CALIBRATION METHOD OF MOISTURE METER, AND MOISTURE RATE MEASUREMENT METHOD OF FIBER SHEET

    公开(公告)号:JP2000241328A

    公开(公告)日:2000-09-08

    申请号:JP4176699

    申请日:1999-02-19

    Abstract: PROBLEM TO BE SOLVED: To obtain an accurate device and method for measuring a moisture content by accurately and simply calibrating a moisture meter for measuring the moisture content. SOLUTION: In the calibration method of a moisture meter 3, the moisture meter 3 being calibrated by the calibration method, and a moisture rate measurement method, a moisture-adjusted sample 1 is exposed to moisture atmosphere being different from the moisture-adjusted one, the output of the moisture meter 3 for the aging of the moisture content of the sample 1 is obtained, and at the same time weight for the aging of the moisture content of the sample 1 is measured, and, based on the relationship between the moisture content obtained according to weight where the sample 1 is completely dried and that at each time, and an output value at the same time obtained by the moisture meter 3, the moisture meter 3 is calibrated.

    PAINT INSPECTING METHOD AND DEVICE
    42.
    发明专利

    公开(公告)号:JP2000121631A

    公开(公告)日:2000-04-28

    申请号:JP31683498

    申请日:1998-10-19

    Abstract: PROBLEM TO BE SOLVED: To precisely judge the quality of a paint from a received image by irradiating light to an object coated and dried with the paint to be inspected, and forming the received image based on the reflected light. SOLUTION: The light emitted from an irradiating means 1 is irradiated to the paint coated face of an object 4 coated with a paint. The light reflected on the coated face is received by a receiving means 2 and converted into an analog electric signal, and the analog electric signal is fed to an image processing means 3. The analog electric signal is A/D-converted by the image processing means 3, a received image is formed from the converted signal, a moving average process is applied to the received image to remove noises by an arithmetic means 6 in an image processing means, a double differential process is applied to emphasize defects, then a binalization process is applied. The number of picture elements having a high concentration value is obtained from the result of the binalization process, defects of the paint occurring on the coated face are extracted, and the quality of the paint is judged. A method for calculating the area and length of an image group having a high concentration value is also preferably used other than the method for calculating the number of picture elements having a high concentration value.

    METHOD, AND DEVICE FOR INSPECTING SURFACE DEFECT AND MANUFACTURE OF SHEET-SHAPED MATERIAL

    公开(公告)号:JPH10227746A

    公开(公告)日:1998-08-25

    申请号:JP4292697

    申请日:1997-02-12

    Abstract: PROBLEM TO BE SOLVED: To inspect surface recessed or projecting defects accurately and speedily, by extinguishing light with an extinction material, radiating the light in specific incident angle range to a surface of an object to be inspected, and measuring its reflected light with light receiving part. SOLUTION: A light transmitting part 20 radiates light onto a surface region 60 of a sheet- shaped material 10, and a light receiving part 40 measures its reflected light. An extinction material 30 which distinguishes incident light in incident angle range α is placed between the light transmitting part 20 and the surface region 60. The extinction material 30 is positioned such that the equation, L1 tan α=W1 /2 is met, where L1 is distance between the material and the surface region 60 and W1 is material's width. The light receiving part 40 is positioned such that the equation, L2 tan β=W2 /2 is met, where L2 is distance between its light receiving surface 41 and the surface region 60 and W2 is width of the light receiving surface 41. Then, incident angle range α is greater than or equal to light receiving angle range β. When there is a defect with gradient angle θk , reflected angle distribution is transferred in parallel by 2θk , and therefore setting α

    ASSEMBLY AND ADJUSTMENT METHOD FOR OPTICAL INSTRUMENT

    公开(公告)号:JPH0493615A

    公开(公告)日:1992-03-26

    申请号:JP20616290

    申请日:1990-08-03

    Abstract: PURPOSE:To prevent the occurrence of additional distortion in an optical instrument after the assembly and adjustment thereof by demounting the optical instrument together with a mounting base from a work bench after the assembly and adjustment of the optical instrument secured to the work bench, and then fixing the instrument at the predetermined position via a mounting member. CONSTITUTION:A top plate 4 fixed to the mounting frame 3 of an optical instrument 1, a work bench 5 where the optical instrument 1 is secured for assembly and adjustment, and a bottom plate 7 fixed at a mounting position 6 are jointed and fastened to one another with a cylindrical body 8 having higher resistance against distortion than the bottom plate 7, thereby forming a mounting member 2. The top plate 4 of the member 2 and the frame 3 are fixed to each other, thereby fastening the bottom plate 7 to the work bench 5. The optical instrument 1 after fixed to the work bench 5 via the member 2 is assembled and adjusted. After the completion of the assembly and adjustment, the bottom pate 7 is detached from the work bench 5. The instrument 1 is thereby demounted from the work bench 5 together with the member 2, and packaged for shipment.

    OPTICAL INTERFERENCE FILM THICKNESS MEASURING APPARATUS

    公开(公告)号:JPH049704A

    公开(公告)日:1992-01-14

    申请号:JP11375390

    申请日:1990-04-27

    Abstract: PURPOSE:To improve the positional resolving power and to measure the film thickness with high accuracy by arranging an end face and the other end face of a photoconductive member in tight contact with a projecting surface of an image intensifier and a plane of incidence of a photoelectric converting element, respectively. CONSTITUTION:A light projecting from a white light source 1 passes through an entrance window 8 opened at a light condenser 7 to an object 6 to be measured via a polarizing plate 5 or the like. The condenser 7 and entrance window 8 work as a shielding body and an aperture, respectively. The condenser 7 is comprised of a supporting body 9 and an optical fiber 10. A light image passing through an image intensifier 16 and a photoconductive member 17 via a spectroscope 14 etc. at the other end face of the fiber 10 is input to a photodetecting element 18 and detected as the intensity of the light for every wavelength. A data processor 19 takes the intensity of the light for every wavelength, thereby obtaining the wavelength of a bright part or a dark part resulting from the interference phenomenon and operating the film thickness of the object 6 from a predetermined formula. If one end face of the member 17 and the other end face thereof are held in tight contact with a projecting surface of the intensifier 16 and a plane of incidence of the element 18 respectively, the intensity ratio of the spectroscopic bright and dark parts can be made larger.

    EXHALATION ANALYSIS
    46.
    发明专利

    公开(公告)号:JPS62188969A

    公开(公告)日:1987-08-18

    申请号:JP3157986

    申请日:1986-02-14

    Abstract: PURPOSE:To enable a highly accurate exhalation analysis, by updating a time constant for compensating delay in response by a time constant which is calculated from an output characteristic of a gas densitometer with a switch between exhalation and inhalation to correct the output of the gas densitometer by a computation. CONSTITUTION:A tube 1 is connected to a mask 2 at one end thereof while being opened to outside air or the like. One end of a tube 3 is mounted on the tube 1 to sample gas flowing through the tube. The tube 3 is connected to a suction pump 6 through a gas densitometer 4 and a flow rate controller 5. An output of the gas densitometer 4 is inputted into a data processor 8 through an A/D converter 7. The data processed with the unit 8 is outputted to a D/A converter, a display unit 10 and a communicating device 11. Here, the unit 8 comprises a response time measuring section 12 which receives an output y(t) of the densitometer 4 to calculate a response time Tr of the gas concentration and an output correcting section 13 which outputs a value x(t) obtained by correcting the output y(t) through a computation using the response time Tr. This enables a proper compensation regardless of variations in the time constant for the delay in the response of the densitometer 4.

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