 3 with the circumference of the light emitting diode chip 1. A processing unit 13 for adjusting the light traveling along the center axis of the lens 3 from the light emitting diode chip 1 is provided to the light emitting diode chip or lens or just above the lens. The area near the center axis of the light emitting diode chip 1 is processed with the etching process or the like. Otherwise, a low refractive index material including a diffusing material or an angle selecting film is provided on the lens. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a backlight device which improves luminance uniformity by using only a direct reflection component of a reflective structure without giving a light dispersion component to the reflective structure, and provide a liquid crystal display device using the backlight device. SOLUTION: A backlight device 10 of which the source of light is a light-emitting diode 21 has a light guide plate 30 fixed with the light-emitting diode 21 and the rear surface 30B of the opposite side of the light-emitting side of the light guide plate 30 has a reflective structure layer 35 through a low refractive index layer 31 whose material has at least a refractive index lower than that of the light guide plate 30. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a laser CVD apparatus for stably forming a film of high quality and improving productivity. SOLUTION: The laser CVD apparatus comprises a stage 11 for mounting a substrate 21, a laser source, an irradiation optical system for applying a laser beam emitted from the laser source, a gas supply unit for supplying a source gas to be used in the CVD, and a gas-introducing part 10 having an empty space 7 for passing the laser beam therethrough in the center, and a supply opening for sprouting a source gas supplied from the gas supply unit. The apparatus further comprises an intercepting-gas admission port 5 for introducing an intercepting-gas that prevents fresh air from intruding into a space between the gas-introducing part 10 and a substrate 21, and an outlet 4, which are installed on the side of the gas-introducing part 10 opposing to the substrate 21. The gas-introducing part 10 has a levitating mechanism 12 and 13 by a magnetic force. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an organic EL element that has a high luminance and a long life. SOLUTION: The positive electrode 18 for hole injection is formed of a carbon film, for example, a diamond like carbon(DLC) film that is added with nitrogen as impurities. The DLC film is made by employing a physical vapor deposition method such as a sputtering method and a vacuum arc method, but this DLC film does not include a film which is made only of a graphite structure (crystalline structure having SP2 bonding) used for X-ray diffraction or the like. This is a film of amorphous shape in which mainly SP3 bonding and SP2 bonding are mixed. Since a DLC added with nitrogen is used for the positive electrode 18, hole injection efficiency is improved. On the other hand, the negative electrode 13 is made of a transparent electrode layer, for example, an Indium Tin Oxide(ITO) layer. Emission from the organic luminous layer 16 is taken out from the opening part 12A that is provided at the auxiliary electrode 12 of the negative electrode 13 side.